Substrate processing apparatus, device management controller, and recording medium
A substrate processing apparatus includes a device management controller including a parts management control part configured to monitor the state of parts constituting the apparatus, a device state monitoring control part configured to monitor integrity of device data obtained from an operation state of the parts constituting the apparatus, and a data matching control part configured to monitor facility data provided from a factory facility to the apparatus. The device management controller is configured to derive information evaluating the operation state of the apparatus based on a plurality of monitoring result data selected from a group consisting of maintenance timing monitoring result data acquired by the parts management control part, device state monitoring result data acquired by the device state monitoring control part, and utility monitoring result data acquired by the data matching control part.
1. A substrate processing apparatus comprising:
a device management controller including at least one selected from the group consisting of:
a parts management control part configured to monitor parts data of parts constituting the apparatus;
a device state monitoring control part configured to monitor integrity of device data obtained from an operating state of the parts constituting the apparatus; and
a data matching control part configured to monitor facility data provided from a factory facility to the apparatus; and
a display device,
wherein the device management controller is configured to:
derive an index indicative of an operation state of the apparatus based on:
monitoring result data determined as abnormal, among a plurality of monitoring result data selected from the group consisting of maintenance timing monitoring result data acquired by the parts management control part, device state monitoring result data acquired by the device state monitoring control part, and utility monitoring result data acquired by the data matching control part, and
a plurality of data selected from the group consisting of the parts data, the device data, and the facility data that are respectively evaluated by using the monitoring result data determined as abnormal; and
display, by the display device, a screen for displaying the index indicative of the operation state of the apparatus.
2. The substrate processing apparatus of claim 1 , wherein the display device is configured to display at least one monitoring result data selected from the group consisting of the maintenance timing monitoring result data, the device state monitoring result data, and the utility monitoring result data.
3. The substrate processing apparatus of claim 1 , wherein the device management controller is configured to determine an extent of abnormality of the maintenance timing monitoring result data determined as abnormal or the device state monitoring result data determined as abnormal.
4. The substrate processing apparatus of claim 1 , wherein the data matching control part is configured to:
compare the facility data related to a plurality of diagnosis target items for customer utility item, which is an item supplied from the factory facility, with reference data serving as a reference for the facility data; and
determine whether or not the facility data is abnormal.
5. The substrate processing apparatus of claim 1 ,
wherein the data matching control part is configured to compare the facility data with reference data and cause the display device to display the utility monitoring result data determined as abnormal as an icon indicating that an abnormality occurs.
6. The substrate processing apparatus of claim 1 , wherein the device state monitoring control part is configured to:
compare the device data with standard data corresponding to the device data; and
determine whether or not the device data is abnormal.
7. The substrate processing apparatus of claim 6 , wherein the device state monitoring control part is configured to make communication connection with a master apparatus having standard device data and obtain the standard device data from the master apparatus.
8. The substrate processing apparatus of claim 1 , wherein the parts management control part is configured to compare the parts data with a threshold value corresponding to the parts data and determine replacement timing according to whether the parts data exceeds the threshold value.
9. The substrate processing apparatus of claim 1 , wherein the device management controller further includes:
a storage part that stores the parts data and a threshold value corresponding to the parts data,
wherein the display device is configured to display an icon in accordance with a number of the maintenance timing monitoring result data determined as abnormal in comparison between the parts data and reference data.
10. The substrate processing apparatus of claim 1 , wherein the display device is configured to display at least one screen of:
a screen for displaying at least one monitoring result data of selected from the maintenance timing monitoring result data and the device state monitoring result data; and
a screen for displaying the utility monitoring result data.
11. The substrate processing apparatus of claim 1 , wherein the display device is configured to display on the screen a result of comparison between a file of the apparatus and a file of a master apparatus, and
wherein the device management controller is configured to collate the file of the apparatus and the file of the master apparatus and cause the display device to display a matching ratio on the screen.
12. The substrate processing apparatus of claim 1 , wherein the device management controller is configured to set a plurality of diagnosis target items including the parts of the apparatus as diagnosis targets.
13. The substrate processing apparatus of claim 12 , wherein the device management controller is configured to obtain at least one selected from the group consisting of a diagnosis result of diagnosis method items, the device state monitoring result data, and the maintenance timing monitoring result data for each of the plurality of diagnosis target items.
14. The substrate processing apparatus of claim 12 , wherein the device management controller is configured to display information including whether the diagnosis target items are abnormal based on at least one of the device state monitoring result data and the maintenance timing monitoring result data.
15. The substrate processing apparatus of claim 12 , wherein the device management controller is configured to update the index that evaluates a comprehensive operation state of the apparatus based on monitoring result data determined to be abnormal among the device state monitoring result data and the maintenance timing monitoring result data obtained for each of the plurality of diagnosis target items.
16. The substrate processing apparatus of claim 1 , wherein the display device displays on an operation screen a screen for schematically displaying an overall schematic view of the apparatus, and
wherein the device management controller is configured to display on the operation screen a part of the apparatus in which an abnormality occurs, based on monitoring result data determined as abnormal, among at least one monitoring result data of the maintenance timing monitoring result data and the device state monitoring result data, in such a manner that the abnormality can be discriminated.
17. A device management controller comprising at least one selected from the group consisting of:
a parts management control part configured to monitor parts data of parts constituting an apparatus;
a device state monitoring control part configured to monitor integrity of device data obtained from an operating state of the parts constituting the apparatus; and
a data matching control part configured to monitor facility data provided from a factory facility to the apparatus;
wherein the device management controller is configured to:
derive an index indicative of an operation state of the apparatus based on:
monitoring result data determined as abnormal, among a plurality of monitoring result data selected from the group consisting of maintenance timing monitoring result data acquired by the parts management control part, device state monitoring result data acquired by the device state monitoring control part, and utility monitoring result data determined by the data matching control part; and
a plurality of data selected from the group consisting of the parts data, the device data, and the facility data that are respectively evaluated by using the monitoring result data determined as abnormal; and
display, by a display device, a screen for displaying the index indicative of the operation state of the apparatus.
18. A non-transitory computer-readable recording medium storing a program that causes a device management controller to perform a process, wherein the device management controller includes at least one selected from the group consisting of:
a parts management control part configured to monitor parts data of parts constituting an apparatus;
a device state monitoring control part configured to monitor integrity of device data obtained from an operating state of the parts constituting the apparatus; and
a data matching control part configured to monitor facility data provided from a factory facility to the apparatus, the process comprising:
monitoring the parts data and outputting maintenance timing monitoring result data;
comparing the device data with standard data and outputting device state monitoring result data;
comparing the facility data of the apparatus with reference data corresponding to the facility data and outputting utility monitoring result data;
deriving an index indicative of an operation state of the apparatus based on:
monitoring result data determined as abnormal, among a plurality of monitoring result data selected from the group consisting of the maintenance timing monitoring result data, the device state monitoring result data, and the utility monitoring result data; and
a plurality of data selected from the group consisting of the parts data, the device data, and the facility data that are respectively evaluated by using the monitoring result data determined as abnormal; and
displaying, by a display device, a screen for displaying the index indicative of the operation state of the apparatus.