IP Library Granted Patent US 11,244,910
Granted Patent B2
US 11,244,910 · App. 16/862,002 · Granted Feb 8, 2022

Method for fabricating an electronic device comprising forming an infused adhesive and a periperal ring

Inventors: Karine Saxod (Les Marches, FR); Marika Sorrieul (Montaud, FR)
Assignee: STMicroelectronics (Grenoble 2) SAS
H01L23/562H01L21/56H01L23/315H01L23/3121H01L24/17H01L24/29H01L24/30H01L24/32H01L24/73H01L24/81H01L24/94H01L24/97H01L27/14618H01L27/14683H01L31/0203H01L31/02005H01L23/481H01L24/13H01L24/48H01L2224/1329H01L2224/13291H01L2224/14179H01L2224/2929H01L2224/29291H01L2224/30135H01L2224/32225H01L2224/48091H01L2224/48145H01L2224/48227H01L2224/73203H01L2224/73257H01L2224/81862H01L2224/81874H01L2924/00012H01L2924/00014H01L2924/15311H01L2924/16235H01L2924/16315H01L2924/181
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,244,910
App. No.
16/862,002
Granted
Feb 8, 2022
Kind
B2
Abstract

A method for fabricating an electronic device includes fixing a rear face of an integrated-circuit chip to a front face of a support wafer. An infused adhesive is applied in the form of drops or segments that are separated from each other. A protective wafer is applied to the infused adhesive, and the infused adhesive is cured. The infused adhesive includes a curable adhesive and solid spacer elements infused in the curable adhesive. A closed intermediate peripheral ring is deposited on the integrated-circuit chip outside the cured infused adhesive, and an encapsulation block is formed such that it surrounds the chip, the protective wafer and the closed intermediate peripheral ring.

Claims (18)

1. A method of collectively fabricating a plurality of electronic devices, comprising:

forming a plurality of stacks on a support wafer, wherein forming each stack of said plurality of stacks comprises:

fixing a rear face of an integrated-circuit chip on a front face of the support wafer;

depositing on a front face of the integrated-circuit chip an infused adhesive in a plurality of drops or segments separated from each other, the infused adhesive comprising a curable adhesive and solid spacer elements infused in the curable adhesive;

placing a protective wafer on the infused adhesive and thereby creating a free space between the front face of the integrated-circuit chip and the protective wafer;

curing the infused adhesive to fix the protective wafer to the integrated-circuit chip; and

depositing a closed intermediate peripheral ring on the integrated-circuit chip outside of the cured infused adhesive between the front face of the integrated-circuit chip and a rear face of the protective wafer;

applying an encapsulation block on the support wafer in areas between adjacent stacks of said plurality of stacks; and

performing a dicing operation to cut through the support wafer and the encapsulation block at locations between adjacent stacks to form a plurality of the electronic devices, wherein each electronic device includes at least one stack.

2. The method of claim 1 , wherein curing the infused adhesive comprises exposing the infused adhesive to heat to polymerize the infused adhesive.

3. The method of claim 2 , wherein curing the infused adhesive occurs with a release of gas.

4. The method of claim 1 , further comprising curing the closed intermediate peripheral ring.

5. The method of claim 4 , wherein curing the closed intermediate peripheral ring comprises exposing the closed intermediate peripheral ring to ultraviolet radiation.

6. The method of claim 5 , wherein curing of the closed intermediate peripheral ring occurs without releasing gas.

7. The method of claim 1 , wherein depositing the closed intermediate peripheral ring comprises curing a resin using ultraviolet radiation.

8. The method of claim 7 , wherein depositing the closed intermediate peripheral ring occurs without releasing gas.

9. The method of claim 1 , wherein applying the encapsulation block comprises supplying a coating material and curing the coating material.

10. The method of claim 1 , wherein performing the dicing operation comprises cutting through the support wafer and the encapsulation block to form an encapsulating ring around said at least one stack of the electronic device on a peripheral zone of the front face of the diced support wafer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 10, 2023
From: STMICROELECTRONICS (GRENOBLE 2) SAS
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 063282/0095 →
Priority Claims (1)
FR 1461471 · Nov 26, 2014 · national
Continuity (4)
Division 16208038 · Dec 3, 2018
Division 15410230 · Jan 19, 2017
Division 14821902 · Aug 10, 2015
Related Publication 20200258850A1 · Aug 13, 2020