IP Library Granted Patent US 11,869,824
Granted Patent B2
US 11,869,824 · App. 16/672,858 · Granted Jan 9, 2024

Thermal interface structures for integrated circuit packages

Inventors: Kyle J. Arrington (Chandler, AZ); Aaron McCann (Chandler, AZ); Kelly Lofgreen (Phoenix, AZ); Elah Bozorg-Grayeli (Chandler, AZ); Aravindha Antoniswamy (Phoenix, AZ); Joseph B. Petrini (Gilbert, AZ)
Assignee: Intel Corporation
H01L23/3735H01L23/3733H01L24/16H01L24/32H01L24/73H01L25/00H01L2224/16227H01L2224/32225H01L2224/32245H01L2224/32506H01L2224/73253
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,869,824
App. No.
16/672,858
Granted
Jan 9, 2024
Kind
B2
Abstract

A thermal interface structure may be formed comprising a thermally conductive substrate having a first surface and an opposing second surface, a first liquid metal layer on the first surface of the thermally conductive substrate, and a second liquid metal layer on the second surface of the thermally conductive substrate. The thermal interface structure may be used in an integrated circuit assembly or package between at least one integrated circuit device and a heat dissipation device.

Claims (40)

1. An apparatus, comprising:

at least one integrated circuit device;

a heat dissipation device; and

a thermal interface structure thermally connecting the at least one integrated circuit device and the heat dissipation device, wherein the thermal interface structure comprises a thermally conductive substrate having a first surface and an opposing second surface, a first liquid metal layer between the at least one integrated circuit device and the first surface of the thermally conductive substrate, and a second liquid metal layer between the heat dissipation device and the second surface of the thermally conductive substrate, wherein the thermally conductive substrate comprises at least one opening extending from the first surface of the thermally conductive substrate to the second surface of the thermally conductive substrate, and wherein at least a portion of at least one of the first liquid metal layer and the second liquid metal layer extends into the at least one opening.

2. The apparatus of claim 1 , wherein at least one of the first liquid metal layer and the second liquid metal layer comprises an alloy of gallium, indium, and tin.

3. The apparatus of claim 1 , wherein the thermally conductive substrate is selected from the group consisting of a metal substrate, a ceramic substrate, and a gap pad.

4. The apparatus of claim 1 , wherein the thermally conductive substrate comprises an amorphous metal substrate.

5. The apparatus of claim 1 , wherein the thermally conductive substrate comprises a refractory metal substrate.

6. The apparatus of claim 1 , further comprising a corrosion barrier layer between the heat dissipation device and the thermal interface structure.

7. The apparatus of claim 1 , further comprising an electronic substrate, wherein the at least one integrated circuit device is electrically attached to the electronic substrate.

8. The apparatus of claim 7 , wherein the heat dissipation device is attached to the electronic substrate.

9. The apparatus of claim 1 , further comprising:

a board; and

an integrated circuit assembly electrically attached to the board, wherein the integrated circuit assembly comprises the integrated circuit device, the heat dissipation device, and the thermal interface structure.

10. An apparatus, comprising:

an integrated circuit device;

a heat dissipation device; and

a thermal interface structure thermally coupling the integrated circuit device and the heat dissipation device, wherein the thermal interface structure comprises a substrate having a first surface and an opposing second surface, a first liquid metal layer between the integrated circuit device and the first surface, and a second liquid metal layer between the heat dissipation device and the second surface, wherein the substrate comprises an opening extending from the first surface to the second surface, and wherein at least a portion of at least one of the first liquid metal layer and the second liquid metal layer extends into the opening.

11. The apparatus of claim 10 , wherein at least one of the first liquid metal layer and the second liquid metal layer comprises an alloy of gallium, indium, and tin.

12. The apparatus of claim 10 , wherein the substrate is selected from the group consisting of a metal substrate, a ceramic substrate, and a gap pad.

13. The apparatus of claim 10 , wherein the substrate comprises an amorphous metal substrate.

14. The apparatus of claim 10 , wherein the substrate comprises a refractory metal substrate.

15. The apparatus of claim 10 , further comprising a corrosion barrier layer between the heat dissipation device and the thermal interface structure.

16. The apparatus of claim 10 , further comprising an electronic substrate, wherein the integrated circuit device is electrically attached to the electronic substrate.

17. The apparatus of claim 10 , further comprising:

a board; and

an integrated circuit assembly electrically attached to the board, wherein the integrated circuit assembly comprises the integrated circuit device, the heat dissipation device, and the thermal interface structure.

18. An apparatus, comprising:

an integrated circuit device;

a heat dissipation device; and

a thermal interface structure thermally coupling the integrated circuit device and the heat dissipation device, wherein the thermal interface structure comprises a substrate having a first surface and an opposing second surface, a first liquid metal layer between the integrated circuit device and the first surface, and a second liquid metal layer between the heat dissipation device and the second surface, wherein the first liquid metal layer and the second liquid metal layer are liquid at a temperature of 25 degrees Celsius, and wherein the substrate comprises an opening extending from the first surface to the second surface, and wherein at least a portion of at least one of the first liquid metal layer and the second liquid metal layer extends into the opening.

19. The apparatus of claim 18 , wherein at least one of the first liquid metal layer and the second liquid metal layer comprises an alloy of gallium, indium, and tin.

20. The apparatus of claim 18 , wherein the substrate is selected from the group consisting of a metal substrate, a ceramic substrate, and a gap pad.

21. The apparatus of claim 18 , wherein the substrate comprises an amorphous metal substrate.

22. The apparatus of claim 18 , wherein the substrate comprises a refractory metal substrate.

23. The apparatus of claim 18 , further comprising a corrosion barrier layer between the heat dissipation device and the thermal interface structure.

24. The apparatus of claim 18 , further comprising an electronic substrate, wherein the integrated circuit device is electrically attached to the electronic substrate.

25. The apparatus of claim 18 , further comprising:

a board; and

an integrated circuit assembly electrically attached to the board, wherein the integrated circuit assembly comprises the integrated circuit device, the heat dissipation device, and the thermal interface structure.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 4, 2019
From: ARRINGTON, KYLE J.; MCCANN, AARON; LOFGREEN, KELLY; BOZORG-GRAYELI, ELAH; ANTONISWAMY, ARAVINDHA; PETRINI, JOSEPH B.
To: INTEL CORPORATION
Reel/Frame 050910/0377 →
Continuity (1)
Related Publication 20210134698A1 · May 6, 2021