IP Library Granted Patent US 11,651,839
Granted Patent B2
US 11,651,839 · App. 16/807,081 · Granted May 16, 2023

Systems and methods for generating phase diagrams for metastable material states

Inventors: Subramanian Sankaranarayanan (Naperville, IL); Troy David Loeffler (Chicago, IL); Henry Chan (Schaumburg, IL); Mathew J. Cherukara (Darien, IL); Srilok Srinivasan (Woodridge, IL)
Assignee: UChicago Argonne, LLC
G16C20/30G16C20/00G16C20/80G16C20/70
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Quick Facts
Patent No.
US 11,651,839
App. No.
16/807,081
Granted
May 16, 2023
Kind
B2
Abstract

A system can include one or more processors configured to access at least one parameter of a material, generate a plurality of structures of the material using the at least one parameter, determine a state of each structure of the plurality of structures using the at least one parameter, determine a difference between the state of each structure of the plurality of structures and a ground state value, evaluate a convergence condition responsive to determining the difference between the state of each structure of the plurality of structures and the ground state value, and output at least one structure of the plurality of structures responsive to the convergence condition being satisfied.

Claims (22)

1. A system, comprising:

one or more processors configured to:

access at least one parameter of a material;

generate a plurality of structures of the material using the at least one parameter;

determine a state of each structure of the plurality of structures using the at least one parameter;

determine a difference between the state of each structure of the plurality of structures and a ground state value;

evaluate a convergence condition responsive to determining the difference between the state of each structure of the plurality of structures and the ground state value; and

output at least one structure of the plurality of structures responsive to the convergence condition being satisfied.

2. The system of claim 1 , wherein the one or more processors the one or more processors are configured to output a phase diagram data structure representing the at least one structure.

3. The system of claim 2 , wherein the state of each structure of the plurality of structures comprises an enthalpy of the structure, and the one or more processors are configured to:

compare the enthalpy of each structure to an energy threshold;

select a subset of the plurality of structures, each structure of the subset having an enthalpy less than the energy threshold;

determine a free energy of each structure of the subset for a plurality of temperature-pressure value pairs; and

apply a classifier to the phase diagram data structure to determine one or more boundaries between phases of the phase diagram data structure based on the free energy of each structure of the subset.

4. The system of claim 1 , wherein the at least one parameter comprises at least one of a temperature, a pressure, or a composition of the material.

5. The system of claim 1 , wherein the state of each structure comprises an enthalpy of the structure, and the one or more processors are configured to determine the state of each structure by providing the structure and the at least one parameter as input to a density functional theory model.

6. The system of claim 1 , wherein the one or more processors are configured to modify the plurality of structures by applying a genetic function to the plurality of structures.

7. The system of claim 1 , wherein the one or more processors are configured to modify one or more first structures of the plurality of structures of the material responsive to the convergence condition not being satisfied.

8. The system of claim 7 , wherein the one or more processors are configured to modify the one or more first structures by applying a genetic operation to the one or more first structures.

9. The system of claim 7 , wherein the one or more processors are further configured to:

assign a selection score to each of the one or more first structures based on a respective state of the one or more first structures; and

modify each of the one or more first structures based on the selection score assigned to the corresponding first structure.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 17, 2023
From: CHAN, HENRY; CHERUKARA, MATHEW J.; SANKARANARAYANAN, SUBRAMANIAN; SRINIVASAN, SRILOK; LOEFFLER, TROY DAVID
To: UCHICAGO ARGONNE, LLC
Reel/Frame 062398/0652 →
CONFIRMATORY LICENSE Recorded Jan 22, 2021
From: UCHICAGO ARGONNE, LLC
To: UNITED STATES DEPARTMENT OF ENERGY
Reel/Frame 054998/0339 →
Continuity (1)
Related Publication 20210272658A1 · Sep 2, 2021
Cited By (4)
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