Apparatus and method for capturing still images and video using diffraction coded imaging techniques
An apparatus and method are described for capturing images in visible light as well as other radiation wavelengths. In one embodiment, the apparatus comprises: a diffraction coded imaging system including a plurality of apertures arranged in a diffraction coded array pattern with opaque material blocking array elements not containing apertures; and a light- or radiation-sensitive sensor coupled to the diffraction coded imaging system array and positioned at a specified distance behind the diffraction coded imaging system array, the radiation-sensitive sensor configured to sense light or radiation transmitted and diffracted through the apertures in the diffraction coded imaging system array.
1. An apparatus for precompensating for the effects of diffraction and wave-optical interference comprising:
a sensor;
a physical aperture pattern constructed to emulate a result of a desired aperture pattern if the desired aperture pattern did not produce wave-optical interference and diffraction effects,
the physical aperture pattern to receive radiation from a scene and pre-compensate for the wave-optical interference and diffraction effects of the desired aperture pattern, taking advantage of wave-optical interference and diffraction effects of the physical aperture pattern to project a radiation pattern, the radiation pattern projected in a desired overlapping pattern that would have resulted if the physical aperture pattern had the desired aperture pattern but without the wave-optical interference and diffraction effects.
2. The apparatus as in claim 1 wherein the physical aperture pattern is used for more than one frame.
3. The apparatus as in claim 2 wherein the subject is at varying distances from the physical aperture pattern.
4. The apparatus as in claim 1 wherein the radiation includes visible light wavelengths.
5. The apparatus as in claim 1 wherein the radiation includes infrared wavelengths.
6. The apparatus as in claim 1 wherein the radiation includes ultraviolet wavelengths.
7. The apparatus as in claim 1 wherein the radiation includes microwave wavelengths.
8. The apparatus as in claim 1 wherein the radiation pattern is projected upon a sensor sensitive to the wavelength of the radiation.
9. The apparatus as in claim 8 wherein the projected radiation pattern comprises a plurality of overlapping images.
10. The apparatus as in claim 9 wherein the plurality of overlapping images is processed using coded aperture imaging techniques.
11. The apparatus as in claim 9 the pattern incident upon the sensor is an overlapping of the image of a subject positioned in front of the physical aperture pattern as projected through a plurality of Uniformly Redundant Array (URA) patterns if there had been no wave-optical interference and/or diffraction effects.
12. The apparatus as in claim 9 wherein the pattern incident upon the sensor is an overlapping of the image of a subject positioned in front of the physical aperture pattern as projected through a plurality of Modified Uniformly Redundant Array (MURA) patterns if there had been no wave-optical interference and/or diffraction effects.
13. The apparatus as in claim 9 wherein the pattern incident upon the sensor is an overlapping of the image of a subject positioned in front of the physical aperture pattern as projected through a plurality of Perfect Binary Array (PBA) patterns if there had been no wave-optical interference and/or diffraction effects.
14. The apparatus as in claim 9 wherein the pattern incident upon the sensor is an overlapping of the image of a subject positioned in front of the physical aperture pattern as projected through a plurality of random patterns if there had been no wave-optical interference and/or diffraction effects.
15. A machine-implemented method comprising:
precompensating for the effects of diffraction and wave-optical interference on an apparatus comprising:
a sensor;
a physical aperture pattern constructed to emulate a result of a desired aperture pattern if the desired aperture pattern did not produce wave-optical interference and diffraction effects,
the physical aperture pattern receiving radiation from a scene and pre-compensating for the wave-optical interference and diffraction effects of the desired aperture pattern, taking advantage of wave-optical interference and diffraction effects of the physical aperture pattern to project a radiation pattern, the radiation pattern projected in a desired overlapping pattern that would have resulted if the physical aperture pattern had the desired aperture pattern but without the wave-optical interference and diffraction effects.
16. The machine-implemented method as in claim 15 wherein the physical aperture pattern is used for more than one frame.
17. The machine-implemented method as in claim 16 wherein the subject is at varying distances from the physical aperture pattern.
18. The machine-implemented method as in claim 15 wherein the radiation includes visible light wavelengths.
19. The machine-implemented method as in claim 15 wherein the radiation includes infrared wavelengths.
20. The machine-implemented method as in claim 15 wherein the radiation includes ultraviolet wavelengths.
21. The machine-implemented method as in claim 15 wherein the radiation includes microwave wavelengths.
22. The machine-implemented method as in claim 15 wherein the radiation pattern is upon a sensor sensitive to the wavelength of the radiation.
23. The machine-implemented method as in claim 22 wherein the projected radiation pattern comprises a plurality of overlapping images.
24. The machine-implemented method as in claim 23 wherein the plurality of overlapping images is processed using coded aperture imaging techniques.
25. The machine-implemented method as in claim 23 the pattern incident upon the sensor is an overlapping of the image of a subject positioned in front of the physical aperture pattern as projected through a plurality of Uniformly Redundant Array (URA) patterns if there had been no wave-optical interference and/or diffraction effects.
26. The machine-implemented method as in claim 23 wherein the pattern incident upon the sensor is an overlapping of the image of a subject positioned in front of the physical aperture pattern as projected through a plurality of Modified Uniformly Redundant Array (MURA) patterns if there had been no wave-optical interference and/or diffraction effects.
27. The machine-implemented method as in claim 23 wherein the pattern incident upon the sensor is an overlapping of the image of a subject positioned in front of the physical aperture pattern as projected through a plurality of Perfect Binary Array (PBA) patterns if there had been no wave-optical interference and/or diffraction effects.
28. The machine-implemented method as in claim 23 wherein the pattern incident upon the sensor is an overlapping of the image of a subject positioned in front of the physical aperture pattern as projected through a plurality of random patterns if there had been no wave-optical interference and/or diffraction effects.