Optoelectrical chip
The invention relates to an optoelectronic chip comprising the following elements: a light inlet; a wavelength-sensitive optical filter; a first photoelectric element for measuring a first light intensity, particularly a first photodiode, the first photoelectric element being arranged such that light penetrating the optoelectronic chip via the light inlet, transmitted by the filter, hits the first photoelectric element; and a second photoelectric element for measuring a second light intensity, particularly a second photodiode, the second photoelectric element being arranged such that the light penetrating the optoelectronic chip via the light inlet, which is reflected by the filter, hits the second photoelectric element.
1. A measurement system including:
an optoelectrical chip comprising:
a light inlet opening,
a wavelength-sensitive optical filter,
a first photoelectric element for measuring a first light intensity, the first photoelectric element being arranged such that light entering into the optoelectrical chip via the light inlet opening, which is transmitted by the optical filter, hits the first photoelectric element, and
a second photoelectric element for measuring a second light intensity, the second photoelectric element being arranged such that light entering into the optoelectrical chip via the light inlet opening, which is reflected at the optical filter, hits the second photoelectric element; and
an optical waveguide coupled to the light inlet opening, wherein the optical waveguide comprises at least one fiber Bragg grating,
wherein a reflection surface of the optical filter is inclined at an angle relative to a propagation direction of the light entering into the optoelectrical chip via the light inlet opening, and wherein the angle is between 50 degrees and 80 degrees.
2. The measurement system according to claim 1 , wherein the optical filter is a wavelength-sensitive transmission filter or edge filter.
3. The measurement system according to claim 1 , wherein a light path from the light inlet opening to the optical filter, a light path from the optical filter to the first photoelectric element, and a light path from the optical filter to the second photoelectric element each are free from further optical elements.
4. The measurement system according to claim 1 , further comprising an evaluation circuit to which a first measurement signal from the first photoelectric element and a second measurement signal from the second photoelectric element are supplied, wherein respective values of the first and second measurement signals are associated with the respective measured first and second light intensities,
wherein the evaluation circuit is configured to divide a value of the first measurement signal by a value of the second measurement signal in order to obtain a ratio value.
5. The measurement system according to claim 4 , wherein the evaluation circuit is further configured to relate the ratio value to a model of the optical filter in order to obtain a value associated with a spectrum of the light entering via the light inlet opening.
6. The measurement system according to claim 5 , wherein the model of the optical filter comprises a calibrating model.
7. The measurement system according to claim 5 , wherein the model of the optical filter comprises a look-up table.
8. The measurement system according to claim 1 , wherein first photoelectric element is a first photodiode.
9. The measurement system according to claim 1 , wherein second photoelectric element is a second photodiode.
10. The measurement system according to claim 1 , wherein a light path from the light inlet opening to the optical filter, a light path from the optical filter to the first photoelectric element, and a light path from the optical filter to the second photoelectric element each are free from beam splitters.
11. A method for evaluating a reflection spectrum of a fiber Bragg grating, wherein the fiber Bragg grating is provided in an optical waveguide, and wherein an end of the optical waveguide is optically coupled to a light inlet opening of an optoelectrical chip,
the optoelectrical chip comprising:
a light inlet opening,
a wavelength-sensitive optical filter,
a first photoelectric element for measuring a first light intensity, the first photoelectric element being arranged such that light entering into the optoelectrical chip via the light inlet opening, which is transmitted by the optical filter, hits the first photoelectric element, and
a second photoelectric element for measuring a second light intensity, the second photoelectric element being arranged such that light entering into the optoelectrical chip via the light inlet opening, which is reflected at the optical filter, hits the second photoelectric element, wherein a reflection surface of the optical filter is inclined at an angle relative to a propagation direction of the light entering into the optoelectrical chip via the light inlet opening, and wherein the angle is between 50 degrees and 80 degrees, and
the method comprising:
measuring a transmission intensity of the light having entered via the light inlet opening and having passed the optical filter, by means of the first photoelectric element;
measuring a reflection intensity of the light having entered via the light inlet opening and having been reflected at the optical filter, by means of the second photoelectric element;
dividing the transmission intensity by the reflection intensity to obtain a ratio value; and
relating the ratio value to a model of the optical filter to obtain a value associated with the reflection spectrum.