IP Library › Granted Patent US 11,856,706
Granted Patent B2
US 11,856,706 · App. 16/702,031 · Granted Dec 26, 2023

Method and system for improving the operation of semiconductor processing

Inventors: Hsui Yang (Santa Clara, CA); Yao-Hung Yang (Santa Clara, CA); Jeevan Shanbhag (Cupertino, CA); Chien-Min Liao (San Jose, CA); Earl Hunter (Lakeway, TX); David Ganon (Raanana, IL); Mariana Luigi (Los Gatos, CA); Siamak Salimian (Los Altos, CA); Tom K. Cho (Los Altos, CA); Chun-Chung Chen (San Jose, CA)
Assignee: Applied Materials, Inc.
H05K13/087H01L21/67276H01L21/67294
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,856,706
App. No.
16/702,031
Granted
Dec 26, 2023
Kind
B2
Abstract

The present disclosure is directed to a system and method to identify and track parts of a semiconductor processing chamber, as well as the status of the parts, and store status information in a centralized location as status changes over time.

Claims (31)

1. A non-transitory computer-readable medium comprising instructions that, when executed by a processor of a processing system, cause the processing system to perform a method for improving operation of semiconductor processing system, the method comprising:

receiving a tracking data for a part, the tracking data comprising a part identifier;

receiving a status data for the part, the status data comprising a condition of the part;

updating a chamber configuration of a chamber of a semiconductor processing tool, the configuration comprising a listing of a plurality of parts composing the chamber, the chamber configuration comprising the part identifier and condition of the part;

generating an updated condition of the part upon detection of operation of the semiconductor processing tool; and

providing the status data for the part comprising the updated condition.

2. The computer-readable medium of claim 1 wherein the part condition is updated with one of process data, chamber configuration data, and metrology data.

3. The computer-readable medium of claim 2 wherein a part condition history is updated with the updated condition.

4. The computer-readable medium of claim 3 further comprising determining a cleaning schedule for the part based on the part condition history.

5. The computer-readable medium of claim 1 further comprising authenticating the part identifier, and upon successful authentication, displaying the part identifier to a user as part of the chamber configuration.

6. The computer-readable medium of claim 5 further comprising not displaying the part identifier as part of the chamber configuration upon unsuccessful authentication.

7. The computer-readable medium of claim 1 wherein providing the status data comprises causing a label to be printed.

8. The computer-readable medium of claim 1 wherein receiving the part tracking data comprises receiving the part tracking data from a bar code scanner, and receiving the status data comprises receiving the status data from the bar code scanner.

9. The computer-readable medium of claim 1 wherein the chamber configuration is stored in a central server.

10. The computer readable medium of claim 1 further comprising storing at least one of the part condition and updated part condition in a central server.

11. A method for tracking a part of a semiconductor processing tool, the method comprising:

receiving a tracking data for a part, the tracking data comprising a part identifier;

receiving a status data for the part, the status data comprising a condition of the part;

updating a chamber configuration of a chamber of a semiconductor processing tool, the configuration comprising a listing of a plurality of parts composing the chamber, the chamber configuration comprising the part identifier and condition of the part;

generating an updated condition of the part upon detection of operation of the semiconductor processing tool;

providing the tracking data for the part;

providing the status data for the part comprising the updated condition.

12. The method of claim 11 wherein the part condition is updated with one of process data, chamber configuration data, and metrology data.

13. The method of claim 12 wherein a part condition history is updated with the updated condition.

14. The method of claim 13 further comprising determining a cleaning schedule for the part based on the part condition history.

15. The method of claim 11 further comprising authenticating the part identifier, and upon successful authentication, displaying the part identifier to a user as part of the chamber configuration upon successful authentication.

16. The method of claim 15 further comprising not displaying the part identifier as part of the chamber configuration upon unsuccessful authentication.

17. The method of claim 11 wherein providing the status data comprises causing a label to be printed.

18. The method of claim 11 wherein receiving the part tracking data comprises receiving the part tracking data from a bar code scanner, and receiving the status data comprises receiving the status data from the bar code scanner.

19. The method of claim 11 wherein the chamber configuration is stored in a central server.

20. The method of claim 11 further comprising storing at least one of the part condition and updated part condition in a central server.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 4, 2020
From: YANG, HSIU; YANG, YAO-HUNG; SHANBHAG, JEEVAN; LIAO, CHIEN-MIN; HUNTER, EARL; GANON, DAVID; LUIGI, MARIANA; SALIMIAN, SIAMAK; CHO, TOM K.; CHEN, CHUN-CHUNG
To: APPLIED MATERIALS, INC.
Reel/Frame 052016/0589 →
Continuity (1)
Related Publication 20210168979A1 · Jun 3, 2021