Photonic materials
Disclosed herein are photonic materials. The photonic materials can comprise: a first layer comprising In x Ga 1-x N, wherein x is from 0 to 0.5; a second layer comprising ZnSnN 2 ; and a third layer comprising In y Ga 1-y N, wherein y is from 0 to 0.5; wherein the second layer is disposed between and in contact with the first layer and the third layer, such that the second layer is sandwiched between the first layer and the third layer. In some examples, the photonic materials can be sandwiched between two or more barrier layers to form a quantum well.
1. A photonic material, comprising:
a first layer comprising In x Ga 1-x N, wherein x is from 0 to 0.5;
a second layer comprising ZnSnN 2 ; and
a third layer comprising In y Ga 1-y N, wherein y is from 0 to 0.5;
wherein the second layer is disposed between and in contact with the first layer and the third layer, such that the second layer is sandwiched between the first layer and the third layer;
wherein the photonic material has an electron wavefunction with a first confined state and a hole wavefunction with a first confined state, and wherein the overlap of the electron wavefunction and the hole wavefunction in the first confined state in the photonic material is 50% or more; and
wherein the photonic material has a spontaneous emission spectrum with a peak wavelength of 500 nm or more.
2. The photonic material of claim 1 , wherein x and/or y is from 0.05 to 0.5.
3. The photonic material of claim 1 , wherein the first layer has a first average thickness of from 0.5 nm to 5 nm.
4. The photonic material of claim 1 , wherein the second layer has a second average thickness of from 0.1 nm to 5 nm.
5. The photonic material of claim 1 , wherein the third layer has a third average thickness of from 0.3 nm to 5 nm.
6. The photonic material of claim 1 , wherein:
the first layer has a first average thickness, the second layer has a second average thickness, and the third layer has a third average thickness; and
the photonic material has an average composite thickness of from 2 nm to 6 nm, wherein the average composite thickness is the sum of the first average thickness, the second average thickness, and the third average thickness.
7. The photonic material of claim 1 , further comprising a fourth layer disposed on the third layer, such that the third layer is sandwiched between the second layer and the fourth layer, wherein the fourth layer comprises Al z Ga 1-z N and z is from 0.01 to 0.5, and wherein the fourth layer has a fourth average thickness of from 0.2 nm to 4 nm.
8. The photonic material of claim 7 , further comprising a fifth layer disposed on the fourth layer, such that the fourth layer is sandwiched between the fifth layer and the third layer, wherein the fifth layer comprises GaN.
9. The photonic material of claim 1 , further comprising a sixth layer disposed on the first layer, such that the first layer is sandwiched between the sixth layer and the second layer, wherein the sixth layer comprises GaN.
10. The photonic material of claim 1 , wherein the overlap of the electron wavefunction and the hole wavefunction in the first confined state in the photonic material is 60% or more.
11. The photonic material of claim 1 , wherein the photonic material has a spontaneous emission spectrum with a peak wavelength of 550 nm or more.
12. The photonic material of claim 1 , wherein:
the peak wavelength has an intensity of 1×10 26 s −1 cm −3 eV −1 or more at a carrier concentration of from 1×10 18 cm −3 to 5×10 18 cm −3 ;
the photonic material has a spontaneous emission recombination rate per unit volume of 1×10 25 s −1 cm −3 or more at a carrier concentration of from 1×10 18 cm −3 to 5×10 18 cm 3 ;
or a combination thereof.
13. The photonic material of claim 1 , wherein:
x and/or y is 0.22; and
the first layer has a first average thickness of from 1.9 nm to 2.1 nm, the second layer has a second average thickness of from 0.9 nm to 1.1 nm, and the third layer has a third average thickness of from 0.9 nm to 1.1 nm.
14. The photonic material of claim 13 , wherein:
the overlap of the electron wavefunction and the hole wavefunction in the first confined state in the photonic material is 55% or more; and
the photonic material has a spontaneous emission spectrum with a peak wavelength of from 680 nm to 690 nm.
15. The photonic material of claim 1 , wherein:
x and/or y is 0.12; and
the first layer has a first average thickness of from 1.9 nm to 2.1 nm, the second layer has a second average thickness of from 0.6 nm to 0.8 nm, and the third layer has a third average thickness of from 0.7 nm to 0.9 nm.
16. The photonic material of claim 15 , wherein:
the overlap of the electron wavefunction and the hole wavefunction in the first confined state in the photonic material is 60% or more; and
the photonic material has a spontaneous emission spectrum with a peak wavelength of from 595 nm to 605 nm.
17. The photonic material of claim 1 , wherein:
x and/or y is 0.11; and
the first layer has a first average thickness of from 1.9 nm to 2.1 nm, the second layer has a second average thickness of from 0.3 nm to 0.5 nm, and the third layer has a third average thickness of from 0.4 nm to 0.7 nm.
18. The photonic material of claim 17 , wherein:
the overlap of the electron wavefunction and the hole wavefunction in the first confined state in the photonic material is 60% or more; and
the photonic material has a spontaneous emission spectrum with a peak wavelength of from 525 nm to 535 nm.
19. A light emitting diode (LED) comprising a quantum well structure comprising the photonic material of claim 1 .
20. A semiconductor laser, a photovoltaic device, a solar cell, or a photodetector comprising the photonic material of claim 1 .