IP Library › Granted Patent US 11,429,348
Granted Patent B2
US 11,429,348 · App. 16/759,529 · Granted Aug 30, 2022

Multiply and accumulate calculation device, neuromorphic device, and method for using multiply and accumulate calculation device

Inventors: Tatsuo Shibata (Tokyo, JP); Tomoyuki Sasaki (Tokyo, JP)
Assignee: TDK CORPORATION
G06F7/5443G06F7/02G06F7/383G06F7/50G06F7/523G06N3/063
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Quick Facts
Patent No.
US 11,429,348
App. No.
16/759,529
Granted
Aug 30, 2022
Kind
B2
Abstract

A multiply and accumulate calculation device includes a multiple calculation unit and a accumulate calculation unit. The multiple calculation unit includes a plurality of multiple calculation elements, which are variable resistance elements, and at least one reference element. The accumulate calculation unit includes an output detector configured to detect a total value of at least outputs from the plurality of multiple calculation elements. Each of the plurality of multiple calculation elements is a magnetoresistance effect element including a magnetized free layer having a magnetic domain wall, a magnetization fixed layer in which a magnetization direction is fixed, and a nonmagnetic layer sandwiched between the magnetized free layer and the magnetized fixed layer. The reference element is a reference magnetoresistance effect element having a magnetization free layer that does not have the magnetic domain wall.

Claims (52)

1. A multiply and accumulate calculation device comprising:

a multiple calculation unit; and

an accumulate calculation unit,

wherein the multiple calculation unit includes a plurality of multiple calculation elements and at least one reference element,

each of the plurality of multiple calculation elements and the at least one reference element is a variable resistance element,

the accumulate calculation unit includes an output detector configured to detect a total value of at least outputs from the plurality of multiple calculation elements,

each of the plurality of multiple calculation elements is a magnetoresistance effect element including:

a first magnetization free layer having a magnetic domain wall;

a first magnetization fixed layer in which a magnetization direction is fixed; and

a first nonmagnetic layer sandwiched between the first magnetization free layer and the first magnetization fixed layer, and

the at least one reference element is a reference magnetoresistance effect element including:

a second magnetization free layer that does not have the magnetic domain wall or a third magnetization free layer having the magnetic domain wall;

a second magnetization fixed layer in which the magnetization direction is fixed; and

a second nonmagnetic layer sandwiched between the second magnetization free layer or the third magnetization free layer and the second magnetization fixed layer,

wherein a relative angle formed by each of one magnetization direction of the second magnetization free layer or a plurality of magnetization directions of the third magnetization free layer and the magnetization direction of the second magnetization fixed layer is fixed.

2. The multiply and accumulate calculation device according to claim 1 , wherein the at least one reference element includes:

a first reference element in which the one magnetization direction of the second magnetization free layer and the magnetization direction of the second magnetization fixed layer are antiparallel;

a second reference element with the second magnetization fixed layer in which the one magnetization direction of the second magnetization free layer and the magnetization direction of the second magnetization fixed layer are parallel;

a third reference element having the third magnetization free layer in which a maximum resistance value is set; or

a fourth reference element having the third magnetization free layer in which a minimum resistance value is set.

3. The multiply and accumulate calculation device according to claim 1 , wherein the at least one reference element includes:

a first reference element in which the one magnetization direction of the second magnetization free layer and the magnetization direction of the second magnetization fixed layer are antiparallel or a third reference element having the third magnetization free layer in which a maximum resistance value is set; and

a second reference element with the second magnetization fixed layer in which the one magnetization direction of the second magnetization free layer and the magnetization direction of the second magnetization fixed layer are parallel or a fourth reference element having the third magnetization free layer in which a minimum resistance value is set.

4. The multiply and accumulate calculation device according to claim 2 , further comprising a comparison unit configured to compare the outputs from the plurality of multiple calculation elements with an output from the at least one reference element.

5. The multiply and accumulate calculation device according to claim 1 , further comprising at least one reference column,

wherein the at least one reference column includes the at least one reference element without including the plurality of multiple calculation elements.

6. The multiply and accumulate calculation device according to claim 5 , further comprising at least one reference output detector,

wherein each of the at least one reference output detector is configured to detect an output of each of the at least one reference column.

7. A method of using the multiply and accumulate calculation device according to claim 6 ,

wherein the multiply and accumulate calculation device further comprises a failure detection unit, and

the method comprises:

a normal range setting process in which the failure detection unit is configured to set a normal range of the total value of the outputs from the plurality of multiple calculation elements detected by the output detector on the basis of the output of each of the at least one reference column detected by the at least one reference output detector; and

a failure presence or absence determination process in which the failure detection unit is configured to determine the presence or absence of a failure of the plurality of multiple calculation elements on the basis of the total value of the outputs from the plurality of multiple calculation elements detected by the output detector and the normal range.

8. The method of using the multiply and accumulate calculation device according to claim 7 ,

wherein the multiply and accumulate calculation device further comprises a comparison unit, and

the method further comprises a comparison process in which the comparison unit is configured to compare the total value of the outputs from the plurality of multiple calculation elements detected by the output detector with the output of each of the at least one reference column detected by the at least one reference output detector.

9. The method of using the multiply and accumulate calculation device according to claim 8 ,

wherein the multiply and accumulate calculation device further comprises a correction unit, and

the method further comprises a correction process in which the correction unit is configured to calculate an amount of change in a resistance value depending upon temperatures of the plurality of multiple calculation elements on the basis of the total value of the outputs from the plurality of multiple calculation elements detected by the output detector and the output of each of the at least one reference column detected by the at least one reference output detector and correct resistance values of the plurality of multiple calculation elements.

10. The method of using the multiply and accumulate calculation device according to claim 5 , wherein the at least one reference column includes an operation reference column and a back-propagation reference column.

11. A neuromorphic device comprising the multiply and accumulate calculation device according to claim 1 .

12. The multiply and accumulate calculation device according to claim 3 , further comprising a comparison unit configured to compare the outputs from the plurality of multiple calculation elements with an output from the at least one reference element.

13. The multiply and accumulate calculation device according to claim 2 , further comprising at least one reference column,

wherein the at least one reference column includes the at least one reference element without including the plurality of multiple calculation elements.

14. The multiply and accumulate calculation device according to claim 3 , further comprising at least one reference column,

wherein the at least one reference column includes the at least one reference element without including the plurality of multiple calculation elements.

15. The method of using the multiply and accumulate calculation device according to claim 6 , wherein the at least one reference column includes an operation reference column and a back-propagation reference column.

16. A neuromorphic device comprising the multiply and accumulate calculation device according to claim 2 .

17. A neuromorphic device comprising the multiply and accumulate calculation device according to claim 3 .

18. A neuromorphic device comprising the multiply and accumulate calculation device according to claim 4 .

19. A neuromorphic device comprising the multiply and accumulate calculation device according to claim 5 .

20. A neuromorphic device comprising the multiply and accumulate calculation device according to claim 10 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 27, 2020
From: SHIBATA, TATSUO; SASAKI, TOMOYUKI
To: TDK CORPORATION
Reel/Frame 052502/0356 →
Priority Claims (1)
JP JP2018-049766 · Mar 16, 2018 · national
Continuity (1)
Related Publication 20200334015A1 · Oct 22, 2020