IP Library › Granted Patent US 11,169,437
Granted Patent B2
US 11,169,437 · App. 16/849,258 · Granted Nov 9, 2021

Optical proximity correction (OPC) methods and methods of manufacturing masks using the OPC methods

Inventors: Sangchul Yeo (Osan-si, KR); Narak Choi (Yongin-si, KR)
G03F1/36
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Quick Facts
Patent No.
US 11,169,437
App. No.
16/849,258
Granted
Nov 9, 2021
Kind
B2
Abstract

An optical proximity correction method includes extracting edges of a layout of a pattern on a mask, including at least one edge of the layout that is a curvilinear edge, and generating an optical image of the pattern by applying an edge filter, which includes an any-angle filter corresponding to an angle of the curvilinear edge, to the extracted edges of the layout. The any-angle filter may be generated using source sector rotation to correspond to the angle of the curvilinear edge.

Claims (43)

1. An optical proximity correction (OPC) method, comprising:

extracting edges of a layout of a pattern on a mask, including at least one edge of the layout that is a curvilinear edge; and

generating an optical image of the pattern by applying an edge filter, which includes an any-angle filter corresponding to an angle of the curvilinear edge, to the extracted edges of the layout.

2. The OPC method of claim 1 , wherein the any-angle filter is generated using source sector rotation to correspond to the angle of the curvilinear edge.

3. The OPC method of claim 1 , wherein the edge filter comprises a vertical filter and a horizontal filter, which are applied to an orthogonal edge; and wherein the any-angle filter is expressed by applying a weight to the vertical filter and the horizontal filter, according to the following relationship:

AA -filter= w*V -filter+(1− w )* H -filter,

where “AA-filter” designates the any-angle filter, “V-filter” designates the vertical filter, “H-filter” designates the horizontal filter, and “w” designates the weight.

4. The OPC method of claim 3 , wherein w is equivalent to sin 2 θ, where θ designates an average slope with respect to a horizontal line within a set range of the curvilinear edge.

5. The OPC method of claim 1 , wherein the any-angle filter has characteristics that vary as a function of a type of light source used during said generating an optical image.

6. The OPC method of claim 5 , wherein the any-angle filter is generated using source sector rotation in a reflective light source.

7. The OPC method of claim 5 , wherein the any-angle filter is generated using source sector rotation and polarization decomposition in a transmissive light source.

8. The OPC method of claim 7 , wherein polarization decomposition is a method of forming an X, Y, XY, TE, or TM polarization by combining an X polarization and a Y polarization according to positions of a source sector.

9. The OPC method of claim 8 , wherein a polarization of the any-angle filter is expressed as a linear sum of an X polarization and a Y polarization of a vertical filter and a horizontal filter by applying the polarization decomposition and a weight.

10. The OPC method of claim 9 , wherein the polarization of the any-angle filter is equivalent to:

Δ D x x ( r )= w×V x x ( r )+(1− w )×Δ H x x ( r )(2),

where Δ(r) is a signal value of an edge filter value of an edge viewed from a distance r, D x x is an x polarization of the any-angle filter, V x x is an x polarization of the vertical filter, H x x is an x polarization of the horizontal filter, and “w” designates a weight, which is equivalent to sin 2 θ, where θ is the angle of the curvilinear edge.

11. The OPC method of claim 1 , wherein the optical image is a near-field image comprising a first optical image generated using a thin mask approximation and a second optical image generated using the edge filter.

12. The OPC method of claim 1 , wherein said generating the optical image is followed by:

generating an OPC model based on the optical image; and

obtaining design data about the mask by performing a simulation using the OPC model.

13. An optical proximity correction (OPC) method, comprising:

designing a layout of a pattern on a mask;

extracting edges of the layout, including at least a curvilinear edge;

generating a first optical image of the pattern using a thin mask approximation;

generating a second optical image of the pattern by applying an edge filter to the edges of the layout, said edge filter comprising an any-angle filter, which corresponds to an angle of the curvilinear edge.

14. The OPC method of claim 13 , wherein the edge filter comprises a vertical filter and a horizontal filter, which are to be applied to an orthogonal edge; and wherein the any-angle filter is obtained by applying a weight to the vertical filter and the horizontal filter, which corresponds to the angle of the curvilinear edge.

15. The OPC method of claim 13 , wherein the any-angle filter is generated using source sector rotation in a reflective light source; and wherein the any-angle filter is generated using source sector generation and polarization decomposition in a transmissive light source.

16. The OPC method of claim 15 , wherein the polarization decomposition is a method of forming an X, Y, XY, TE, or TM polarization by combining an X polarization and a Y polarization according to positions of a source sector; and wherein a polarization of the any-angle filter is expressed as a linear sum of an X polarization and a Y polarization of a vertical filter and a horizontal filter by applying the polarization decomposition and a weight.

17. The OPC method of claim 13 , wherein generating of the final optical image is followed by:

generating an OPC model based on the final optical image; and

obtaining design data about the mask by performing a simulation using the OPC model.

18. A method of manufacturing a mask, the method comprising:

extracting edges of a layout of a pattern on a mask, including at least a curvilinear edge;

generating an optical image of the pattern by applying an edge filter, which includes an any-angle filter corresponding to an angle of the curvilinear edge, to the edges;

generating an optical proximity correction (OPC) model based on the optical image;

obtaining design data about the mask by performing a simulation using the OPC model;

transmitting the design data as mask tape-out (MTO) design data;

preparing mask data based on the MTO design data; and

performing an exposure process on a substrate for the mask, based on the mask data.

19. The method of claim 18 , wherein the edge filter comprises a vertical filter and a horizontal filter to be applied to an orthogonal edge; and wherein the any-angle filter is generated by applying a weight to the vertical filter and the horizontal filter, which corresponds to the angle of the curvilinear edge.

20. The method of claim 19 , wherein the any-angle filter is expressed by applying a weight to the vertical filter and the horizontal filter, according to the following relationship:

AA -filter= w*V -filter+(1− w )* H -filter,

where “AA-filter” designates the any-angle filter, “V-filter” designates the vertical filter, “H-filter” designates the horizontal filter, and “w” designates the weight; and wherein w is equivalent to sin 2 θ, where θ designates an angle of the curvilinear edge.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 15, 2020
From: YEO, SANGCHUL; CHOI, NARAK
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 052404/0847 →
Priority Claims (1)
KR 10-2019-0110788 · Sep 6, 2019 · national
Continuity (1)
Related Publication 20210072637A1 · Mar 11, 2021
Cited By (2)
US 12,638,765 US 12,681,378