Atmospheric pressure linear rf plasma source for surface modification and treatment
An atmospheric pressure linear RF plasma source having an enclosure enclosing a chamber in the form of an extended slot having a width W, a length L, and a thickness T, with W≥20T, the enclosure having a top opening for receiving a flow of a working gas in the direction of the length L and a bottom opening for delivering a flow of plasma, with the bottom opening being open to atmospheric pressure. Then walls of the enclosure comprise a dielectric material. Two mutually opposing pancake coils are positioned on opposite sides of the enclosure and are capable of being driven by an RF power source in an opposing phase relationship. Alternatively, an elongated solenoid coil may surround the enclosure.
1. An atmospheric pressure linear RF plasma source comprising:
an enclosure enclosing a chamber in the form of an extended slot, the slot having a width W, a length L, and a thickness T, with W≥20T, the enclosure having two opposing major walls enclosing the slot in a direction of the thickness of the slot, and two opposing minor walls enclosing the slot in a direction of the width of the slot, the enclosure having a top opening communicating with the slot for receiving a flow of a gas, the enclosure having a bottom opening communicating with the slot for delivering a flow of plasma, the bottom opening being open to atmospheric pressure, the enclosure having an interior surface comprising surfaces facing the slot of each of the major and minor walls and an exterior surface comprising surfaces facing away from the slot of each of the major and minor walls, the two major walls of the enclosure comprising a dielectric material; and
two or more pairs of pancake coils connected to each other in a planar arrangement on the enclosure, each pair comprising a first and a second pancake coil positioned in an opposing relationship on opposite sides of the enclosure adjacent to the surfaces of the major walls corresponding to the exterior surface.
2. The source according to claim 1 further comprising an RF power source connected to each opposing first pancake coil and second pancake coil and structured and arranged so as to be able to drive each opposing first pancake coil and second pancake coil in an out-of-phase (opposing phase) relationship.
3. The source according to claim 1 further comprising an air knife connectable to a supply of working gas, the air knife having an air knife output slot positioned to deliver a flow of working gas into the enclosure through the top opening of the enclosure.
4. The source according to claim 1 wherein the first and second major walls comprise quartz.
5. The source according to claim 1 wherein W≥30T.
6. The source according to claim 1 wherein W≥40T.
7. The source according to claim 1 wherein W≥100T.
8. The source according to claim 1 wherein Tis selected so as to allow the source to be capable of providing a laminar flow of plasma from the lower opening of the enclosure.
9. The source according to claim 1 wherein T is selected so as to allow the source to be capable of providing a laminar flow of plasma extending from the lower opening of the enclosure a distance of in the range of from 1 to 3 cm.
10. The source according to claim 1 wherein Tis selected so as to allow the source to be capable of providing a laminar flow of plasma extending from the lower opening of the enclosure a distance of in the range of from 2 to 3 cm.
11. An atmospheric pressure linear RF plasma source comprising:
an enclosure enclosing a chamber in the form of an extended slot, the slot having a width W, a length L, and a thickness T, with W≥20T, the enclosure having two opposing major walls enclosing the slot in a direction of the thickness of the slot, and two opposing minor walls enclosing the slot in a direction of the width of the slot, the enclosure having a top opening communicating with the slot for receiving a flow of a gas, the enclosure having a bottom opening communicating with the slot for delivering a flow of plasma, the bottom opening being open to atmospheric pressure, the enclosure having an interior surface comprising surfaces facing the slot of each of the major and minor walls and an exterior surface comprising surfaces facing away from the slot of each of the major and minor walls, the two major and the two minor walls of the enclosure comprising a dielectric material; and
an elongated solenoid coil surrounding the outer surface of the enclosure.
12. The source according to claim 11 further comprising an RF power source connected to the elongated solenoid coil.
13. The source according to claim 11 further comprising an air knife connectable to a supply of working gas, the air knife having an air knife output slot positioned to deliver a flow of working gas into the enclosure through the top opening of the enclosure.
14. The source according to claim 11 wherein the first and second major walls comprise quartz.
15. The source according to claim 11 wherein W≥30T.
16. The source according to claim 11 wherein W≥40T.
17. The source according to claim 11 wherein W≥100T.
18. The source according to claim 11 wherein Tis selected so as to allow the source to be capable of providing a laminar flow of plasma from the lower opening of the enclosure.
19. The source according to claim 11 wherein Tis selected so as to allow the source to be capable of providing a laminar flow of plasma extending from the lower opening of the enclosure a distance of in the range of from 1 to 3 cm.
20. The source according to claim 11 wherein T is selected so as to allow the source to be capable of providing a laminar flow of plasma extending from the lower opening of the enclosure a distance of in the range of from 2 to 3 cm.