IP Library Granted Patent US 11,480,457
Granted Patent B2
US 11,480,457 · App. 16/724,844 · Granted Oct 25, 2022

Predictive diagnostics systems and methods using vacuum pressure control valves

Inventors: David Brian Chamberlain (Hooksett, NH); Vladislav Davidkovich (Reading, MA); Scott Benedict (Nashua, NH); Gordon Hill (Arlington, MA)
Assignee: MKS Instruments, Inc.
G01F9/001F16K37/0083F16K37/0091F16K51/02G01N17/008
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Quick Facts
Patent No.
US 11,480,457
App. No.
16/724,844
Granted
Oct 25, 2022
Kind
B2
Abstract

Calibration of a valve in a vacuum system and providing a diagnostic indication in the vacuum system using the calibration includes measuring conductance of the valve as a function of angular valve position and generating a conductance calibration map or function for use during operation of the valve. An actual angular valve position is set based on the received set point angular valve position and a difference between the measured valve conductance and a predefined metric of conductance versus angular valve position. An actual system conductance and a difference between the actual system conductance and a reference system conductance for the system are determined. The diagnostic indication of a fault in the system is generated based on the actual angular valve position of the valve and the difference between the actual system conductance and the reference system conductance for the system.

Claims (36)

1. A method for calibrating a first valve in a vacuum system, comprising:

measuring conductance of a reference valve as a function of reference valve angular position to determine a desired reference curve of conductance versus angular valve position;

measuring conductance of the first valve as a function of angular valve position;

determining a conductance map or function for the first valve by comparing the measured conductance of the first valve as a function of angular valve position to the desired reference curve of conductance versus angular valve position;

storing the conductance calibration map or function and the desired reference curve for use during operation of the first valve; and

adjusting a reported position of the first valve such that the reported position of the first valve matches the position that the reference valve would have at a particular conductance value, for conductance values along the curve of conductance versus angular valve position of the reference valve.

2. The method of claim 1 , wherein a difference between the measured conductance of the first valve and the desired reference curve of conductance versus angular valve position is used in determining the conductance map or function.

3. The method of claim 2 , further comprising, during operation, receiving a set point angular valve position based on a desired conductance of the first valve; and setting actual angular valve position of the first valve based on the received set point angular valve position and the difference between the measured conductance of the first valve and the desired reference curve of conductance versus angular valve position.

4. The method of claim 3 , further comprising determining an actual system conductance and determining a difference between the actual system conductance and a reference system conductance for the system.

5. The method of claim 4 , further comprising generating a diagnostic indication of a fault in the system, the diagnostic indication being based on the actual angular valve position of the first valve and the difference between the actual system conductance and the reference system conductance for the system.

6. The method of claim 5 , wherein, if the actual angular valve position of the first valve is relatively low and the actual system conductance is greater than the reference system conductance, in a low-conductance valve, the diagnostic indication is that a flapper seal of the low-conductance valve is worn.

7. The method of claim 6 , wherein the relatively low angular valve position of the first valve is below 20 degrees.

8. The method of claim 5 , wherein, if the actual angular valve position of the first valve is relatively low and the actual system conductance is less than the reference system conductance, in a non-sealing valve, the diagnostic indication is that deposition by-products have accumulated on at least one of a valve wall and a flapper of the first valve.

9. The method of claim 8 , wherein the relatively low angular valve position of the first valve is below 20 degrees.

10. The method of claim 5 , wherein, if the actual angular valve position of the first valve is relatively high and the actual system conductance is less than the reference system conductance, in a low-conductance valve, the diagnostic indication is at least one of an at least partial blockage in a conduit of the system and degradation of a pump in the system.

11. The method of claim 10 , wherein the relatively high angular valve position of the first valve is greater than 50 degrees.

12. The method of claim 5 , wherein, if the actual angular valve position of the first valve is relatively high and the actual system conductance is less than the reference system conductance, in a non-sealing valve, the diagnostic indication is at least one of an at least partial blockage in a conduit of the system and degradation of a pump in the system.

13. The method of claim 12 , wherein the relatively high angular valve position of the first valve is greater than 50 degrees.

14. A method for providing a diagnostic indication in a vacuum system using a first valve, the method comprising:

measuring conductance of a reference valve as a function of reference valve angular position to determine a desired reference curve of conductance versus angular valve position;

measuring conductance of the first valve as a function of angular valve position;

determining a conductance map or function for the first valve by comparing the measured conductance of the first valve as a function of angular valve position to the desired reference curve of conductance versus angular valve position;

storing the conductance calibration map or function and the desired reference profile for use during operation of the first valve;

receiving a set point angular valve position based on a desired conductance of the first valve;

setting actual angular valve position of the first valve based on the received set point angular valve position and a difference between the measured conductance of the first valve and the desired reference profile of conductance versus angular valve position, said setting actual angular valve position of the first valve comprising adjusting a reported position of the first valve such that the reported position of the first valve matches the position that the reference valve would have at a particular conductance value, for conductance values along the curve of conductance versus angular valve position of the reference valve;

determining an actual system conductance;

determining a difference between the actual system conductance and a reference system conductance for the system; and

generating a diagnostic indication of a fault in the system, the diagnostic indication being based on the actual angular valve position of the first valve and the difference between the actual system conductance and the reference system conductance for the system.

15. The method of claim 14 , wherein, if the actual angular valve position of the first valve is relatively low and the actual system conductance is greater than the reference system conductance, in a low-conductance valve, the diagnostic indication is that a flapper seal of the first valve is worn.

16. The method of claim 15 , wherein the relatively low angular valve position of the first valve is below 20 degrees.

17. The method of claim 14 , wherein, if the actual angular valve position of the first valve is relatively low and the actual system conductance is less than the reference system conductance, in a non-sealing valve, the diagnostic indication is that deposition by-products have accumulated on at least one of a valve wall and a flapper of the first valve.

18. The method of claim 17 , wherein the relatively low angular valve position of the first valve is below 20 degrees.

19. The method of claim 14 , wherein, if the actual angular valve position of the first valve is relatively high and the actual system conductance is less than the reference system conductance, in a low-conductance valve, the diagnostic indication is at least one of an at least partial blockage in a conduit of the system and degradation of a pump in the system.

20. The method of claim 19 , wherein the relatively high angular valve position of the first valve is greater than 50 degrees.

21. The method of claim 14 , wherein, if the actual angular valve position of the first valve is relatively high and the actual system conductance is less than the reference system conductance, in a non-sealing valve, the diagnostic indication is at least one of an at least partial blockage in a conduit of the system and degradation of a pump in the system.

22. The method of claim 21 , wherein the relatively high angular valve position of the first valve is greater than 50 degrees.

Assignments (6)
RELEASE OF SECURITY INTEREST Recorded Aug 24, 2022
From: BARCLAYS BANK PLC
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
Reel/Frame 062739/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 24, 2022
From: BARCLAYS BANK PLC
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
Reel/Frame 063009/0001 →
SECURITY INTEREST Recorded Aug 19, 2022
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 061572/0069 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 9, 2020
From: CHAMBERLAIN, DAVID BRIAN; DAVIDKOVICH, VLADISLAV; BENEDICT, SCOTT; HILL, GORDON
To: MKS INSTRUMENTS, INC.
Reel/Frame 052052/0344 →
PATENT SECURITY AGREEMENT (TERM LOAN) Recorded Jan 23, 2020
From: ELECTRO SCIENTIFIC INDUSTRIES, INC.; MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC
Reel/Frame 051689/0973 →
PATENT SECURITY AGREEMENT (ABL) Recorded Jan 23, 2020
From: ELECTRO SCIENTIFIC INDUSTRIES, INC.; MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC
Reel/Frame 051690/0608 →
Continuity (3)
Continuation 15581875 · Apr 28, 2017
Provisional Application 62333989 · May 10, 2016
Related Publication 20200124457A1 · Apr 23, 2020