Temperature sensing apparatus for use with a photo-thermal targeted treatment system and associated methods

1. A scanner arrangement for a temperature measurement system for measuring a temperature of a measured surface, the scanner arrangement comprising:

1) a first temperature sensor; and

2) a reference surface including a second temperature sensor integrated therein,

wherein the first temperature sensor includes a field of view simultaneously covering both at least a portion of the measured surface and at least a portion of the reference surface,

wherein the first temperature sensor is configured for simultaneously taking a first measurement of both the portion of the measured surface and the portion of the reference surface, and

wherein the first measurement of the reference surface taken by the first temperature sensor is compared to a second measurement taken by the second temperature sensor for use in calibrating the first temperature sensor.

2. The scanner arrangement of claim 1 , wherein the first temperature sensor is an infrared camera.

3. The scanner arrangement of claim 1 , wherein the second temperature sensor is a contact sensor.

4. The scanner arrangement of claim 3 , wherein the contact sensor includes at least one of an integrated circuit temperature measurement device, a resistive temperature detector, a thermocouple, and a thermistor.

5. The scanner arrangement of claim 3 , wherein the second temperature sensor includes at least two contact sensors.

6. The scanner arrangement of claim 1 , wherein the reference surface includes a texture thereon.

7. The scanner arrangement of claim 6 , wherein the texture is configured for directing any outside surface, other than from the reference surface, away from the field of view of the first temperature sensor.

8. The scanner arrangement of claim 7 , wherein the texture includes a sawtooth pattern.

9. The scanner arrangement of claim 1 , wherein the reference surface is characterized by a reference emissivity value approximately equal to a measured emissivity value of the measured surface.

10. The scanner arrangement of claim 9 , wherein the reference surface is formed of a material characterized by the reference emissivity value.

11. The scanner arrangement of claim 9 , wherein the reference surface is coated with a material characterized by the reference emissivity value.

12. The scanner arrangement of claim 1 , wherein the reference surface includes a temperature stabilization mechanism.

13. The scanner arrangement of claim 1 , further including a second reference surface including a third temperature sensor integrated therein.

14. A photo-thermal targeted treatment system for targeting a chromophore embedded in a medium, the photo-thermal targeted treatment system comprising:

a controller;

a photo-thermal treatment unit; and

a temperature measurement system for measuring a temperature of a measured surface covering at least a portion of the medium,

wherein the controller is configured for administering a treatment protocol using the photo-thermal treatment unit,

wherein the temperature measurement system includes 1) a first temperature sensor, and 2) a reference surface with a second temperature sensor integrated therein, and

wherein the first temperature sensor includes a field of view covering both at least a portion of the measured surface and at least a portion of the reference surface.

15. The photo-thermal targeted treatment system of claim 14 , wherein a first measurement taken by the first temperature sensor is compared to a second measurement taken by the second temperature sensor for use in calibrating the first temperature measurement with respect to the second temperature measurement.

16. The photo-thermal targeted treatment system of claim 15 , wherein the first and second measurements are taken in situ during the treatment protocol.

17. The photo-thermal targeted treatment system of claim 16 , wherein the first and second measurements are used by the controller to modify the treatment protocol in progress.

18. The photo-thermal targeted treatment system of claim 17 , wherein the first and second measurements are used by the controller to modify an initialization timing of the treatment protocol in accordance therewith.

19. The photo-thermal targeted treatment system of claim 17 , wherein the first and second measurements are used by the controller to terminate the treatment protocol in accordance therewith.

20. The photo-thermal targeted treatment system of claim 14 , wherein the reference surface includes a texture thereon.

21. The photo-thermal targeted treatment system of claim 20 , wherein the texture is configured for directing radiation, other than from the reference surface, away from the field of view of the first temperature sensor.

22. The photo-thermal targeted treatment system of claim 21 , wherein the texture includes a sawtooth pattern.

23. The photo-thermal targeted treatment system of claim 14 , wherein the temperature measurement system is integrated into the photo-thermal treatment unit.

24. The photo-thermal targeted treatment system of claim 14 , wherein a time response of the measured surface temperature (epidermis temperature) is used to estimate the underlying dermis temperature, thereby providing a more accurate estimate of temperature of the sebaceous gland targeted by the photo-thermal targeted treatment system.

25. A method for continuously calibrating a temperature measurement system for use with a dermatological treatment, the method comprising:

1) using a first temperature sensor, simultaneously taking a first measurement of a measured surface and a first reference measurement of a reference surface;

2) using a second temperature sensor embedded within a reference surface, taking a second reference measurement of the reference surface;

3) calculating a comparison value between the first and second reference measurements; and

4) calibrating the first temperature sensor in accordance with the comparison value.