Devices and methods for smart sensor application
A device and method for measuring the internal impedance of an electronic sensor uses configurable gain stages to selectively apply different excitation signals to the sensor under test in order to ensure adequate signal-to-noise ratio to provide accurate measurement of the internal impedance over a broader range of internal impedances than the prior art.
1. A test circuit comprising:
an excitation circuit configured to apply excitation signals to an electronic sensor, wherein the excitation circuit includes a configurable first circuit gain stage and a configurable second circuit gain stage, wherein in a first gain mode the excitation circuit generates a first excitation signal from a test signal using a first signal gain applied by the first circuit gain stage and a second signal gain applied by the second circuit gain stage, and in a second gain mode the excitation circuit generates a second excitation signal from the test signal using a third signal gain applied by the first circuit gain stage and a fourth signal gain applied by the second circuit gain stage; and
a measurement circuit configured to selectively initiate application of the first excitation signal or the second excitation signal to the electronic sensor and calculate the internal impedance of the electronic sensor,
wherein the measurement circuit is configured to initiate application of the first excitation signal to the electronic sensor when the internal impedance of the sensor has a first internal impedance range and initiate application of the second excitation signal to the electronic sensor when the internal impedance of the electronic sensor has a second internal impedance range, wherein the first internal impedance is greater than the second internal impedance range.
2. The test circuit of claim 1 , wherein the signal gain of the second circuit gain stage is one in the first gain mode, and less than one and greater than zero in the second gain mode.
3. The test circuit of claim 1 , wherein the signal gain of the first gain circuit stage is greater than one in the first gain mode, and less than one and greater than zero in the second gain mode.
4. The test circuit of claim 1 , including a digital-to-analog converter DAC) circuit configured to generate the test signal.
5. The test circuit of claim 4 , including a control circuit configured to control the DAC circuit to change one or both of the frequency of the test signal and the magnitude of the test signal.
6. The test circuit of claim 1 , wherein the measurement circuit is configured to:
determine a type code of the electronic sensor; and
select the signal gain of one or both of the first circuit gain stage and the second circuit gain stage according to the determined type code.
7. A method of monitoring an electronic sensor using a test circuit, the method comprising:
applying a first excitation signal in a first gain mode to the electronic sensor when the internal impedance of the sensor has a first internal impedance range; wherein, in the first gain mode, the first excitation signal is generated from a test signal using a first signal gain generated using a first circuit gain stage and a second signal gain generated using a second circuit gain stage;
applying a second excitation signal in a second gain mode to the electronic sensor when the internal impedance of the sensor has a second internal impedance range, wherein the first internal impedance is greater than the second internal impedance range;
wherein, in the second gain mode, the second excitation signal is generated from the test signal using a third signal gain using the first circuit gain stage and a fourth signal gain using the second circuit gain stage; and
calculating, using the test circuit, an internal impedance of the electronic sensor using the first excitation signal when in the first gain mode and using the second excitation signal when in the second gain mode; and
providing the calculated internal impedance to a user or process.
8. The method of claim 7 ,
wherein applying the first excitation signal includes generating the first excitation signal using a signal gain of one in the second circuit gain stage; and
wherein applying the second excitation signal includes generating the second excitation signal using a signal gain of less than one and greater than zero in the second circuit gain stage.
9. The method of claim 7 ,
wherein applying the first excitation signal includes generating the first excitation signal using a signal gain of greater than one in the first circuit gain stage; and
wherein applying the second excitation signal includes generating the second excitation signal using a signal gain of less than one and greater than zero in the first circuit gain stage.
10. The method of claim 7 , including generating the test signal using a digital-to-analog converter (DAC) circuit.
11. The method of claim 10 , including controlling the DAC circuit to change one or both of the frequency of the test signal and the magnitude of the test signal.
12. The method of claim 7 , wherein the signal gain of the first gain stage is changed from the first signal gain to the third signal gain by changing the gain of a programmable gain amplifier of the first circuit gain stage, and the signal gain of the second gain stage is changed from the second signal gain to the fourth signal gain by changing resistance values of circuit elements in the second circuit gain stage.
13. An integrated circuit comprising:
a sensor circuit;
an excitation circuit configured to apply excitation signals to the sensor circuit, wherein the excitation circuit includes a configurable first circuit gain stage and a configurable second circuit gain stage, wherein in a first gain mode the excitation circuit generates a first excitation signal from a test signal using a first signal gain applied by the first circuit gain stage and a second signal gain applied by the second circuit gain stage, and in a second gain mode the excitation circuit generates a second excitation signal from the test signal using a third signal gain applied by the first circuit gain stage and a fourth signal gain applied by the second circuit gain stage; and
a measurement circuit configured to selectively initiate application of the first excitation signal or the second excitation signal to the sensor circuit and calculate the internal impedance of the sensor circuit, apply a predetermined excitation signal to the sensor circuit, determine a range of internal impedance of the sensor circuit, and select the signal gain of one or both of the first circuit gain stage and the second circuit gain stage according to the determined range of internal impedance, and
wherein the measurement circuit is configured to initiate application of the first excitation signal to the sensor circuit when the internal impedance of the sensor has a first internal impedance range and initiate application of the second excitation signal to the sensor circuit when the internal impedance of the sensor has a second internal impedance range, wherein the first internal impedance is greater than the second internal impedance range.
14. The integrated circuit of claim 13 , further including a digital-to-analog converter (DAC) circuit configured to generate the test signal.
15. The integrated circuit of claim 14 , including a control circuit configured to control the DAC circuit to change one or both of the frequency of the test signal and the magnitude of the test signal.