Noncontact, magnetic positioning of inspection equipment
A laser system and method for inspecting a substrate and/or a laser score formed in a moving web of material during laser processing of the material with a laser processing system having a laser source for generating a laser beam and a lens for focusing the laser beam and reflecting the laser beam onto the advancing web of material where the focal point is directed a selected location on the web to produce the score in the advancing web of material, the score having a depth less than the thickness of the material and measuring the depth at one or more locations on the advancing web of material concurrent with producing the score line and where the material may be a packaging material and the score provided for easy opening of the packaging.
1. A method of inspecting a laser perforation being formed in a moving web of material during laser processing of the material, the method comprising:
providing a laser processing system having a laser source for generating a laser beam and the laser processing system comprising a lens for focusing the laser beam and
reflecting the laser beam onto the advancing web of material;
providing inspection equipment comprising a first inspection device movably coupled to a housing of the laser source and positioned on a first side of the advancing web of material and second cooperative inspection device positioned on a second, opposing side of the advancing web of material such that the first inspection device and the second inspection device are aligned on opposing sides of the advancing web of material;
directing a focal point of the laser beam to a selected location on the web to produce the perforations in the material along the advancing web of material; and
inspecting the perforations at one or more locations on the advancing web of material while maintaining alignment between the first and second inspection device by way of magnetically coupling the spaced apart devices on opposing sides of the advancing web of material.
2. The method of claim 1 wherein the first device is positioned above the advancing web of material and the second device is positioned below the advancing web of material such that the advancing web of material passes through a space between the first and second device.
3. The method of claim 1 wherein a first magnet of a first magnetic polarity is coupled to the first device and a second magnet of a second, opposite magnetic polarity is coupled to the second device.
4. The method of claim 1 and automatically or manually moving the first inspection device linearly along a first guide rail positioned above the advancing web of material.
5. The method of claim 4 wherein the second inspection device follows the moving first inspection device along a second guide rail substantially parallel to the first guide rail and positioned below the advancing web of material.