Radiation transmission grid apparatus and methods for x-ray imaging detectors
View Patent ↗The present invention relates generally to X-ray detectors and more particularly to a system and a method for integrating an anti-scattering grid with scintillators to significantly enhance the performance of flat panel X-ray detector. In particular, the performance of a flat panel X-ray detector may be enhanced by photon counting detector pixels configured underneath the septa of a 2D antiscatter grid.
1. An x-ray imaging system, comprising:
an electromagnetic radiation transmission grid comprising:
a plurality of vertical walls arranged in a geometric pattern for pointing towards an x-ray source to image an object positioned between the x-ray source and said grid; and
a plurality of open ended channels defined by said plurality of vertical walls;
a detector comprising an x-ray absorbing sensor layer and a detector pixel array; and
a software program product to: receive data from said detector, and implement a correction algorithm for an image of the object based on the data, wherein said correction algorithm is configured to:
estimate a residual scatter intensity reaching said detector; and
correct the scatter intensity to improve the quality of the image, and
wherein a footprint of said grid introduces a pattern of image intensity variations in the image of the object.
2. The system of claim 1 , wherein said vertical walls comprise an essentially radiation-opaque material.
3. The system of claim 1 , wherein said x-ray absorbing sensor layer is divided into pixels with reflective walls.
4. The system of claim 1 , wherein said x-ray absorbing sensor layer is continuous, and said grid is placed directly on the said x-ray absorbing sensor layer.
5. The system of claim 1 , wherein a separation (pitch) between said grid's vertical walls is larger than a pitch of the said detector's pixel array.
6. The system of claim 1 , wherein there is a gap between said grid and said x-ray absorbing sensor layer.
7. The system of claim 1 , wherein said detector comprises an amorphous silicon pixel array, a complementary metal oxide semiconductor (CMOS) pixel array or a solid-state x-ray sensor.
8. The system of claim 1 , wherein said grid further comprises at least one structural element comprising a plurality of radio-opaque sheets.
9. The system of claim 1 , wherein said grid is a scatter measurement and correction grid.
10. The system of claim 1 , wherein said x-ray absorbing layer includes a phosphor layer.
11. The system of claim 1 , wherein said detector comprises an energy integrating detector.
12. The system of claim 1 , wherein said detector comprises a plurality of photon counting pixels.
13. The system of claim 1 further comprising the x-ray source.
14. The system of claim 13 , wherein said x-ray source is spaced apart from said detector to facilitate transmission X-ray imaging of the object.
15. The system of claim 1 , wherein said grid is: a two dimensional, or a one dimensional, grid.
16. The system of claim 1 , wherein said plurality of vertical walls comprise a metal.
17. The system of claim 1 , wherein said correction algorithm is further configured to correct the scatter intensity based on the pattern of image intensity variations in the image of the object.
18. The system of claim 1 , wherein, to estimate the residual scatter intensity, said correction algorithm is further configured to determine a change in:
in the absence of the object positioned between the x-ray source and said grid, a ratio of an image intensity underneath the footprint of said grid to an image intensity in one of the open ended channels; and
in the presence of the object positioned between the x-ray source and said grid, a ratio of the image intensity underneath the footprint of said grid to the image intensity in the one of the open ended channels.
19. The system of claim 1 , wherein the software program product comprises one or more non-transitory computer readable media having stored thereon program instructions which, when executed by a computing device, cause the computing device to implement the correction algorithm.
20. The system of claim 1 , wherein said detector comprises a silicon x-ray sensor, a cadmium telluride x-ray sensor, a cadmium zinc telluride x-ray sensor, or a complementary metal oxide semiconductor (CMOS) pixel array.
21. The system of claim 1 , wherein said grid is an antiscatter grid.
22. An x-ray imaging device, comprising:
an x-ray source;
a selective electromagnetic radiation transmission grid comprising:
a plurality of septa connected to each other in a geometric pattern and pointed towards said x-ray source;
a plurality of open ended channels defined by said plurality of septa; and
a detector configured underneath said plurality of septa and comprising a plurality of photon counting pixels, wherein said grid is in contact with the detector in the absence of said plurality of septa being aligned with said plurality of photon counting pixels;
wherein said grid provides an x-ray fluence modulation pattern on said detector for correction of pulse pile up in said photon counting pixels.
23. The device of claim 22 , wherein said grid further comprises at least one structural element that includes a plurality of metal sheets.
24. The device of claim 23 , wherein said structural element extends at least between two of said plurality of metal sheets and on both sides of at least one of the metal sheets.
25. The device of claim 23 , wherein said plurality of metal sheets in said grid are composed of sections with different heights and thicknesses.
26. The device of claim 25 , wherein a shadow of said grid generates the fluence modulation pattern having high and low x-ray fluence regions incident on said detector.
27. The device of claim 22 , wherein said plurality of septa comprises an essentially radiation-opaque material.
28. The device of claim 22 , wherein said detector comprises a silicon x-ray sensor, a cadmium telluride x-ray sensor, a cadmium zinc telluride x-ray sensor, or a complementary metal oxide semiconductor (CMOS) pixel array.
29. The device of claim 22 , wherein said grid is a scatter measurement and correction grid.
30. The device of claim 22 , wherein said device further comprises a correction algorithm to correct a transmitted residual scatter intensity.
31. The device of claim 22 , wherein said grid has septa with uniform thickness.
32. The device of claim 22 , wherein said grid comprises different thicknesses and heights in septa to control the x-ray fluence modulation pattern.
33. The device of claim 22 , wherein said grid has septa with uniform thickness.
34. The device of claim 22 , wherein septal shadows of said grid provide a lower fluence.
35. The device of claim 22 , wherein said grid is an antiscatter grid.
36. An x-ray imaging device, comprising:
an x-ray source;
a grid comprising:
a plurality of vertical walls connected to each other in a geometric pattern and pointed towards said x-ray source;
a plurality of open ended channels defined by said plurality of vertical walls; and
a detector comprising an x-ray absorbing sensor layer and a pixel array,
wherein said grid is in contact with said detector in the absence of said plurality of vertical walls being aligned with pixels of the pixel array, and
wherein said grid provides a fluence modulation pattern on said detector for correction of pulse pile up in said pixels of the pixel array.
37. An x-ray imaging method, comprising:
positioning an object between an x-ray source and an electromagnetic radiation transmission grid, the grid including: a plurality of vertical walls arranged in a geometric pattern and pointed toward the x-ray source, and a plurality of open ended channels defined by the plurality of vertical walls;
receiving electromagnetic radiation from the x-ray source using a detector including an x-ray absorbing sensor layer and a detector pixel array;
generating an image of the object based on the receiving, wherein a footprint of the grid introduces a pattern of image intensity variations in the image;
implementing, by a software program configured to receive data from the detector, and based on the data, a correction algorithm for the image of the object, the implementing comprising:
estimating a residual scatter intensity reaching the detector; and
correcting the scatter intensity to improve the quality of the image.
38. The method of claim 37 , wherein the correcting comprises correcting the scatter intensity based on the pattern of image intensity variations in the image of the object.
39. The method of claim 37 , wherein estimating the residual scatter intensity further comprises determining a change in:
in the absence of the object positioned between the x-ray source and the grid, a ratio of an image intensity underneath the footprint of the grid to an image intensity in one of the open ended channels; and
in the presence of the object positioned between the x-ray source and the grid, a ratio of the image intensity underneath the footprint of the grid to the image intensity in the one of the open ended channels.