IP Library › Granted Patent US 11,293,888
Granted Patent B2
US 11,293,888 · App. 16/680,951 · Granted Apr 5, 2022

Sensor

Inventors: Fumihiro Inoue (Tokyo, JP); Taketomo Nakane (Tokyo, JP)
Assignee: MINEBEA MITSUMI Inc.
G01N27/223G01N27/226G01N27/228
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Quick Facts
Patent No.
US 11,293,888
App. No.
16/680,951
Granted
Apr 5, 2022
Kind
B2
Abstract

A sensor includes a substrate, a reference electrode provided above the substrate, a lower electrode provided above the reference electrode via an insulating film, and an upper electrode provided above the lower electrode via a physical quantity detecting film. The upper electrode and the lower electrode form a parallel-plate-type detection capacitor, and the lower electrode and the reference electrode form a parallel-plate-type reference capacitor.

Claims (57)

1. A sensor comprising:

a substrate;

an insulating film;

a physical quantity detecting film;

a reference electrode provided above the substrate;

a lower electrode provided above the reference electrode, the reference electrode being provided on an opposite side of the insulating film from the lower electrode; and

an upper electrode provided above the lower electrode, the lower electrode being provided on an opposite side of the physical quantity detecting film from the upper electrode, wherein

the area of the lower electrode is smaller than the area of the reference electrode and the area of the upper electrode, and

the upper electrode and the lower electrode form a parallel-plate-type detection capacitor, and the lower electrode and the reference electrode form a parallel-plate-type reference capacitor.

2. The sensor according to claim 1 , wherein a shielding layer is disposed to surround the lower electrode.

3. The sensor according to claim 2 , further comprising two or more shielding layers.

4. The sensor according to claim 3 , wherein

the two or more shielding layers include a first shielding layer disposed to surround a part of the lower electrode and a second shielding layer disposed to surround another part of the lower electrode, and

respective drive signals are applied to the first shielding layer and the second shielding layer, the drive signals being in opposite phases.

5. The sensor according to claim 2 , wherein

the shielding layer covers signal lines, the signal lines being respectively connected to the reference electrode, the lower electrode, and the upper electrode.

6. The sensor according to claim 5 , wherein

electrostatic discharge protection circuits are coupled to the respective signal lines.

7. The sensor according to claim 6 , wherein

the substrate is a semiconductor substrate, and each of the electrostatic discharge protection circuits includes a metal-oxide-semiconductor transistor.

8. The sensor according to claim 3 , wherein

the two or more shielding layers are wiring layers that are produced by a same production process as the lower electrode.

9. The sensor according to claim 1 , further comprising:

a driver configured to apply a first alternate current drive signal to the upper electrode and apply a second alternate current drive signal to the reference electrode, the first alternate current drive signal and the second alternate current drive signal being in opposite phases; and

a charge-to-voltage converter configured to convert an electric charge into a voltage, the electric charge being output from the lower electrode.

10. The sensor according to claim 9 , further comprising:

a first semiconductor chip including the detection capacitor and the reference capacitor; and

a second semiconductor chip including the driver and the charge-to-voltage converter.

11. The sensor according to claim 10 , wherein

the first semiconductor chip is stacked above the second semiconductor chip.

12. The sensor according to claim 1 , wherein

the physical quantity detecting film is a humidity sensing film.

13. The sensor according to claim 12 , wherein

the humidity sensing film is formed of a polyimide.

14. The sensor according to claim 1 , wherein

the area of the upper electrode includes a plurality of opening areas.

15. A sensor comprising:

a substrate;

an insulating film;

a physical quantity detecting film;

a reference electrode provided above the substrate;

a lower electrode provided above the reference electrode, the reference electrode being provided on an opposite side of the insulating film from the lower electrode; and

an upper electrode provided above the lower electrode, the lower electrode being provided on an opposite side of the physical quantity detecting film from the upper electrode, and

constant potential wiring having a shape extending in a plane parallel to a plane of the insulating film, the constant potential wiring surrounding the lower electrode and serving as a shielding layer of the lower electrode, wherein

the upper electrode and the lower electrode form a parallel-plate-type detection capacitor, and the lower electrode and the reference electrode form a parallel-plate-type reference capacitor.

16. A sensor comprising:

a substrate;

an insulating film;

a physical quantity detecting film;

a reference electrode provided above the substrate;

a lower electrode provided above the reference electrode, the reference electrode being provided on an opposite side of the insulating film from the lower electrode;

an upper electrode provided above the lower electrode, the lower electrode being provided on an opposite side of the physical quantity detecting film from the upper electrode;

a plurality of signal lines, each signal line of the plurality of signal lines being respectively connected to one of the reference electrode, the lower electrode, or the upper electrode;

a shielding layer that covers the signal lines; and

a plurality of electrostatic discharge protection circuits, each electrostatic discharge protection circuit of the plurality of electrostatic discharge protection circuits being respectively coupled to one signal line of the plurality of signal lines, wherein

the upper electrode and the lower electrode form a parallel-plate-type detection capacitor, and the lower electrode and the reference electrode form a parallel-plate-type reference capacitor, and

the substrate is a semiconductor substrate, and each of the electrostatic discharge protection circuits includes a metal-oxide-semiconductor transistor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 12, 2019
From: INOUE, FUMIHIRO; NAKANE, TAKETOMO
To: MINEBEA MITSUMI INC.
Reel/Frame 050982/0110 →
Priority Claims (1)
JP JP2018-215755 · Nov 16, 2018 · national
Continuity (1)
Related Publication 20200158675A1 · May 21, 2020