FOURIER PTYCHOGRAPHIC IMAGING SYSTEMS, DEVICES, AND METHODS
Systems, devices, and methods of Fourier ptychographic imaging configured for illuminating a specimen being imaged from a plurality of incidence angles, for acquiring variably-illuminated, low-resolution intensity images of the specimen, and for reconstructing a high-resolution image of the specimen by iteratively determining the high resolution image that is self-consistent with the variably-illuminated, low-resolution intensity images, for example, by updating overlapping regions of variably-illuminated, low-resolution intensity images in Fourier space.
1 . Fourier ptychographic imaging device, comprising:
a variable illuminator for providing illumination to a specimen from a plurality of incidence angles;
an optical element for filtering illumination issuing from the specimen;
a detector for acquiring a plurality of variably-illuminated, low-resolution intensity images of the specimen based on light filtered by the optical element; and
a processor for computationally reconstructing a high-resolution image of the specimen by iteratively updating overlapping regions in Fourier space with the variably illuminated, low-resolution intensity images.
2 . The Fourier ptychographic imaging device of claim 1 , wherein the optical element is a low numerical aperture objective lens.
3 . The Fourier ptychographic imaging device of claim 2 , wherein the low numerical aperture objective lens has a numerical aperture between about 0.02 and 0.13.
4 . The Fourier ptychographic imaging device of claim 2 , wherein the low numerical aperture objective lens has a numerical aperture of about 0.08.
5 . The Fourier ptychographic imaging device of claim 2 , wherein a difference between the two most adjacent incidence angles in the plurality of incidence angles is between 10% and 90% of an acceptance angle corresponding to a numerical aperture of the low aperture objective lens.
6 . The Fourier ptychographic imaging device of claim 2 , wherein a difference between the two most adjacent incidence angles in the plurality of incidence angles is between 33% and 66% an acceptance angle corresponding to a numerical aperture of the low aperture objective lens.
7 . The Fourier ptychographic imaging device of claim 2 , wherein a difference between the two most adjacent incidence angles in the plurality of incidence angles is less than 76% of an acceptance angle corresponding to the numerical aperture of the low aperture objective lens.
8 . The Fourier ptychographic imaging device of claim 1 , wherein the variable illuminator comprises a two-dimensional matrix of light elements, each light element providing illumination from one of the plurality of incidence angles.
9 . The Fourier ptychographic imaging device of claim 8 , wherein each light element is a set of one or more light-emitting diodes.
10 . The Fourier ptychographic imaging device of claim 8 ,
wherein each light element comprises three quasi-monochromatic light sources, and;
wherein the processor computationally reconstructs high-resolution images corresponding to the three quasi-monochromatic light sources, and combines the high-resolution images to generate a color high-resolution image.
11 . The Fourier ptychographic imaging device of claim 1 , wherein the variable illuminator comprises a hexagonal array of light elements, each light element providing illumination from one of the plurality of incidence angles.
12 . The Fourier ptychographic imaging device of claim 11 , wherein each light element is a set of one ore more light-emitting diodes.
13 . The Fourier ptychographic imaging device of claim 1 , wherein the overlapping regions overlap by between 20% and 90% in area.
14 . The Fourier ptychographic imaging device of claim 1 , wherein the overlapping regions overlap by between 2% and 99.5% in area.
15 . The Fourier ptychographic imaging device of claim 1 , wherein the overlapping regions overlap by about 66% in area.
16 . The Fourier ptychographic imaging device of claim 1 , wherein the processor also automatically refocuses to an in-focus plane of the specimen.
17 . The Fourier ptychographic imaging device of claim 1 , wherein the processor is part of the detector.
18 . The Fourier ptychographic imaging device of claim 1 , further comprising a display for displaying the high-resolution image.
19 . A method of Fourier ptychographic imaging, comprising:
illuminating a specimen from a plurality of incidence angles using a variable illuminator;
filtering light issuing from the specimen using an optical element;
capturing a plurality of variably-illuminated, low-resolution intensity images of the specimen using a detector; and
computationally reconstructing a high-resolution image of the specimen by iteratively updating overlapping regions variably-illuminated, low-resolution intensity images in Fourier space.
20 . The method of Fourier ptychographic imaging of claim 19 , wherein each overlapping region corresponds to an approximate optical transfer function of the optical element.
21 - 33 . (canceled)