IP Library › Granted Patent US 11,297,268
Granted Patent B2
US 11,297,268 · App. 16/766,447 · Granted Apr 5, 2022

Solid-state imaging element, imaging apparatus, and method of controlling solid-state imaging element

Inventor: Masaki Sakakibara (Kanagawa, JP)
Assignee: Sony Semiconductor Solutions Corporation
H04N5/357H04N5/351G06K9/03G06K9/209
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Quick Facts
Patent No.
US 11,297,268
App. No.
16/766,447
Granted
Apr 5, 2022
Kind
B2
Abstract

Erroneous detection caused by flicker is suppressed in a solid-state imaging element that detects an address event. solid-state imaging element includes a plurality of pixels, a current detection unit, and a threshold control unit. In the solid-state imaging element, each of the plurality of pixels compares an amount of change in a voltage corresponding to a photocurrent with a predetermined threshold. Further, the current detection unit detects a sum of the photocurrents of the respective plurality of pixels as a total current. Further, the threshold control unit controls the predetermined threshold to a value corresponding to the total current detected by the current detection unit.

Claims (67)

1. A solid-state imaging element comprising:

a plurality of pixels, each of which is configured to compare an amount of change in a voltage corresponding to a photocurrent with a predetermined threshold;

current detection circuitry configured to detect a sum of photocurrents of the respective plurality of pixels as a total current; and

threshold control circuitry configured to control the predetermined threshold to a value corresponding to the total current.

2. The solid-state imaging element according to claim 1 , wherein

the threshold control circuitry includes

adjustment circuitry configured to adjust the total current and output the total current as an adjustment current,

an offset current source configured to generate a predetermined offset current, and

conversion circuitry configured to convert a sum or difference between the adjustment current and the predetermined offset current into the predetermined threshold and supply the predetermined threshold to each of the plurality of pixels.

3. The solid-state imaging element according to claim 2 , wherein

the offset current source includes

a reference current source configured to generate a predetermined reference current,

a first distribution circuit configured to distribute the predetermined reference current at a plurality of different ratios to generate a plurality of distribution currents, and

a first decoder configured to control the first distribution circuit and output a sum of a predetermined number of the plurality of distribution currents as the predetermined offset current.

4. The solid-state imaging element according to claim 2 , wherein

the adjustment circuitry includes

a second distribution circuit configured to distribute the total current at a plurality of different ratios to generate a plurality of distribution currents, and

a second decoder configured to control the second distribution circuit and output a sum of a predetermined number of the plurality of distribution currents as the adjustment current.

5. The solid-state imaging element according to claim 2 , wherein

the conversion circuitry includes

resistance elements, and

a third decoder configured to connect a predetermined number of the resistance elements in parallel and output a voltage generated by the adjustment current flowing through a combined resistance of the predetermined number of the resistance elements as the predetermined threshold.

6. The solid-state imaging element according to claim 1 , wherein

the current detection circuitry detects a sum of the photocurrents of some of the plurality of pixels as the total current.

7. The solid-state imaging element according to claim 1 , wherein

the threshold control circuitry controls the predetermined threshold to a higher value as the total current is larger.

8. The solid-state imaging element according to claim 1 , wherein:

the predetermined threshold includes an upper threshold and a lower threshold that are different from each other; and

each of the plurality of pixels

detects that the amount of change exceeds the upper threshold as an on event, and

detects that the amount of change falls below the lower threshold as an off event.

9. An imaging apparatus comprising:

a plurality of pixels, each of which is configured to compare an amount of change in a voltage corresponding to a photocurrent with a predetermined threshold;

current detection circuitry configured to detect a sum of photocurrents of the respective plurality of pixels as a total current;

threshold control circuitry configured to control the predetermined threshold to a value corresponding to the total current; and

a signal processor configured to process a signal including a comparison result of each of the plurality of pixels.

10. A method of controlling a solid-state imaging element, the method comprising:

comparing, for each of a plurality of pixels, an amount of change in a voltage corresponding to a photocurrent with a predetermined threshold;

detecting a sum of photocurrents of the respective plurality of pixels as a total current; and

controlling the predetermined threshold to a value corresponding to the total current.

11. The imaging apparatus according to claim 9 , wherein

the threshold control circuitry includes

adjustment circuitry configured to adjust the total current and output the total current as an adjustment current,

an offset current source configured to generate a predetermined offset current, and

conversion circuitry configured to convert a sum or difference between the adjustment current and the predetermined offset current into the predetermined threshold and supply the predetermined threshold to each of the plurality of pixels.

12. The imaging apparatus according to claim 11 , wherein

the offset current source includes

a reference current source configured to generate a predetermined reference current,

a first distribution circuit configured to distribute the predetermined reference current at a plurality of different ratios to generate a plurality of distribution currents, and

a first decoder configured to control the first distribution circuit and output a sum of a predetermined number of the plurality of distribution currents as the predetermined offset current.

13. The imaging apparatus according to claim 11 , wherein

the adjustment circuitry includes

a second distribution circuit configured to distribute the total current at a plurality of different ratios to generate a plurality of distribution currents, and

a second decoder configured to control the second distribution circuit and output a sum of a predetermined number of the plurality of distribution currents as the adjustment current.

14. The imaging apparatus according to claim 11 , wherein

the conversion circuitry includes

resistance elements, and

a third decoder configured to connect a predetermined number of the resistance elements in parallel and output a voltage generated by the adjustment current flowing through a combined resistance of the predetermined number of the resistance elements as the predetermined threshold.

15. The imaging apparatus according to claim 9 , wherein

the current detection circuitry detects a sum of the photocurrents of some of the plurality of pixels as the total current.

16. The imaging apparatus according to claim 9 , wherein

the threshold control circuitry controls the predetermined threshold to a higher value as the total current is larger.

17. The imaging apparatus according to claim 9 , wherein:

the predetermined threshold includes an upper threshold and a lower threshold that are different from each other; and

each of the plurality of pixels

detects that the amount of change exceeds the upper threshold as an on event, and

detects that the amount of change falls below the lower threshold as an off event.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 8, 2020
From: SAKAKIBARA, MASAKI
To: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 053727/0791 →
Priority Claims (1)
JP JP2018-000577 · Jan 5, 2018 · national
Continuity (1)
Related Publication 20210152762A1 · May 20, 2021
Cited By (1)
US 12,477,240