IP Library Granted Patent US 11,898,008
Granted Patent B2
US 11,898,008 · App. 16/624,128 · Granted Feb 13, 2024

Substrate for pattern formation

Inventor: Yoshiaki Honda (Osaka, JP)
Assignee: DAIKIN INDUSTRIES, LTD.
C08G65/336C23C14/042C23C14/18C23C14/24C23C14/35H05K1/034H05K3/143
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Quick Facts
Patent No.
US 11,898,008
App. No.
16/624,128
Granted
Feb 13, 2024
Kind
B2
Abstract

A substrate for pattern formation, the substrate including at least a base material and a perfluoro(poly)ether group-containing silane compound-derived portion, wherein the base material includes at least one main face having a first region and a second region which is a region for pattern formation, adjacent to the first region, and the perfluoro(poly)ether group-containing silane compound-derived portion is disposed in the first region.

Claims (77)

1. A pattern substrate comprising a substrate for pattern formation and a pattern portion, the substrate for pattern formation comprising:

at least a base material and a perfluoro(poly)ether group-containing silane compound-derived portion, wherein

the base material comprises at least one main face having a first region and a second region which is a region for pattern formation, adjacent to the first region,

the perfluoro(poly)ether group-containing silane compound-derived portion is disposed in the first region,

the pattern portion is disposed in the second region of the substrate for pattern formation, and

the pattern portion comprises at least one selected from the group consisting of a metal and an oxide thereof,

wherein the perfluoro(poly)ether group-containing silane compound is at least one perfluoropolyether group-containing silane compound represented by formula (A1), (A2), (B1), (B2), (C1), (C2), (D1) or (D2):

wherein:

each PFPE, at each occurrence, independently is a group represented by formula:

—(OC 6 F 12 ) a —(OC 5 F 10 ) b —(OC 4 F 8 ) c —(OC 3 F 6 ) d —(OC 2 F 4 ) e —(OCF 2 ) f —

wherein a, b, c, d, e and f are each independently an integer of 0 or more and 200 or less, the sum of a, b, c, d, e and f is at least 1, and the occurrence order of the respective repeating units in parentheses with a, b, c, d, e or f is not limited in the formula;

each Rf, at each occurrence, independently represents an alkyl group having 1 to 16 carbon atoms, optionally substituted with one or more fluorine atoms;

each R 13 , at each occurrence, independently represents a hydroxyl group or a hydrolyzable group;

each R 14 , at each occurrence, independently represents a hydrogen atom or an alkyl group having 1 to 22 carbon atoms;

each R 11 , at each occurrence, independently represents a hydrogen atom or a halogen atom;

each R 12 , at each occurrence, independently represents a hydrogen atom or a lower alkyl group;

n1 with respect to a (—SiR 13 n1 R 14 3-n1 ) unit is independently an integer of 0 to 3;

provided that at least one n1 in formulae (A1), (A2), (B1) and (B2) is an integer of 1 to 3;

each X 1 , at each occurrence, independently represents a single bond or a di- to decavalent organic group;

each X 2 , at each occurrence, independently represents a single bond or a divalent organic group;

each t, at each occurrence, is independently an integer of 1 to 10;

each α1, at each occurrence, is independently an integer of 1 to 9;

each α1′ is independently an integer of 1 to 9;

each X 3 , at each occurrence, independently represents a single bond or a di- to decavalent organic group;

each β1, at each occurrence, is independently an integer of 1 to 9;

each β1′ is independently an integer of 1 to 9;

each X 5 , at each occurrence, independently represents a single bond or a di- to decavalent organic group;

each γ1, at each occurrence, is independently an integer of 1 to 9;

each γ1′ is independently an integer of 1 to 9;

each R a , at each occurrence, independently represents —Z 3 —SiR 71 p1 R 72 q1 R 73 r1 ;

each Z 3 , at each occurrence, independently represents an oxygen atom or a divalent organic group;

each R 71 , at each occurrence, independently represents R a′ ;

R a′ has the same meaning as R a ;

the number of Si atoms linearly linked via a Z 3 group in R a is at most 5;

each R 72 , at each occurrence, independently represents a hydroxyl group or a hydrolyzable group;

each R 73 , at each occurrence, independently represents a hydrogen atom or a lower alkyl group;

each p1, at each occurrence, is independently an integer of 0 to 3;

each q1, at each occurrence, is independently an integer of 0 to 3;

each r1, at each occurrence, is independently an integer of 0 to 3;

provided that the sum of p1, q1 and r1 with respect to (—Z 3 —SiR 71 p1 R 72 q1 R 73 r1 ) is 3 and at least one q1 in formulae (C1) and (C2) is an integer of 1 to 3;

each R b , at each occurrence, independently represents a hydroxyl group or a hydrolyzable group;

each R c , at each occurrence, independently represents a hydrogen atom or a lower alkyl group;

each k1, at each occurrence, is independently an integer of 0 to 3;

each l1, at each occurrence, is independently an integer of 0 to 3;

each m1, at each occurrence, is independently an integer of 0 to 3;

provided that the sum of k1, l1 and m1 with respect to (SiR a k1 R b l1 R c m1 ) is 3;

each X 7 independently represents a single bond or a di- to decavalent organic group;

each δ1 is independently an integer of 1 to 9;

each δ1′ is independently an integer of 1 to 9;

each R d , at each occurrence, independently represents —Z 4 —CR 81 p2 R 82 q2 R 83 r2 ;

each Z 4 , at each occurrence, independently represents an oxygen atom or a divalent organic group;

each R 81 , at each occurrence, independently represents R d′ ;

R d′ has the same meaning as R d ;

the number of C atoms linearly linked via a Z 4 group in R d is at most 5;

each R 82 , at each occurrence, independently represents —Y—SiR 85 n2 R 86 3-n2 ;

each Y, at each occurrence, independently represents a divalent organic group;

each R 85 , at each occurrence, independently represents a hydroxyl group or a hydrolyzable group;

each R 86 , at each occurrence, independently represents a hydrogen atom or a lower alkyl group;

n2 with respect to a (—Y—SiR 85 n2 R 86 3-n2 ) unit independently represents an integer of 0 to 3;

each R 83 , at each occurrence, independently represents a hydrogen atom or a lower alkyl group;

each p2, at each occurrence, is independently an integer of 0 to 3;

each q2, at each occurrence, is independently an integer of 0 to 3;

each r2, at each occurrence, is independently an integer of 0 to 3;

provided that the sum of p2, q2 and r2 with respect to (—Z 4 —CR 81 p2 R 82 q2 R 83 r2 ) is 3;

each R e , at each occurrence, independently represents —Y—SiR 85 n2 R 86 3-n2 ;

each R f , at each occurrence, independently represents a hydrogen atom or a lower alkyl group;

each k2, at each occurrence, is independently an integer of 0 to 3;

each l2, at each occurrence, is independently an integer of 0 to 3; and

each m2, at each occurrence, is independently an integer of 0 to 3;

provided that the sum of k2, l2 and m2 with respect to (CR d k2 R e l2 R f m2 ) is 3 and two or more groups represented by —Y—SiR 85 n2 R 86 3-n2 in which n2 is 1 or more are present in formulae (D1) and (D2).

2. The pattern substrate according to claim 1 , wherein the metal comprises at least one selected from the group consisting of silver, gold, platinum, palladium, copper, indium, tin, aluminum, zinc, titanium, magnesium, and an alloy thereof.

3. A method of producing the pattern substrate according to claim 1 , the method comprising

forming the perfluoro(poly)ether group-containing silane compound-derived portion and the region for pattern formation on at least one main face of the base material, to produce the substrate for pattern formation, and

forming the pattern portion in a region for pattern formation of the substrate for pattern formation, to produce the pattern substrate.

4. The method of producing a pattern substrate according to claim 3 , wherein the pattern portion comprises at least one selected from the group consisting of a metal and an oxide thereof.

5. The method of producing a pattern substrate according to claim 4 , wherein the metal comprises at least one selected from the group consisting of silver, gold, platinum, palladium, copper, indium, tin, aluminum, zinc, titanium, magnesium, and an alloy thereof.

6. The method of producing a pattern substrate according to claim 3 , wherein the pattern portion is formed by a deposition method.

Assignments (2)
CHANGE OF ADDRESS Recorded Jan 11, 2023
From: DAIKIN INDUSTRIES LTD.
To: DAIKIN INDUSTRIES LTD.
Reel/Frame 062355/0740 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2019
From: HONDA, YOSHIAKI
To: DAIKIN INDUSTRIES, LTD.
Reel/Frame 051517/0936 →
Priority Claims (1)
JP 2017-151838 · Aug 4, 2017 · national
Continuity (1)
Related Publication 20200231748A1 · Jul 23, 2020