IP Library Granted Patent US 10,910,434
Granted Patent B2
US 10,910,434 · App. 16/870,099 · Granted Feb 2, 2021

Magnetoresistive stack with seed region and method of manufacturing the same

Inventors: Jijun Sun (Chandler, AZ); Sanjeev Aggarwal (Scottsdale, AZ); Han-Jong Chia (Hsinchu, TW); Jon M. Slaughter (Slingerlands, NY); Renu Whig (Chandler, AZ)
Assignee: Everspin Technologies, Inc.
H01L27/222G11B5/3909G11C11/1673H01L43/02H01L43/08H01L43/10H01L43/12
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Quick Facts
Patent No.
US 10,910,434
App. No.
16/870,099
Granted
Feb 2, 2021
Kind
B2
Abstract

A magnetoresistive stack/structure and method of manufacturing same comprising wherein the stack/structure includes a seed region, a fixed magnetic region disposed on and in contact with the seed region, a dielectric layer(s) disposed on the fixed magnetic region and a free magnetic region disposed on the dielectric layer(s). In one embodiment, the seed region comprises an alloy including nickel and chromium having (i) a thickness greater than or equal to 40 Angstroms (+/−10%) and less than or equal to 60 Angstroms (+/−10%), and (ii) a material composition or content of chromium within a range of 25-60 atomic percent (+/−10%) or 30-50 atomic percent (+/−10%).

Claims (54)

1. A magnetoresistive stack comprising:

an electrically conductive material;

a seed region disposed above the electrically conductive material, wherein the seed region includes:

at least one alloy layer, wherein the at least one alloy layer includes nickel and chromium, and has a combined nickel content and chromium content of at least 99 atomic percent; and

at least one auxiliary layer;

a fixed magnetic region disposed above the seed region, wherein the fixed magnetic region includes a synthetic antiferromagnetic structure comprising:

a first ferromagnetic region disposed above the seed region;

a coupling layer disposed on and in contact with the first ferromagnetic region; and

a second ferromagnetic region disposed on and in contact with the coupling layer;

one or more dielectric layers disposed above the second ferromagnetic region;

a high-iron interface region disposed between the fixed magnetic region and one or more dielectric layers; and

a free magnetic region disposed above the one or more dielectric layers.

2. The magnetoresistive stack of claim 1 , wherein the fixed magnetic region is disposed on and in contact with the seed region.

3. The magnetoresistive stack of claim 1 , wherein the at least one auxiliary layer comprises iron, cobalt, palladium, platinum, nickel, tantalum, ruthenium, tungsten, molybdenum, an alloy including: iron and boron, an alloy including: cobalt, iron, and boron, or combinations thereof.

4. The magnetoresistive stack of claim 1 , wherein the seed region has a thickness greater than or equal to approximately 30 Å.

5. The magnetoresistive stack of claim 1 , further comprising a dusting layer having a thickness of approximately 1 Å to approximately 12 Å.

6. The magnetoresistive stack of claim 1 , wherein the at least one alloy layer is a first alloy layer, and the seed region further includes a second alloy layer; and

wherein the at least one auxiliary layer is in contact with the first alloy layer and the second alloy layer.

7. The magnetoresistive stack of claim 6 , wherein the second alloy layer has a combined nickel content and chromium content of at least 99 atomic percent.

8. A magnetoresistive stack comprising:

an electrically conductive material;

a seed region disposed above the electrically conductive material, wherein the seed region includes:

a first alloy layer, wherein the first alloy layer includes nickel and chromium;

at least one auxiliary layer; and

a second alloy layer, wherein the at least one auxiliary layer is in contact with the first alloy layer and the second alloy layer;

a dusting layer disposed on the seed region, wherein the dusting layer has a thickness of approximately 1 Å to approximately 12 Å;

a fixed magnetic region disposed above the dusting layer, wherein the fixed magnetic region includes a synthetic antiferromagnetic structure comprising:

a first ferromagnetic region disposed above the dusting layer;

a coupling layer disposed on and in contact with the first ferromagnetic region; and

a second ferromagnetic region disposed on and in contact with the coupling layer;

one or more dielectric layers disposed above the second ferromagnetic region; and

a free magnetic region disposed above the one or more dielectric layers.

9. The magnetoresistive stack of claim 8 , wherein the dusting layer comprises molybdenum, magnesium, iron, platinum, ruthenium, an alloy including cobalt and iron, or a combination thereof.

10. The magnetoresistive stack of claim 8 , wherein the at least one alloy layer has a thickness of approximately 10 Å to approximately 25 Å.

11. The magnetoresistive stack of claim 8 , wherein the at least one auxiliary layer comprises iron, cobalt, palladium, platinum, nickel, tantalum, ruthenium, tungsten, molybdenum, an alloy including: iron and boron, an alloy including: cobalt, iron, and boron, or combinations thereof.

12. The magnetoresistive stack of claim 8 , wherein the at least one alloy layer has a combined nickel and chromium content of at least 99 atomic percent.

13. The magnetoresistive stack of claim 8 , further comprising a high-iron interface region disposed between the fixed magnetic region and the one or more dielectric layers.

14. The magnetoresistive stack of claim 8 , wherein the second alloy layer has a combined nickel content and chromium content of at least 99 atomic percent.

15. A magnetoresistive stack comprising:

an electrically conductive material;

a seed region disposed above the electrically conductive material, wherein the seed region includes:

a plurality of alloy layers, wherein at least one alloy layer includes nickel and chromium, and has a combined nickel content and chromium content of at least 99 atomic percent; and

at least one auxiliary layer, wherein the at least one auxiliary layer comprises iron, cobalt, palladium, platinum, nickel, tantalum, ruthenium, tungsten, molybdenum, an alloy including: iron and boron, an alloy including: cobalt, iron, and boron, or combinations thereof;

a fixed magnetic region disposed above the seed region, wherein the fixed magnetic region includes a synthetic antiferromagnetic structure comprising:

a first ferromagnetic region disposed above the seed region;

a coupling layer disposed on and in contact with the first ferromagnetic region; and

a second ferromagnetic region disposed on and in contact with the coupling layer;

one or more dielectric layers disposed above the second ferromagnetic region; and

a free magnetic region disposed above the one or more dielectric layers.

16. The magnetoresistive stack of claim 15 , further comprising a dusting layer having a thickness of approximately 1 Å to approximately 12 Å.

17. The magnetoresistive stack of claim 16 , wherein the dusting layer comprises molybdenum, magnesium, iron, platinum, ruthenium, an alloy including cobalt and iron, or a combination thereof.

18. The magnetoresistive stack of claim 16 , wherein the dusting layer is disposed between the seed region and the fixed magnetic region.

19. The magnetoresistive stack of claim 15 , wherein the fixed magnetic region is disposed on and in contact with the seed region.

20. The magnetoresistive stack of claim 15 , further comprising a high-iron interface region disposed between the fixed magnetic region and the one or more dielectric layers.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 12, 2020
From: SUN, JIJUN; AGGARWAL, SANJEEV; CHIA, HAN-JONG; SLAUGHTER, JON M.; WHIG, RENU
To: EVERSPIN TECHNOLOGIES, INC.
Reel/Frame 052632/0765 →
Continuity (6)
Continuation 16601848 · Oct 15, 2019
Continuation 16195178 · Nov 19, 2018
Continuation In Part 15373880 · Dec 9, 2016
Provisional Application 62712578 · Jul 31, 2018
Provisional Application 62265650 · Dec 10, 2015
Related Publication 20200266235A1 · Aug 20, 2020