Image processing device, image processing method and charged particle microscope
An object of the invention is to quantitatively evaluate crystal growth amount in a wide range from an undergrowth state to an overgrowth state with nondestructive inspection. By using a plenty of image feature values such as pattern brightness, a pattern area and a pattern shape which are extracted from an SEM image, and depending on whether brightness inside a pattern is lower than brightness outside the pattern ( 401 ), undergrowth and overgrowth is determined ( 402, 405 ). Based on a brightness difference or the pattern area, a growth amount index or a normality index of crystal growth in a concave pattern such as a hole pattern or a trench pattern is calculated ( 404, 407 ).
1. A charged particle microscope comprising:
a detecting unit configured to detect a secondary charged particle obtained from a crystal after the crystal is irradiated with a charged particle; and
an image processing unit configured to process an image of a concave pattern on a surface of the crystal which is obtained from a detection signal of the detecting unit, wherein
the image processing unit is configured to extract pattern brightness and a pattern area as image feature values from the image, and calculate a growth amount index of crystal growth of the pattern by using the pattern brightness and the pattern area which are extracted, wherein
the image processing unit is configured to
in a case where brightness inside the pattern is lower than brightness outside the pattern, measure a brightness difference between the brightness inside the pattern and the brightness outside the pattern, and calculate the growth amount index based on the brightness difference and a first calibration curve prepared in advance, and
in a case where the brightness inside the pattern is higher than the brightness outside the pattern, calculate the growth amount index based on the pattern area and a second calibration curve prepared in advance.
2. A charged particle microscope comprising:
a detecting unit configured to detect a secondary charged particle obtained from a crystal after the crystal is irradiated with a charged particle; and
an image processing unit configured to process an image of a concave pattern on a surface of the crystal which is obtained from a detection signal of the detecting unit, wherein
the image processing unit is configured to extract pattern brightness and a pattern area as image feature values from the image, and calculate a growth amount index of crystal growth of the pattern by using the pattern brightness and the pattern area which are extracted,
wherein
the image processing unit is configured to further extract a pattern shape from the image as the image feature value, and
the pattern shape refers to a degree of circularity of the pattern, and a degree of tetragon to a degree of hexagon of the pattern.
3. The charged particle microscope according to claim 2 , wherein
the pattern brightness refers to a brightness difference between brightness inside the pattern and brightness outside the pattern, and
the image processing unit is configured to calculate the growth amount index by comparing the brightness difference, the pattern area, the degree of circularity of the pattern, and the degree of tetragon to the degree of hexagon of the pattern with a calibration table prepared in advance.
4. A charged particle microscope comprising:
a detecting unit configured to detect a secondary charged particle obtained from a crystal after the crystal is irradiated with a charged particle; and
an image processing unit configured to process an image of a concave pattern on a surface of the crystal which is obtained from a detection signal of the detecting unit, wherein
the image processing unit is configured to extract pattern brightness and a pattern area as image feature values from the image, and calculate a growth amount index of crystal growth of the pattern by using the pattern brightness and the pattern area which are extracted,
wherein
the image processing unit is configured to further extract a pattern shape from the image as the image feature value,
the image processing unit is configured to calculate a normality index of the crystal growth in the pattern by using a plurality of the image feature values extracted from the image,
the image processing unit is configured to change, depending on whether brightness inside the pattern is lower or higher than brightness outside the pattern, the image feature values for calculating the growth amount index and the normality index,
the pattern shape refers to a degree of tetragon to a degree of hexagon of the pattern, and
the image processing unit is configured to
in a case where the brightness inside the pattern is lower than the brightness outside the pattern, measure a brightness difference between the brightness inside the pattern and the brightness outside the pattern, and a brightness gradient inside the pattern, and calculate the growth amount index based on the brightness difference and calculate the normality index based on the brightness gradient, and
in a case where the brightness inside the pattern is higher than the brightness outside the pattern, calculate the growth amount index based on the pattern area, and calculate the normality index based on the degree of tetragon to the degree of hexagon of the pattern.