Si-based negative electrode active material
A Si-based negative electrode active material that is capable of improving cycle characteristics, reducing or eliminating a plateau region in the discharge profile, and further improving high-rate characteristics. The Si-based negative electrode active material contains Si and a compound containing Si and a semimetal/metal element M, wherein the content of Si in the negative electrode active material is more than 50 wt %; the content of oxygen atoms (O) is less than 30 wt %; the content of the semimetal/metal element M is more than 10 wt % and less than 50 wt %, wherein in an X-ray diffraction pattern as measured by a powder X-ray diffraction (XRD) device using Cu-Kα1 rays, the full width at half maximum of the peak of the (111) plane of Si is 0.25° or more; and wherein the peak intensity of the peak of the (111) plane of Si is less than 20,000 cps; and the true density is 2.5 g/cm 3 or more.
1. A Si-based negative electrode active material consisting of:
a) Si;
b) oxygen (O); and
c) a compound containing Si and one or more elements M selected from the group consisting of, Ti, V, Mn, Fe, Co, Ni, Y, Zr, Nb, Mo, Ta, and W,
wherein the content of Si in the negative electrode active material is more than 50 wt %; the content of oxygen atoms (O) is more than 0 wt % and less than 30 wt %; the content of the element M is more than 10 wt % and less than 50 wt %,
wherein in an X-ray diffraction pattern of the negative electrode active material measured by a powder X-ray diffraction (XRD) device using Cu-Kα1 rays, a full width at half maximum of a peak of a (111) plane of Si is 0.25° or more; and a peak intensity of the peak of the (111) plane of Si is less than 20,000 cps; and,
wherein a true density of the Si-based negative electrode active material is 2.5 g/cm 3 or more.
2. The Si-based negative electrode active material according to claim 1 , wherein the compound containing Si and the element M is a silicide represented by M x Si y , where 0.1≤x/y≤7.0.
3. The Si-based negative electrode active material according to claim 2 , wherein in an X-ray diffraction pattern measured by a powder X-ray diffraction (XRD) device using Cu-Kα1 rays, the ratio of the peak intensity of the peak of the (111) plane of Si to the peak intensity of the main peak of the silicide represented by M x Si y is less than 1.
4. The Si-based negative electrode active material according to claim 1 , wherein a D50 particle size of the Si-based negative electrode active material determined by a laser diffraction scattering particle size distribution measuring method is less than 4 μm.
5. The Si-based negative electrode active material according to claim 1 , wherein a specific surface area (SSA) of the Si-based negative electrode material is 3 m 2 /g or more.
6. The Si-based negative electrode active material according to claim 3 , wherein a D50 particle size of the Si-based negative electrode active material determined by a laser diffraction scattering particle size distribution measuring method is less than 4 μm.
7. The Si-based negative electrode active material according to claim 3 , wherein a D50 particle size of the Si-based negative electrode active material determined by a laser diffraction scattering particle size distribution measuring method is less than 4 μm.
8. The Si-based negative electrode active material according to claim 2 , wherein a specific surface area (SSA) of the Si-based negative electrode material is 3 m 2 /g or more.
9. The Si-based negative electrode active material according to claim 4 , wherein a specific surface area (SSA) of the Si-based negative electrode material is 3 m 2 /g or more.
10. The Si-based negative electrode active material according to claim 5 , wherein a specific surface area (SSA) of the Si-based negative electrode material is 3 m 2 /g or more.