Modulation of rolling K vectors of angled gratings
Embodiments described herein relate to methods and apparatus for forming gratings having a plurality of fins with different slant angles on a substrate and forming fins with different slant angles on successive substrates using angled etch systems and/or an optical device. The methods include positioning portions of substrates retained on a platen in a path of an ion beam. The substrates have a grating material disposed thereon. The ion beam is configured to contact the grating material at an ion beam angle ϑ relative to a surface normal of the substrates and form gratings in the grating material.
1. A grating forming method, comprising:
projecting an ion beam toward a substrate at ion beam angle ϑ relative to a surface normal of the substrate, wherein:
a first portion of a grating to be formed on the substrate is positioned at a first rotation angle ϕ 1 between the ion beam and a first grating vector of one or more first fins to be formed by the ion beam contacting the first portion;
the first rotation ϕ 1 angle is selected to form the one or more first fins with a first slant angle ϑ′ 1 ;
a second portion of the grating to be formed on the substrate is positioned at a second rotation angle ϕ 2 between the ion beam and a second grating vector of one or more second fins to be formed by the ion beam contacting the second portion; and
the second rotation angle ϕ 2 is selected to form the one or more second fins of the grating with a second slant angle ϑ′ 2 different than the first slant angle ϑ′ 1 .
2. The method of claim 1 , wherein the ion beam angle ϑ for the forming the one or more first fins and the one or more second fins is the same.
3. The method of claim 2 , wherein forming the one or more first fins and the one or more second fins comprises moving the platen along an x-axis thereof.
4. The method of claim 1 , wherein forming the one or more first fins and the one or more second fins comprises moving the platen in an x-direction and/or a z-direction.
5. The method of claim 1 , wherein forming the one or more first fins and the one or more second fins comprises tilting the platen relative to a z-direction.
6. The method of claim 1 , further comprising bending the ion beam relative to the platen.
7. The method of claim 6 , wherein bending the ion beam comprises moving one or more pairs of electrodes relative to the ion beam.
8. The method of claim 7 , wherein the one or more electrodes comprises:
a plurality of entrance electrodes;
a plurality of suppression electrodes positioned downstream of the entrance electrodes; and
a plurality of exit electrodes positioned downstream of the suppression electrodes.
9. The method of claim 1 , wherein the ion beam is produced by an ion beam source having a plurality of electrodes positioned along a beam path of the ion beam, and wherein a first beam angle α and a second beam angle α are provided by varying voltages to electrodes.
10. A grating forming method, comprising:
projecting an ion beam toward a substrate at ion beam angle ϑ relative to a surface normal of the substrate, a first portion of a grating to be formed on the substrate is positioned at a first rotation angle ϕ 1 between the ion beam and a first grating vector of one or more first fins to be formed by the ion beam contacting the first portion, the first rotation ϕ 1 angle is selected to form the one or more first fins with a first slant angle ϑ′ 1 ;
rotating the substrate such that a second portion of the grating to be formed on the substrate is positioned at a second rotation angle ϕ 2 between the ion beam and a second grating vector of one or more second fins to be formed by the ion beam contacting the second portion, the second rotation angle ϕ 2 is selected to form the one or more second fins of the grating with a second slant angle ϑ′ 2 different than the first slant angle ϑ′ 1 .
11. The method of claim 10 , wherein the ion beam angle ϑ remains static.
12. The method of claim 10 , wherein forming the one or more first fins and the one or more second fins comprises moving the platen in an x-direction and/or a z-direction.
13. The method of claim 10 , wherein forming the one or more first fins and the one or more second fins comprises tilting the platen relative to a z-direction.
14. The method of claim 10 , wherein the first tilt angle β and the second tilt angle β are provided by moving the platen relative to the ion beam.
15. The method of claim 14 , wherein the ion beam angle ϑ remains static.
16. The method of claim 15 , wherein forming the one or more first fins and the one or more second fins comprises moving the platen in an x-direction and/or a z-direction.
17. The method of claim 15 , wherein forming the one or more first fins and the one or more second fins comprises tilting the platen relative to a z-direction.
18. A grating forming method, comprising:
positioning a first portion of a substrate retained on a platen in a path of an ion beam, the substrate having a grating material disposed thereon, the ion beam configured to contact the grating material at an ion beam angle ϑ relative to a surface normal of the substrate and form one or more first fins in the grating material;
rotating the substrate retained on the platen about an axis of the platen resulting in a first rotation angle ϕ between the ion beam and a grating vector of the one or more first fins, the one or more first fins having a first slant angle ϑ′ relative to the surface normal of the substrate;
positioning a second portion of the substrate in the path of the ion beam configured to form one or more second fins in the grating material; and
rotating the substrate about the axis of the platen resulting in a second rotation angle ϕ between the ion beam and the grating vector of the one or more second fins, the one or more second fins having a second slant angle ϑ′ relative to the surface normal of the substrate.
19. The method of claim 18 , wherein a first beam angle α and a second beam angle α are at least partially provided by bending the ion beam relative to the platen.
20. The method of claim 19 , wherein the ion beam is produced by an ion beam source having a plurality of electrodes positioned along a beam path of the ion beam, and wherein the first beam angle α and the second beam angle α are provided by one or both of varying voltages to the electrodes and moving one or more pairs of electrodes positioned about the ion beam relative to the ion beam.