IP Library Granted Patent US 11,050,045
Granted Patent B2
US 11,050,045 · App. 16/581,993 · Granted Jun 29, 2021

Display device and method of manufacturing the same

Inventors: Heesung Yang (Yongin-si, KR); Seung Bae Kang (Yongin-si, KR); Bonggu Kang (Yongin-si, KR); Tae Wook Kang (Yongin-si, KR); Joon-Hwa Bae (Yongin-si, KR); Woojin Cho (Yongin-si, KR); Byoung Kwon Choo (Yongin-si, KR)
Assignee: SAMSUNG DISPLAY CO., LTD.
H01L51/56H01L21/31051H01L21/31127
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,050,045
App. No.
16/581,993
Granted
Jun 29, 2021
Kind
B2
Abstract

A display device includes a planarization layer covering transistors in a display area on a substrate, an organic light emitting diode on the planarization layer, a pad electrode in a non-display area on the substrate surrounding the display area, and a sacrificial layer remnant capping a side surface of the pad electrode.

Claims (30)

1. A method of manufacturing a display device, the method comprising:

forming a pad electrode on a substrate in a non-display area that surrounds a display area;

forming a planarization layer on the substrate to have a first thickness in the display area, the planarization layer covering a transistor formed in the display area;

forming a sacrificial layer covering the planarization layer in the display area and covering the pad electrode in the non-display area;

polishing the planarization layer and the sacrificial layer by a chemical mechanical polishing process so that the planarization layer has a second thickness less than the first thickness in the display area and so that a sacrificial layer remnant is formed in the non-display area that exposes an upper surface of the pad electrode and caps a side surface of the pad electrode; and

forming an organic light emitting diode on the planarization layer having the second thickness.

2. The method as claimed in claim 1 , wherein the sacrificial layer includes a material having an etch selectivity in the chemical mechanical polishing process that is different from an etch selectivity of the planarization layer.

3. The method as claimed in claim 1 , wherein the planarization layer and the sacrificial layer are polished in the chemical mechanical polishing process using a slurry having different polishing rate ratios for the planarization layer and the sacrificial layer.

4. The method as claimed in claim 3 , wherein the slurry includes a corrosion inhibitor that prevents corrosion of the pad electrode.

5. The method as claimed in claim 3 , wherein when the planarization layer includes an organic material and the sacrificial layer includes an inorganic material, the sacrificial layer is polished using a first slurry for polishing the inorganic material, and a partial thickness of the planarization layer is polished using a second slurry for polishing the organic material.

6. The method as claimed in claim 3 , wherein when the thickness of the sacrificial layer formed on the pad electrode of the non-display area is greater than or equal to the first thickness of the planarization layer, the slurry is selected so that a polishing rate ratio of the sacrificial layer is larger than the polishing rate ratio of the planarization layer.

7. The method as claimed in claim 3 , wherein when the thickness of the sacrificial layer formed on the pad electrode of the non-display area is thinner than the first thickness of the planarization layer, the slurry is selected so that a polishing rate ratio of the sacrificial layer of the chemical mechanical polishing process is smaller than the polishing rate ratio of the planarization layer.

8. The method as claimed in claim 3 , wherein the slurry is pressed by a hard polishing pad to perform the polishing process.

9. The method as claimed in claim 3 , wherein

the pad electrode includes a first layer formed on the substrate, a second layer formed on the first layer, and a third layer formed on the second layer, and

the sacrificial layer remnant caps side surfaces of the first and second layers of the pad electrode.

10. The method as claimed in claim 9 , wherein

the first layer and the third layer include titanium, and

the second layer includes an aluminum alloy.

11. The method as claimed in claim 9 , further comprising:

forming a line in the non-display area, the line being connected to the pad electrode, wherein

a side surface of the line is capped by the sacrificial layer remnant.

12. The method as claimed in claim 11 , wherein

the line includes the first layer, the second layer and the third layer which are sequentially stacked, and

the sacrificial layer remnant caps side surfaces of the first and second layers of the line.

13. The method as claimed in claim 1 , wherein the forming the organic light emitting diode includes:

forming a first electrode on the planarization layer having the second thickness;

forming a pixel definition layer in which an opening exposing the first electrode is formed;

forming an organic light emitting layer in the opening of the pixel definition layer; and

forming a second electrode on the organic light emitting layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 25, 2019
From: YANG, HEESUNG; KANG, SEUNG BAE; KANG, BONGGU; KANG, TAE WOOK; BAE, JOON-HWA; CHO, WOOJIN; CHOO, BYOUNG KWON
To: SAMSUNG DISPLAY CO., LTD.
Reel/Frame 050483/0794 →
Priority Claims (1)
KR 10-2018-0126447 · Oct 23, 2018 · national
Continuity (1)
Related Publication 20200127242A1 · Apr 23, 2020