Probe unit and measuring system
In a probe unit having a measuring probe, a signal processing circuit includes: a signal synthesizing portion configured to process an output of a detection element to output a composite signal obtained by synthesizing displacement components of a contact part in three directions perpendicular to one another; and a signal outputting portion configured to output a digital touch signal to the outside of the probe unit when the composite signal satisfies a predetermined threshold condition. The signal outputting portion includes three comparing portions each configured to compare a threshold condition with the composite signal. When the measuring probe measures the object to be measured, the signal outputting portion outputs the digital touch signal corresponding to outputs of the first and second comparing portions. Thus, there can be provided a probe unit and a measuring system that can stably make measurements with high accuracy while keeping high noise resistance.
1. A probe unit comprising a measuring probe including: a stylus having a contact part to be in contact with an object to be measured; a detection element configured to be capable of detecting a movement of the contact part; and at least part of a signal processing circuit configured to process an output of the detection element to output a digital touch signal, wherein:
the signal processing circuit
processes the output of the detection element to output a composite signal obtained by synthesizing displacement components of the contact part in three directions perpendicular to one another, and
outputs the digital touch signal to the outside of the probe unit when the composite signal satisfies a predetermined threshold condition;
the signal processing circuit includes a plurality of comparators each configured to compare at least a part of the predetermined threshold condition with the composite signal; and
when the measuring probe measures the object to be measured, the signal processing circuit outputs the digital touch signal corresponding to outputs of two or more comparators of the plurality of comparators.
2. The probe unit according to claim 1 , wherein the signal processing circuit stores a plurality of other threshold conditions capable of replacing the predetermined threshold condition set in the comparing portion by default.
3. The probe unit according to claim 1 , wherein the digital touch signal is outputted as parallel digital data.
4. The probe unit according to claim 1 , wherein the digital touch signal is outputted as serial digital data.
5. The probe unit according to claim 1 , wherein the predetermined threshold condition includes a signal level and a duration of the signal level.
6. The probe unit according to claim 5 , wherein:
the signal level of the predetermined threshold condition is set in each of the two or more comparators;
the durations of the signal levels are set to be the same as each other in the two or more comparators; and
the signal processing circuit further determines if durations of the outputs of the two or more comparators exceed the durations of the signal levels of the predetermined threshold conditions, respectively, and to output the digital touch signal when the durations of the outputs of the two or more comparators exceed the durations of the signal levels of the predetermined threshold conditions.
7. The probe unit according to claim 5 , wherein, when the measuring probe measures the object to be measured, the signal processing circuit outputs the digital touch signal using two of the predetermined threshold conditions in which the signal levels are different from each other and the duration of a signal level which has a higher level of the signal level is greater than or equal to the duration of the signal level which has a lower level of the signal level.
8. The probe unit according to claim 5 , wherein, when the measuring probe measures the object to be measured, the signal processing circuit outputs the digital touch signal using two of the predetermined threshold conditions in which the signal levels are the same as each other and the durations of the signal levels are different from each other.
9. The probe unit according to claim 7 , wherein, when the measuring probe is just moved without measuring the object to be measured, the signal the signal processing circuit outputs the digital touch signal using the predetermined threshold condition having the signal level higher than the signal levels used when the measuring probe measures the object to be measured.
10. A measuring system comprising:
a measuring probe including a stylus having a contact part to be in contact with an object to be measured, a detection element configured to be capable of detecting a movement of the contact part, and a signal processing circuit configured to process an output of the detection element to output a digital touch signal; and
a main body device configured to movably support the measuring probe and obtain a shape of the object to be measured on a basis of an output of the signal processing circuit, wherein:
the signal processing circuit
processes the output of the detection element to output a composite signal obtained by synthesizing displacement components of the contact part in three directions perpendicular to one another, and
outputs the digital touch signal to the main body device when the composite signal satisfies a predetermined threshold condition;
the signal processing circuit includes a plurality of comparators each configured to compare the predetermined threshold condition with the composite signal;
when the measuring probe measures the object to be measured, the signal the signal processing circuit outputs the digital touch signal corresponding to outputs of two or more comparators of the plurality of comparators; and
the main body device receives the digital touch signal and obtains the shape of the object to be measured when the outputs of the two or more comparators satisfy the predetermined threshold condition.
11. A measuring system comprising:
a measuring probe including a stylus having a contact part to be in contact with an object to be measured, a detection element configured to be capable of detecting a movement of the contact part, and a signal processing circuit configured to process an output of the detection element to output a digital touch signal; and
a main body device configured to movably support the measuring probe and obtain a shape of the object to be measured on a basis of an output of the signal processing circuit, wherein:
the signal processing circuit
processes the output of the detection element to output a composite signal obtained by synthesizing displacement components of the contact part in three directions perpendicular to one another, and
outputs the digital touch signal to the main body device when the composite signal satisfies a part of a predetermined threshold condition;
the signal processing circuit includes a plurality of comparators each configured to compare the part of the predetermined threshold condition with the composite signal;
when the measuring probe measures the object to be measured, the signal processing circuit outputs the digital touch signal corresponding to outputs of two or more comparators of the plurality of comparators;
the predetermined threshold condition includes a signal level and a duration of the signal level;
the signal level of the predetermined threshold condition is applied in the comparators, and the duration of the signal level is the same in all of the comparators; and
the main body device applies the duration of the signal level of the predetermined threshold condition to the digital touch signal upon reception of the digital touch signal, and obtains the shape of the object to be measured when the outputs of the two or more comparators satisfy the predetermined threshold condition.
12. The measuring system according to claim 10 , wherein the predetermined threshold condition is replaced by another threshold condition by a rewrite signal outputted from the main body device.