Temperature dependent x-ray fluorescence
A method and system for determining temperature are provided. The method comprises using an x-ray source to irradiate a sample of a material with x-rays. Photon fluorescence produced by the sample in response to the x-ray irradiation is detected by a number of photon detectors. Based on the detected fluorescence a temperature of the sample is determined according to a predetermined relationship between photon fluorescence and temperature for the material.
1. A method of determining temperature, the method comprising:
irradiating, by an x-ray source, a sample of a material with x-rays;
detecting, by a number of photon detectors, photon fluorescence produced by the sample in response to the x-ray irradiation; and
determining, by a number of processors, a temperature of the sample according to a predetermined relationship between photon fluorescence and temperature for the material.
2. The method of claim 1 , wherein the sample comprises a thermographic material.
3. The method of claim 1 , wherein photon fluorescence produced by the sample is x-ray fluorescence.
4. The method of claim 1 , wherein photon fluorescence produced by the sample is visual fluorescence.
5. The method of claim 1 , wherein the sample is in an opaque environment.
6. The method of claim 5 , wherein the sample is enclosed in a container.
7. The method of claim 1 , wherein the sample is opaque.
8. The method of claim 1 , wherein the photon detectors comprise x-ray detectors.
9. The method of claim 8 , wherein the x-ray detectors measure energy and number of x-ray photons emitted by the sample.
10. The method of claim 8 , wherein the x-ray detectors measure number of x-ray photons emitted by the sample versus time.
11. The method of claim 1 , wherein the photon detectors comprise cameras.
12. A system for determining temperature, the system comprising:
an x-ray source;
a number of photon detectors;
a number of processors in communication with the x-ray source and photon detectors, wherein the number of processors are configured to execute program instructions to:
irradiate, with the x-ray source, a sample of a material;
detect, with the photon detectors, photon fluorescence produced by the sample in response to the x-ray irradiation; and
determining a temperature of the sample according to a predetermined relationship between photon fluorescence and temperature for the material.
13. The system of claim 12 , wherein photon fluorescence produced by the sample is x-ray fluorescence.
14. The system of claim 12 , wherein photon fluorescence produced by the sample is visual fluorescence.
15. The system of claim 12 , wherein the sample is in an opaque environment.
16. The system of claim 15 , wherein the sample is enclosed in a container.
17. The system of claim 12 , wherein the sample is opaque.
18. The system of claim 12 , wherein the photon detectors comprise x-ray detectors.
19. The system of claim 18 , wherein the x-ray detectors are configured to measure energy and number of x-ray photons emitted by the sample.
20. The system of claim 18 , wherein the x-ray detectors measure number of x-ray photons emitted by the sample versus time.
21. The method of claim 12 , wherein the photon detectors comprise cameras.