Semiconductor device and method of manufacturing the same
A method of manufacturing a semiconductor device includes: receiving a semiconductor structure, the semiconductor structure including: a fin structure; a dummy gate across over the fin structure to define a channel region of the fin structure; and a dummy dielectric layer separating the channel region of the fin structure from the dummy gate; removing the dummy gate and the dummy dielectric layer to expose the channel region of the fin structure; and forming a doped interfacial layer covering the channel region of the fin structure, in which the doped interfacial layer includes a dopant selected from the group consisting of Al, Hf, La, Sc, Y and a combination thereof.
1. A semiconductor device, comprising:
an epitaxial stack;
a gate structure across over the epitaxial stack to define a portion of the epitaxial stack, wherein the gate structure comprises:
a doped interfacial layer covering the portion of the epitaxial stack, wherein the doped interfacial layer comprises a dopant selected from the group consisting of Al, Hf, La, Sc, Y and a combination thereof;
a high-k dielectric layer over the doped interfacial layer; and
a gate electrode over the high-k dielectric layer; and
a spacer adjacent to a side of the gate electrode, wherein the spacer has a first portion and a second portion between the gate structure and the first portion of the spacer, and a dopant concentration of the second portion of the spacer is greater than a dopant concentration of the first portion of the spacer.
2. The semiconductor device of claim 1 , wherein the portion of the epitaxial stack comprises first nanowires and second nanowires alternately disposed with the first nanowires.
3. The semiconductor device of claim 1 , wherein the portion of the epitaxial stack comprises second nanowires substantially parallel and separated from each other, and the doped interfacial layer surrounds the second nanowires, and the high-k dielectric layer surrounds the doped interfacial layer.
4. The semiconductor device of claim 3 , wherein the doped interfacial layer is in contact with the second nanowires.
5. The semiconductor device of claim 1 , wherein the doped interfacial layer comprises a dielectric material selected from the group consisting of silicon oxide, germanium oxide, silicon oxynitride, germanium oxynitride and a combination thereof.
6. The semiconductor device of claim 1 , wherein the doped interfacial layer has a k-value more than 3.9 and less than 10.
7. The semiconductor device of claim 1 , wherein the high-k dielectric layer is in contact with the doped interfacial layer.
8. The semiconductor device of claim 1 , wherein the gate electrode is in contact with the high-k dielectric layer.
9. The semiconductor device of claim 1 , further comprising a dielectric layer between the epitaxial stack and the spacer, wherein the doped interfacial layer is in contact with the dielectric layer.
10. A semiconductor device, comprising:
an epitaxial stack;
a gate structure across over the epitaxial stack, wherein the gate structure comprises:
a doped interfacial layer covering a portion of the epitaxial stack comprising first nanowires and second nanowires, wherein the doped interfacial layer has a k-value more than 3.9 and less than 10;
a high-k dielectric layer over the doped interfacial layer and surrounding the second nanowires; and
a gate electrode over the high-k dielectric layer; and
a spacer in contact with the high-k dielectric layer of the gate structure, wherein a portion of the doped interfacial layer is directly under the spacer.
11. The semiconductor device of claim 10 , wherein the second nanowires are alternately disposed with the first nanowires.
12. The semiconductor device of claim 10 , wherein the portion of the epitaxial stack comprises second nanowires substantially parallel and separated from each other, and the doped interfacial layer surrounds the second nanowires.
13. The semiconductor device of claim 10 ,
wherein the spacer comprises a dopant same as a dopant in the doped interfacial layer.
14. The semiconductor device of claim 10 , wherein the k-value of the doped interfacial layer is more than or equal to 6.
15. The semiconductor device of claim 10 , wherein the doped interfacial layer is in contact with the second nanowires.
16. The semiconductor device of claim 10 , wherein the high-k dielectric layer is in contact with the doped interfacial layer.
17. The semiconductor device of claim 10 , wherein the gate electrode is in contact with the high-k dielectric layer.
18. A semiconductor device, comprising:
first nanowires and second nanowires alternatively disposed with the first nanowires;
a gate structure across over the first nanowires and second nanowires, and comprising:
a doped interfacial layer surrounding the second nanowires;
a high-k dielectric layer surrounding the doped interfacial layer; and
a gate electrode surrounding the high-k dielectric layer; and
a spacer on a side of the gate structure, wherein a sidewall of the spacer is in contact with the high-k dielectric layer and spaced apart from the doped interfacial layer.
19. The semiconductor device of claim 18 , wherein the doped interfacial layer is in contact with sidewalls of the first nanowires.
20. The semiconductor device of claim 18 , wherein the high-k dielectric layer is between the doped interfacial layer and the gate electrode.