IP Library › Granted Patent US 11,171,641
Granted Patent B2
US 11,171,641 · App. 16/654,791 · Granted Nov 9, 2021

Compensation for air gap changes and temperature changes in a resonant phase detector

Inventors: Matthew Beardsworth (Austin, TX); Tejasvi Das (Austin, TX); Siddharth Maru (Austin, TX); Luke Lapointe (Austin, TX)
Assignee: Cirrus Logic, Inc.
H03K17/14H03K17/97H03K17/975
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Quick Facts
Patent No.
US 11,171,641
App. No.
16/654,791
Granted
Nov 9, 2021
Kind
B2
Abstract

A system may include a sensor configured to output a sensor signal indicative of a distance between the sensor and a mechanical member associated with the sensor, a measurement circuit communicatively coupled to the sensor and configured to determine a physical force interaction with the mechanical member based on the sensor signal, and a compensator configured to monitor the sensor signal and to apply a compensation factor to the sensor signal to compensate for changes to properties of the sensor based on at least one of changes in a distance between the sensor and the mechanical member and changes in a temperature associated with the sensor.

Claims (125)

1. A system comprising:

a sensor configured to output a sensor signal indicative of a distance between the sensor and a mechanical member associated with the sensor;

a measurement circuit communicatively coupled to the sensor and configured to determine a physical force interaction with the mechanical member based on the sensor signal; and

a compensator configured to:

monitor the sensor signal and to apply a compensation factor to the sensor signal to compensate for changes to properties of the sensor based on at least one of:

changes in a distance between the sensor and the mechanical member; and

changes in a temperature associated with the sensor;

during an initial calibration, determine a phase response of the sensor as a function of force applied to the mechanical member; and

based on the phase response, determine the compensation to be applied to the sensor signal to achieve a desired phase response for the sensor.

2. The system of claim 1 , wherein the sensor is a resistive-inductive-capacitive sensor.

3. The system of claim 2 , wherein:

the system further comprises a driver configured to drive the sensor at a driving frequency; and

the measurement circuit is configured to:

measure phase information associated with the sensor; and

based on the phase information, determine a displacement of a mechanical member relative to the resistive-inductive-capacitive sensor, wherein the displacement of the mechanical member causes a change in an impedance of the resistive-inductive-capacitive sensor.

4. The system of claim 3 , wherein the displacement is indicative of an interaction with a virtual button comprising the mechanical member.

5. The system of claim 4 , wherein the compensator is further configured to apply the compensation factor to consistently determine interaction with the virtual button despite changes in properties of the sensor.

6. The system of claim 1 , wherein the compensator is further configured to:

determine a resonant frequency of the sensor; and

based on the resonant frequency, determine a change in one or more of:

the distance between the sensor and the mechanical member; and

the temperature.

7. The system of claim 1 , wherein the compensator is further configured to:

determine a resonant frequency of the sensor; and

determine a change in an impedance of the sensor based on the frequency.

8. The system of claim 1 , wherein the compensator is further configured to:

determine a resonant frequency of the sensor; and

determine a change in an inductance of the sensor based on the frequency.

9. The system of claim 1 , wherein the compensator is further configured to determine a change in the distance between the sensor and the mechanical member based on the change in inductance.

10. The system of claim 1 , wherein the compensator applies the compensation factor in response to one or more of:

a change in resonant frequency of the sensor by more than a threshold frequency change;

a change in resonant frequency of the sensor at a rate outside of a predetermined frequency rate change range;

a change in a quality factor of the sensor by more than a threshold quality factor change; and

a change in the quality factor of the sensor at a rate outside of a predetermined quality factor rate change range.

11. The system of claim 1 , wherein the compensator comprises a quality factor detector configured to monitor a quality factor of the sensor and the compensator is configured to apply the compensation factor based on the quality factor.

12. The system of claim 11 , wherein the compensator is configured to determine a temperature associated with the sensor based on the quality factor.

13. The system of claim 1 , wherein the compensation factor comprises one or more of:

scaling of measured phase information associated with the sensor;

scaling of measured amplitude information associated with the sensor;

modification of a detection threshold for indicating physical force interaction with the mechanical member;

application of an offset to the sensor signal;

application of a filter to the sensor signal;

application of a compensation value from a lookup table; and

modification of a resonant frequency of the sensor.

14. The system of claim 1 , wherein the compensator is further configured to:

determine impedance of the sensor as a function of frequency;

determine a calculated inductance of the sensor based on the impedance of the sensor as a function of frequency;

compare the calculated inductance against a predetermined inductance versus distance relationship of the sensor to determine the distance between the mechanical member and the sensor; and

apply the compensation as a gain correction to compensate for changes in the distance.

15. The system of claim 1 , wherein the compensator is further configured to:

over a duration, linearly increase a current driven to the sensor from a minimum current to a maximum current;

measure a voltage associated with the sensor during the duration;

determine a calculated inductance of the sensor based on the voltage, the maximum current and the minimum current;

compare the calculated inductance against a predetermined inductance versus distance relationship of the sensor to determine the distance between the mechanical member and the sensor; and

apply the compensation as a gain correction to compensate for changes in the distance.

16. The system of claim 1 , wherein:

the system comprises a plurality of sensors including the sensor; and

the compensator is further configured to:

during an initial calibration:

determine a phase response of each sensor as a function of force applied to the mechanical member; and

calculate a plurality of calibrated ratios of the phase responses between adjacent sensors of the plurality of sensors during the initial calibration; and

during an operation:

determine the phase response of each sensor as a function of force applied to the mechanical member;

calculate a plurality of monitored ratios of the phase responses between adjacent sensors of the plurality of sensors during operation; and

apply the compensation to one or more of the plurality of sensors based on differences between the monitored ratios and the calibrated ratios.

17. A method comprising, in a system comprising a sensor configured to output a sensor signal indicative of a distance between the sensor and a mechanical member associated with the sensor and a measurement circuit communicatively coupled to the sensor and configured to determine a physical force interaction with the mechanical member based on the sensor signal:

monitoring the sensor signal;

applying a compensation factor to the sensor signal to compensate for changes to properties of the sensor based on at least one of:

changes in a distance between the sensor and the mechanical member; and

changes in a temperature associated with the sensor;

during an initial calibration, determining a phase response of the sensor as a function of force applied to the mechanical member; and

based on the phase response, determining the compensation to be applied to the sensor signal to achieve a desired phase response for the sensor.

18. The method of claim 17 , wherein the sensor is a resistive-inductive-capacitive sensor.

19. The method of claim 18 , wherein:

the system further comprises a driver configured to drive the sensor at a driving frequency; and

the measurement circuit is configured to:

measure phase information associated with the sensor; and

based on the phase information, determine a displacement of a mechanical member relative to the resistive-inductive-capacitive sensor, wherein the displacement of the mechanical member causes a change in an impedance of the resistive-inductive-capacitive sensor.

20. The method of claim 19 , wherein the displacement is indicative of an interaction with a virtual button comprising the mechanical member.

21. The method of claim 20 , further comprising applying the compensation factor to consistently determine interaction with the virtual button despite changes in properties of the sensor.

22. The method of claim 17 , further comprising:

determining a resonant frequency of the sensor; and

based on the resonant frequency, determining a change in one or more of:

the distance between the sensor and the mechanical member; and

the temperature.

23. The method of claim 17 , further comprising:

determining a resonant frequency of the sensor; and

determining a change in an impedance of the sensor based on the frequency.

24. The method of claim 17 , further comprising:

determining a resonant frequency of the sensor; and

determining a change in an inductance of the sensor based on the frequency.

25. The method of claim 17 , further comprising determining a change in the distance between the sensor and the mechanical member based on the change in inductance.

26. The method of claim 17 , further comprising applying the compensation factor in response to one or more of:

a change in resonant frequency of the sensor by more than a threshold frequency change;

a change in resonant frequency of the sensor at a rate outside of a predetermined frequency rate change range;

a change in a quality factor of the sensor by more than a threshold quality factor change; and

a change in the quality factor of the sensor at a rate outside of a predetermined quality factor rate change range.

27. The method of claim 17 , further comprising monitoring a quality factor of the sensor and the compensator is configured to apply the compensation factor based on the quality factor.

28. The method of claim 27 , further comprising determining a temperature associated with the sensor based on the quality factor.

29. The method of claim 17 , wherein the compensation factor comprises one or more of:

scaling of measured phase information associated with the sensor;

scaling of measured amplitude information associated with the sensor;

modification of a detection threshold for indicating physical force interaction with the mechanical member;

application of an offset to the sensor signal;

application of a filter to the sensor signal;

application of a compensation value from a lookup table; and

modification of a resonant frequency of the sensor.

30. The method of claim 17 , further comprising:

determining impedance of the sensor as a function of frequency;

determining a calculated inductance of the sensor based on the impedance of the sensor as a function of frequency;

comparing the calculated inductance against a predetermined inductance versus distance relationship of the sensor to determine the distance between the mechanical member and the sensor; and

applying the compensation as a gain correction to compensate for changes in the distance.

31. The method of claim 17 , further comprising:

over a duration, linearly increasing a current driven to the sensor from a minimum current to a maximum current;

measuring a voltage associated with the sensor during the duration;

determining a calculated inductance of the sensor based on the voltage, the maximum current and the minimum current;

comparing the calculated inductance against a predetermined inductance versus distance relationship of the sensor to determine the distance between the mechanical member and the sensor; and

applying the compensation as a gain correction to compensate for changes in the distance.

32. The method of claim 17 , wherein the system comprises a plurality of sensors including the sensor, and the method further comprises, during an initial calibration:

determining a phase response of each sensor as a function of force applied to the mechanical member;

calculating a plurality of calibrated ratios of the phase responses between adjacent sensors of the plurality of sensors during the initial calibration; and

during an operation:

determining the phase response of each sensor as a function of force applied to the mechanical member;

calculating a plurality of monitored ratios of the phase responses between adjacent sensors of the plurality of sensors during operation; and

applying the compensation to one or more of the plurality of sensors based on differences between the monitored ratios and the calibrated ratios.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 22, 2021
From: CIRRUS LOGIC INTERNATIONAL SEMICONDUCTOR LTD.
To: CIRRUS LOGIC, INC.
Reel/Frame 057565/0632 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 16, 2019
From: BEARDSWORTH, MATTHEW; DAS, TEJASVI; MARU, SIDDHARTH; LAPOINTE, LUKE
To: CIRRUS LOGIC INTERNATIONAL SEMICONDUCTOR LTD.
Reel/Frame 050737/0364 →
Continuity (2)
Provisional Application 62856393 · Jun 3, 2019
Related Publication 20200382113A1 · Dec 3, 2020