IP Library › Granted Patent US 11,011,214
Granted Patent B2
US 11,011,214 · App. 16/582,322 · Granted May 18, 2021

Data receiving circuit

Inventors: Suhwan Kim (Seoul, KR); Deog-Kyoon Jeong (Seoul, KR); Sang-Yoon Lee (Seoul, KR); Joo-Hyung Chae (Seoul, KR); Chang-Ho Hyun (Seoul, KR)
Assignees: SK hynix Inc.; Seoul National University R&DB Foundation
G11C7/222H03K5/135H03K2005/00019H03K2005/00286
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Quick Facts
Patent No.
US 11,011,214
App. No.
16/582,322
Granted
May 18, 2021
Kind
B2
Abstract

A data receiving circuit may include: a variable delay circuit suitable for generating a delayed strobe signal by delaying a strobe signal; a receiving circuit suitable for sampling data in synchronization with the delayed strobe signal; a phase shift circuit suitable for generating a shifted strobe signal by shifting a phase of the delayed strobe signal; a phase comparison circuit suitable for comparing phases of the data and the shifted strobe signal; and a delay adjusting circuit suitable for adjusting a delay value of the variable delay circuit in response to the phase comparison result of the phase comparison circuit.

Claims (13)

1. A data receiving circuit comprising:

a variable delay circuit suitable for generating a delayed strobe signal by delaying a strobe signal;

a receiving circuit suitable for sampling data in synchronization with the delayed strobe signal;

a frequency multiplier circuit suitable for receiving the delayed strobe signal, and generating a high-frequency strobe signal having a frequency twice as high as that of the delayed strobe signal;

a sampling circuit suitable for sampling the high-frequency strobe signal in synchronization with the data; and

a delay adjusting circuit suitable for adjusting a delay value of the variable delay circuit in response to the sampling result of the sampling circuit.

2. The data receiving circuit of claim 1 , wherein the frequency multiplier circuit comprises:

a phase shift circuit suitable for generating a shifted strobe signal by shifting a phase of the delayed strobe signal by 90 degrees; and

an XOR gate suitable for receiving, and performing an XOR operation on, the delayed strobe signal and the shifted strobe signal, and outputting the high-frequency strobe signal.

3. The data receiving circuit of claim 1 , wherein the sampling circuit samples the high-frequency strobe signal at a rising edge and a falling edge of the data.

4. The data receiving circuit of claim 3 , wherein the delay adjusting circuit decreases the delay value of the variable delay circuit when the sampling result of the sampling circuit indicates a high level, and increases the delay value of the variable delay circuit when the sampling result of the sampling circuit indicates a low level.

5. The data receiving circuit of claim 3 , wherein the sampling circuit comprises a dual edge-type D flip-flop suitable for receiving the high-frequency strobe signal through an input terminal thereof, receiving the data through a clock terminal thereof, and outputting the sampling result through an output terminal thereof.

6. The data receiving circuit of claim 4 , wherein the delay adjusting circuit updates the delay value of the variable delay circuit after a set time has elapsed from a rising or falling edge of the data.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 25, 2019
From: KIM, SUHWAN; JEONG, DEOG-KYOON; LEE, SANG-YOON; CHAE, JOO-HYUNG; HYUN, CHANG-HO
To: SK HYNIX INC.; SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
Reel/Frame 050490/0182 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 25, 2019
From: KIM, SUHWAN; JEONG, DEOG-KYOON; LEE, SANG-YOON; CHAE, JOO-HYUNG; HYUN, CHANG-HO
To: SK HYNIX INC.
Reel/Frame 050490/0748 →
Priority Claims (1)
KR 10-2018-0116442 · Sep 28, 2018 · national
Continuity (1)
Related Publication 20200105323A1 · Apr 2, 2020