IP Library › Granted Patent US 11,953,988
Granted Patent B2
US 11,953,988 · App. 16/858,281 · Granted Apr 9, 2024

Error correction memory device with fast data access

Inventors: Scott E Schaefer (Boise, ID); Aaron P. Boehm (Boise, ID)
Assignee: Micron Technology, Inc.
G06F11/1068G11C11/221G11C11/2273G11C11/2275H03M13/458G06F3/0659G06F11/1052G06F11/201G06F13/00G11C7/1006G11C11/4093G11C29/52H03M13/19H03M13/6561
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Quick Facts
Patent No.
US 11,953,988
App. No.
16/858,281
Granted
Apr 9, 2024
Kind
B2
Abstract

Methods, systems, and devices for a memory device with an error correction memory device with fast data access are described. For example, during a read operation, a memory device may be configured to output the data indicated by the read operation concurrent with performing an error correction operation. If the memory device detects an error, the memory device may indicate the error to a host device and, in some cases, output the corrected data to the host device. During a write operation, the memory device may store error detection or correction information associated with data to be stored at the memory device. The memory device may, in some cases, store error detection or correction information generated by the host device.

Claims (45)

1. A method, comprising:

receiving, at a memory device comprising a memory array, a read command from a host device external to the memory device;

reading first data and an error control code corresponding to the first data from the memory array to an error control circuit via a first data path and to a buffer via a second data path which bypasses the error control circuit based at least in part on the read command;

identifying, by the error control circuit, an error in the first data based at least in part on performing an error correction operation on the first data using the error control code;

outputting, by the buffer, the first data corresponding to the error control code and comprising the error to the host device concurrent with performing at least a portion of the error correction operation using the error control code; and

outputting an indicator of the error to the host device based at least in part on the error correction operation identifying the error in the first data.

2. The method of claim 1 , further comprising:

obtaining second data based at least in part on performing the error correction operation on the first data; and

outputting the second data at a determined time after outputting the first data based at least in part on the error in the first data.

3. The method of claim 1 , further comprising:

receiving, from the host device, a second read command indicating a reread of the memory array based at least in part on outputting the indicator of the error to the host device;

reading third data from the memory array based at least in part on the second read command;

performing a second error correction operation on the third data to obtain fourth data; and

outputting the fourth data to the host device.

4. The method of claim 1 , wherein the error correction operation corresponds to a single error correction (SEC) operation.

5. The method of claim 4 , further comprising:

obtaining second data based at least in part on performing the error correction operation on the first data, wherein the indicator of the error comprises an indication of a corrected single-bit error within the second data, an indication of an uncorrected error within the second data, an indication of an erroneously flipped bit within the second data, or a combination thereof.

6. The method of claim 1 , wherein the error correction operation corresponds to a single error correction double error detection (SECDED) operation.

7. The method of claim 1 , further comprising:

obtaining second data based at least in part on performing the error correction operation on the first data, wherein the indicator of the error comprises an indication of a corrected single-bit error within the second data, an indication of a double-bit error detected within the second data, an indication of an uncorrected error within the second data, or an indication of an erroneously flipped bit within the second data, or a combination thereof.

8. An apparatus, comprising:

an array of memory cells of a memory device that each comprise capacitive storage elements;

an interface configured to receive a read command from a host device external to the memory device;

a first circuit configured to read first data and an error control code corresponding to the first data from the array to a second circuit via a first data path and to a buffer via a second data path which bypasses the second circuit based at least in part on the read command; and

the second circuit coupled with the first circuit and configured to identify an error in the first data based at least in part on performing an error correction operation on the first data using the error control code,

wherein the interface is further configured to:

communicate, to the host device via the buffer, the first data corresponding to the error control code and comprising the error concurrent with the second circuit performing at least a portion of the error correction operation using the error control code; and

communicate, to the host device, an indicator of the error based at least in part on the error correction operation identifying the error in the first data.

9. The apparatus of claim 8 , wherein the second circuit is further configured to obtain second data based at least in part on performing the error correction operation, the apparatus further comprising:

a first buffer coupled with the first circuit and configured to receive the first data from the first circuit;

a second buffer coupled with the second circuit and configured to receive the second data from the second circuit; and

a multiplexer coupled with the first buffer, the second buffer, and the interface, the multiplexer configured to output the first data from the first buffer or the second data from the second buffer to the interface based at least in part on the error correction operation.

10. The apparatus of claim 8 , wherein the second circuit is further configured to obtain second data based at least in part on performing the error correction operation, the apparatus further comprising a buffer coupled with the interface and configured to:

receive data comprising the first data or the second data;

store the received data at the buffer; and

serially output subsets of the received data to the interface.

11. The apparatus of claim 10 , further comprising a register configured to indicate output of the first data or the second data, wherein the buffer is configured to receive the first data from the first circuit or the second data from the second circuit based at least in part on a value stored in the register.

12. The apparatus of claim 11 , further comprising:

a memory controller configured to change the value stored in the register based at least in part on the error in the first data.

13. The apparatus of claim 10 , further comprising:

a multiplexer that is configured to couple the buffer with the interface.

14. The apparatus of claim 8 , wherein the second circuit is configured to perform a single error correction (SEC) operation or a single error correction double error detection (SECDED) operation.

15. The apparatus of claim 8 , wherein:

the second circuit is further configured to obtain second data based at least in part on performing the error correction operation; and

the interface is configured to communicate the first data or the second data by a first channel and the indicator of the error by a second channel.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 8, 2020
From: SCHAEFER, SCOTT E.; BOEHM, AARON P.
To: MICRON TECHNOLOGY, INC
Reel/Frame 052608/0888 →
Continuity (2)
Provisional Application 62851800 · May 23, 2019
Related Publication 20200371873A1 · Nov 26, 2020
Cited By (2)
US 12,334,953 US 12,360,848