IP Library › Granted Patent US 11,652,243
Granted Patent B2
US 11,652,243 · App. 16/643,298 · Granted May 16, 2023

Non-destructive inspection method

Inventors: Masahiro Imada (Tokyo, JP); Takuji Hatano (Osaka, JP); Koujirou Sekine (Osaka, JP); Masaaki Tsuchida (Tokyo, JP); Tsukasa Yagi (Hyogo, JP)
Assignees: KONICA MINOLTA, INC; SPIN SENSING FACTORY CORP.
H01M10/4285G01N3/40G01N23/041G01N25/72G01N27/83H01M10/0525
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Quick Facts
Patent No.
US 11,652,243
App. No.
16/643,298
Granted
May 16, 2023
Kind
B2
Abstract

A non-destructive inspection method of inspecting an inspection target using multiple different types of non-destructive inspection means that include one non-destructive inspection means and at least one other non-destructive inspection means. The method includes determining a marking position on the inspection target in a detection result by the one non-destructive inspection means, causing a device to store the marking position, and fixedly forming a mark on the inspection target corresponding to the marking position. The mark is detectable by the other non-destructive inspection means. The method further includes causing the other non-destructive inspection means to inspect an inspection target including the mark. The method further includes contrasting detection results by the multiple different types of non-destructive inspection means in reference to the mark which is the marking position.

Claims (11)

1. A non-destructive inspection method of inspecting an inspection target using multiple different types of non-destructive inspection means that include one non-destructive inspection means and at least one other non-destructive inspection means, the method comprising:

determining a marking position on the inspection target in a detection result by the one non-destructive inspection means, causing a device to store the marking position, and fixedly forming a mark on the inspection target corresponding to the marking position, the mark being detectable by the at least one other non-destructive inspection means,

causing the at least one other non-destructive inspection means to inspect the inspection target including the mark, and,

contrasting detection results comprising the detection result by the multiple different types of non-destructive inspection means in reference to the mark which is in the marking position, wherein

the multiple different types of non-destructive inspection means include two or more of an X-ray imaging means, a magnetic field distribution measurement means, a thermography imaging means, and a hardness measurement means.

2. The non-destructive inspection method according to claim 1 , further comprising, after specifying a peculiar portion in reference to the marking position and based on the detection result by the one non-destructive inspection means, causing the at least one other non-destructive inspection means to intensively inspect the peculiar portion.

3. The non-destructive inspection method according to claim 1 , further comprising, after allocating information that is not related to position reference for the mark and after fixedly forming the mark that holds the information on the inspection target, reading the information from a detection result by the at least one other non-destructive inspection means.

4. The non-destructive inspection method according to claim 1 , wherein the multiple different types of non-destructive inspection means include an X-ray Talbot imaging device as the X-ray imaging means.

5. The non-destructive inspection method according to claim 1 , wherein

the at least one other non-destructive inspection means includes a magnetic field distribution measurement means, and

the mark is formed of a material including a magnetic material.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 14, 2026
From: KONICA MINOLTA, INC.
To: SPIN SENSING FACTORY CORP.
Reel/Frame 076009/0332 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 3, 2022
From: KONICA MINOLTA, INC.
To: SPIN SENSING FACTORY CORP.
Reel/Frame 060097/0541 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 28, 2020
From: IMADA, MASAHIRO; HATANO, TAKUJI; SEKINE, KOUJIROU; TSUCHIDA, MASAAKI; YAGI, TSUKASA
To: KONICA MINOLTA, INC.
Reel/Frame 052052/0037 →
Priority Claims (1)
JP 2017-178498 · Sep 19, 2017 · national
Continuity (1)
Related Publication 20210036384A1 · Feb 4, 2021