Switch matrix design for beam image system
Systems and methods for implementing a detector array are disclosed. According to certain embodiments, a substrate comprises a plurality of sensing elements including a first element and a second element. The detector comprises a switching element configured to connect the first element and the second element. The switching region may be controlled based on signals generated in response to the sensing elements receiving electrons with a predetermined amount of energy.
1. A charged particle detector comprising:
a substrate comprising a plurality of sensing elements including a first element and a second element; and
a switching element configured to connect the first element and the second element,
wherein the first element is configured to generate a first signal in response to the first element detecting a first charged particle input of a charged particle beam spot, and the second element is configured to generate a second signal in response to the second element detecting a second charged particle input of the charged particle beam spot, and
wherein the switching element is configured to group together the first element and the second element so as to associate the first element and the second element with the charged particle beam spot.
2. The detector of claim 1 , further comprising:
a first output signal path connected to the first element; and
a second output signal path connected to the second element,
wherein the switching element is configured to connect the first output signal path and the second output signal path.
3. The detector of claim 2 , further comprising:
a circuit die comprising the switching element, the first output signal path, and the second output signal path.
4. The detector of claim 1 , further comprising:
a circuit configured to control the switching element based on the first signal and the second signal.
5. The detector of claim 1 , further comprising:
a circuit die comprising the switching element.
6. The detector of claim 1 , wherein the detector comprises a first number of pixels configured to be grouped in a second number of groups, the second number being less than the first number.
7. The detector of claim 1 , wherein the first charged particle input comprises an electric signal generated in response to at least one first charged particle landing event, and wherein the second charged particle input comprises an electric signal generated in response to at least one second charged particle landing event.
8. The detector of claim 1 , further comprising a combined output path configured to output a merged signal from the first element and the second element that represents the charged particle beam spot when the switching element groups together the first element and the second element.
9. The detector of claim 1 , further comprising a circuit configured to determine that the first element or the second element is within a beam spot boundary.
10. The detector of claim 1 , wherein the first element and the second element are adjacent.
11. A detector system, comprising
a detector array comprising a plurality of sensing elements including a first element and a second element;
a switching element configured to connect the first element and the second element;
a circuit configured to generate a first signal in response to the first element detecting first charged particles that indicate a beam, and generate a second signal in response to the second element detecting second charged particles that indicate the beam; and
a controller connected to the circuit.
12. The system of claim 11 , further comprising a circuit layer comprising the switching element and the circuit.
13. The system of claim 11 , wherein
the controller is configured to control the switching element based on an address of any of the first element and the second element.
14. The system of claim 11 , wherein
the controller is configured to acquire an image based on the beam, and generate a command signal based on the image; and
the circuit is configured to control the switching element based on the command signal.
15. The system of claim 11 , wherein
the detector array comprises a first number of pixels configured to be grouped in a second number of groups, the second number being less than the first number.
16. The system of claim 15 , further comprising:
a signal conditioning circuit array;
a parallel analog signal processing path array;
a parallel analog-to-digital converter array; and
a digital control unit,
wherein the signal conditioning circuit array, the parallel analog signal processing path array, the parallel analog-to-digital converter array, and the digital control unit are connected to the detector array via a plurality of channels, a number of the plurality of channels being greater than or equal to the second number.
17. The system of claim 11 , wherein the controller is configured to override logic of the circuit.
18. The system of claim 11 , wherein the circuit comprises the controller, wherein the circuit comprises a plurality of circuits, wherein the circuit comprising the controller includes any of the plurality of circuits comprising the controller, and wherein the controller being connected to the circuit includes any of the plurality of circuits that comprise the controller being connected to any of the plurality of circuits that comprise the circuit.
19. The system of claim 11 , wherein the controller is configured to determine that the first element or the second element is within a beam spot boundary.
20. The system of claim 11 , wherein the controller is configured to group together the first element and the second element so as to associate the first element and the second element with the beam.