Scan cell architecture for improving test coverage and reducing test application time
A scan cell comprises: a state element and selection and combination circuitry. The selection and combination circuitry comprises first combination circuitry configured to combine a signal from a scan input of the scan cell with a signal from a functional circuit input of the scan cell to generate a first signal, second combination circuitry configured to combine the signal from the functional circuit input of the scan cell with an output signal of the state element to generate a second signal, and selection circuitry configured to select an input signal for the state element from the signal from the scan input of the scan cell, the signal from the functional circuit input of the scan cell, the first signal, and the second signal based on two selection input signals of the scan cell.
1. A scan cell, comprising:
a state element; and
selection and combination circuitry comprising:
first combination circuitry configured to combine a signal from a scan input of the scan cell with a signal from a functional circuit input of the scan cell to generate a first signal,
second combination circuitry configured to combine the signal from the functional circuit input of the scan cell with an output signal of the state element to generate a second signal, and
selection circuitry configured to select an input signal for the state element from the signal from the scan input of the scan cell, the signal from the functional circuit input of the scan cell, the first signal, and the second signal based on two selection input signals of the scan cell.
2. The scan cell recited in claim 1 , wherein each of the first combination circuitry and the second combination circuitry comprises an XOR gate.
3. The scan cell recited in claim 1 , wherein the state element is a flip-flop.
4. The scan cell recited in claim 1 , wherein the selection circuitry comprises a 4-to-1 multiplexer.
5. The scan cell recited in claim 1 , wherein the selection circuitry comprises a 2-to-1 multiplexer and two AND gates.
6. The scan cell recited in claim 1 , of which a plurality of instances form an observation scan chain in a circuit design.
7. The scan cell recited in claim 6 , wherein the plurality of instances operate in a shift-observation mode during scan shifting and in a capture-accumulation mode during scan capturing.
8. One or more computer-readable media storing computer-executable instructions for causing a computer to replace some or all of state elements in a circuit design with instances of a scan cell, the scan cell comprising:
a state element; and
selection and combination circuitry comprising:
first combination circuitry configured to combine a signal from a scan input of the scan cell with a signal from a functional circuit input of the scan cell to generate a first signal,
second combination circuitry configured to combine the signal from the functional circuit input of the scan cell with an output signal of the state element to generate a second signal, and
selection circuitry configured to select an input signal for the state element from the signal from the scan input of the scan cell, the signal from the functional circuit input of the scan cell, the first signal, and the second signal based on two selection input signals of the scan cell.
9. The one or more computer-readable media recited in claim 8 , wherein each of the first combination circuitry and the second combination circuitry comprises an XOR gate.
10. The one or more computer-readable media recited in claim 8 , wherein the state element is a flip-flop.
11. The one or more computer-readable media recited in claim 8 , wherein the selection circuitry comprises a 4-to-1 multiplexer.
12. The one or more computer-readable media recited in claim 8 , wherein the selection circuitry comprises a 2-to-1 multiplexer and two AND gates.
13. The one or more computer-readable media recited in claim 8 , of which a plurality of instances form an observation scan chain in a circuit design.
14. The one or more computer-readable media recited in claim 13 , wherein the plurality of instances operate in a shift-observation mode during scan shifting and in a capture-accumulation mode during scan capturing.