IP Library › Granted Patent US 11,224,401
Granted Patent B2
US 11,224,401 · App. 16/841,812 · Granted Jan 18, 2022

Ultrasonic measurement method, ultrasonic measurement apparatus, and program storage device readable by machine

Inventors: Yuki Ogura (Tokyo, JP); Naohiro Hozumi (Aichi, JP); Sachiko Yoshida (Aichi, JP); Kazuto Kobayashi (Aichi, JP); Yusuke Hara (Tokyo, JP)
Assignees: SHISEIDO COMPANY, LTD.; NATIONAL UNIVERSITY CORPORATION TOYOHASHI UNIVERSITY OF TECHNOLOGY; HONDA ELECTRONICS CO., LTD.
A61B8/0858A61B8/461A61B8/485G01B17/02
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Quick Facts
Patent No.
US 11,224,401
App. No.
16/841,812
Granted
Jan 18, 2022
Kind
B2
Abstract

An ultrasonic measurement method includes irradiating an object to be measured with an ultrasonic wave, acquiring a reflection wave from the object, calculating at a processor an acoustic impedance in a depth direction of the object from the reflection wave, and estimating and outputting a thickness of the object based upon an inflection point determined by second-order differentiation of the acoustic impedance.

Claims (33)

1. An ultrasonic measurement method comprising:

irradiating an object to be measured with an ultrasonic wave;

acquiring a reflection wave from the object,

calculating at a processor an acoustic impedance in a depth direction of the object from the reflection wave; and

estimating and outputting a thickness of the object based upon an inflection point determined by second-order differentiation of the acoustic impedance.

2. The ultrasonic measurement method as claimed in claim 1 ,

wherein the object to be measured is an outermost layer of a multilayer structure, and

wherein a distance from a first inflection point that first exceeds a predetermined threshold level in the depth direction to a next inflection point located deeper than the first inflection point and at which a sign of a curvature of a rate of change of the acoustic impedance is flipped from negative to positive, is output as the thickness.

3. The ultrasonic measurement method as claimed in claim 2 ,

wherein the first inflection point and the next inflection point are determined by a second-order differentiation filtering process.

4. The ultrasonic measurement method as claimed in claim 1 , further comprising:

outputting an evaluation value of stiffness or elasticity of the object based upon at least one of the thickness and a calculation value of the acoustic impedance.

5. The ultrasonic measurement method as claimed in claim 1 , further comprising:

generating and outputting an image representing a characteristic of the object to be measured based upon a distribution of the acoustic impedance in the depth direction.

6. The ultrasonic measurement method as claimed in claim 1 ,

wherein the object to be measured is a biological membrane.

7. The ultrasonic measurement method as claimed in claim 1 ,

wherein the object to be measured is human skin, and an estimation value of a skin age is output based upon the thickness.

8. A program storage device readable by a machine comprising:

a memory that stores an ultrasonic measurement program, the ultrasonic measurement program causing the machine to execute procedures of

acquiring a reflection signal of an ultrasonic wave reflected from an object to be measured;

calculating an acoustic impedance in a depth direction of the object from the reflection signal;

estimating a thickness of the object based upon an inflection point determined by a second derivative of the acoustic impedance; and

outputting an estimation value of the thickness.

9. An ultrasonic measurement apparatus: comprising:

an ultrasonic measuring instrument configured to irradiate an object to be measured with an ultrasonic wave and receive a reflection wave from the object; and

a processor that calculates an acoustic impedance in a depth direction of the object based upon the reflection wave, and outputs an estimation value of a thickness of the object based upon an inflection point determined from a second derivative of the acoustic impedance.

10. The ultrasonic measurement apparatus as claimed in claim 9 ,

wherein the processor outputs an evaluation value of stiffness or elasticity of the object based upon at least one of the thickness and a calculation value of the acoustic impedance.

11. The ultrasonic measurement apparatus as claimed in claim 9 , further comprising:

a display device,

wherein the processor generates an image representing a characteristic of the object to be measured based upon a distribution of the acoustic impedance in the depth direction, and

the display device displays the image generated by the processor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 7, 2020
From: OGURA, YUKI; HOZUMI, NAOHIRO; YOSHIDA, SACHIKO; KOBAYASHI, KAZUTO; HARA, YUSUKE
To: SHISEIDO COMPANY, LTD.; NATIONAL UNIVERSITY CORPORATION TOYOHASHI UNIVERSITY OF TECHNOLOGY; HONDA ELECTRONICS CO., LTD.
Reel/Frame 052328/0513 →
Priority Claims (1)
JP JP2019-078727 · Apr 17, 2019 · national
Continuity (1)
Related Publication 20200330069A1 · Oct 22, 2020