IP Library Granted Patent US 11,390,962
Granted Patent B2
US 11,390,962 · App. 16/643,673 · Granted Jul 19, 2022

Single crystal of silicon with <100> orientation, which is doped with n-type dopant, and method for producing such a single crystal

Inventors: Georg Raming (Tann, DE); Ludwig Stockmeier (Dresden, DE); Jochen Friedrich (Eckenhaid, DE); Matthias Daniel (Freiberg, DE); Alfred Miller (Emmerting, DE)
Assignee: SILTRONIC AG
C30B15/22C30B15/203C30B15/206C30B29/06
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Quick Facts
Patent No.
US 11,390,962
App. No.
16/643,673
Granted
Jul 19, 2022
Kind
B2
Abstract

Single crystal silicon with <100> orientation is doped with n-type dopant and comprises a starting cone, a cylindrical portion and an end cone, a crystal angle being not less than 20° and not greater than 30° in a middle portion of the starting cone, the length of which is not less than 50% of a length of the starting cone, and edge facets extending from a periphery of the single crystal into the single crystal, the edge facets in the starting cone and in the cylindrical portion of the single crystal in each case having a length which is not more than 700 μm.

Claims (10)

1. A method for producing a silicon single crystal with <100> orientation, comprising:

doping a melt of silicon with n-type dopant;

pulling a starting cone, a cylindrical portion and an end cone of the single crystal by the CZ method;

pulling the starting cone with a crystal angle of not less than 20° and not more than 30° in a middle portion of the starting cone, the length of which middle portion is not less than 50% of a length of the starting cone, fluctuations of the crystal angle being limited by means of angle control to not more than 0.01°/s;

pulling the cylindrical portion of the single crystal at a pulling rate that is not more than 75% of a limit pulling rate, in the event of the limit pulling rate being exceeded, deformation of the single crystal prevents continuation of the pulling; and

actively cooling the single crystal, including the starting cone, in a region in the vicinity of a phase boundary between the growing single crystal and the melt.

2. The method of claim 1 , further comprising the pulling the single crystal in a transitional region between the starting cone and the cylindrical portion at a pulling rate of not more than 1.5 mm/min.

3. The method of claim 1 , wherein cooling of the single crystal is achieved by means of a water cooling.

4. The method of claim 2 , wherein cooling of the single crystal is achieved by means of a water cooling.

5. The method of claim 1 , further comprising: slicing semiconductor wafers from the cylindrical portion of the single crystal.

Assignments (3)
CORRECTIVE ASSIGNMENT TO CORRECT THE DATE OF THE CHANGE OF ADDRESS FROM 03/12/2020 TO 12/03/2020 PREVIOUSLY RECORDED AT REEL: 056719 FRAME: 0881. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jul 1, 2021
From: SILTRONIC AG
To: SILTRONIC AG
Reel/Frame 057561/0451 →
CHANGE OF ADDRESS Recorded Jun 30, 2021
From: SILTRONIC AG
To: SILTRONIC AG
Reel/Frame 056719/0881 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 2, 2020
From: RAMING, GEORG; STOCKMEIER, LUDWIG; FRIEDRICH, JOCHEN; DANIEL, MATTHIAS; MILLER, ALFRED
To: SILTRONIC AG
Reel/Frame 052063/0090 →