Fuse array layout pattern and related apparatuses, systems, and methods
Systems, methods, and apparatuses relating to interlocking transistor active regions are disclosed. An apparatus includes a gate including electrically conductive material and an active material including a doped semiconductor material. A portion of the active material overlapped by the gate has an at least substantially triangular shape. An apparatus includes a plurality of active materials. Each active material includes tapered ends and a plurality of gates. The plurality of active materials is arranged in an interlocking pattern with at least some tapered ends of the active materials interlocking with at least some others of the tapered ends. The plurality of gates overlaps the interlocked tapered ends of the plurality of active materials.
1. An apparatus, comprising:
a fuse, comprising:
a gate comprising electrically conductive material;
an active material comprising a doped semiconductor material;
the gate overlapping the active material to define an overlap therebetween; and
the overlap of the active material by the gate defined by a triangular shape.
2. The apparatus of claim 1 , further comprising a metal oxide semiconductor capacitor (MOSCap) comprising the gate and the active material.
3. The apparatus of claim 1 , further comprising a fuse cell comprising the fuse and an access transistor, the access transistor comprising an access gate overlapping the active material, the access transistor configured to selectively provide access to the fuse.
4. The apparatus of claim 3 , wherein:
the fuse cell comprises a first fuse cell;
the fuse comprises a first fuse;
the gate of the fuse comprises a first gate;
the active material of the fuse comprises a first portion of the active material;
the first gate is overlapping the first portion of the active material to define the overlap therebetween;
the access transistor comprises a first access transistor;
the access gate of the access transistor comprises a first access gate; and
the apparatus further comprises a second fuse cell including:
a second fuse including a second gate overlapping a second portion of the active material to define an overlap therebetween; and
a second access transistor comprising a second access gate overlapping the active material, the second access transistor configured to selectively provide access to the second fuse.
5. The apparatus of claim 4 , wherein the overlap of the second portion of the active material by the second gate is defined by a triangular shape.
6. The apparatus of claim 1 , wherein:
the active material has a tapered end defining the triangular shape; and
the gate overlaps the active material over the triangular shape of the tapered end of the active material.
7. The apparatus of claim 1 , wherein:
the active material comprises a first active material; and
the apparatus further comprises a second active material, a portion of the second active material defining a triangular shape, the portion of the second active material interlocking with the triangular shape of the overlap of the active material by the gate.
8. The apparatus of claim 7 , wherein the gate overlies the portion of the second active material.