IP Library Granted Patent US 11,280,669
Granted Patent B2
US 11,280,669 · App. 16/876,728 · Granted Mar 22, 2022

Pulsed laser interferometer and measuring vibrational amplitude and vibrational phase

Inventors: Jason John Gorman (Silver Spring, MD); Lei Shao (Clarksburg, MD)
Assignee: GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE
G01H9/008
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Quick Facts
Patent No.
US 11,280,669
App. No.
16/876,728
Granted
Mar 22, 2022
Kind
B2
Abstract

A pulsed laser interferometer includes: a pulsed laser; a vibration controller that produces a vibration control signal that controls a vibrational frequency and vibrational amplitude of a structural member; an interferometer controller; a pathlength control stage that changes an optical pathlength for laser pulses; a pathlength reflector that moves in concert with the pathlength control stage to change the optical pathlength of propagation for the laser pulses; a light pulse detector that produces a light pulse detector signal; an interference light detector that produces an interference frequency signal; a signal mixer that produces a reference frequency signal; and a phase-sensitive detector that produces a vibrational amplitude signal and a vibrational phase signal from the interference frequency signal referenced to the reference frequency signal.

Claims (61)

1. A pulsed laser interferometer for measuring vibrational amplitude and vibrational phase of a structural member, the pulsed laser interferometer comprising:

a pulsed laser in optical communication with the structural member and that:

produces laser pulses, each laser pulses comprises a radiofrequency comb; and

subjects the structural member to the radiofrequency comb in the laser pulses;

a vibration controller in electrical communication with the structural member and that produces a vibration control signal that controls a vibrational frequency and vibrational amplitude of the structural member;

an interferometer controller that receives an interference frequency signal and produces an interferometer control signal based on the interference frequency signal;

a pathlength control stage in electrical communication with the interferometer controller and that receives the interferometer control signal from the interferometer controller and moves in a motion as controlled by the interferometer control signal to change an optical pathlength of propagation for the laser pulses in the pulsed laser interferometer;

a pathlength reflector disposed on the pathlength control stage and in optical communication with the pulsed laser and that:

receives the laser pulses from the laser; and

moves in concert with the pathlength control stage to change the optical pathlength of propagation for the laser pulses;

a light pulse detector in optical communication with the pulsed laser and that:

receives the laser pulses from the pulsed laser; and

produces a light pulse detector signal from the laser pulses;

an interference light detector in optical communication with the pathlength reflector and the structural member and that:

receives the laser pulses reflected from the structural member;

receives the laser pulses reflected from the pathlength reflector;

and produces an interference frequency signal from a beat frequency produced from interferences between the laser pulses reflected from the structural member and the laser pulses reflected from the pathlength reflector;

a signal mixer in electrical communication with the vibration controller and the light pulse detector and that:

receives the light pulse detector signal from the light pulse detector;

receives the vibration control signal from the vibration controller; and

produces a reference frequency signal from a combination of the vibration control signal and the light pulse detector signal; and

a phase-sensitive detector in electrical communication with the signal mixer and the light pulse detector and that:

receives the reference frequency signal from the signal mixer;

receives the interference frequency signal from the interference light detector;

references the interference frequency signal from the reference frequency signal; and

produces a vibrational amplitude signal and a vibrational phase signal from the interference frequency signal referenced to the reference frequency signal.

2. The pulsed laser interferometer of claim 1 , further comprising a scanning stage that receives disposal of the structural member, wherein the scanning stage scans a portion of the structural member that is subjected to the laser pulses.

3. The pulsed laser interferometer of claim 1 , further comprising a microscope in optical communication with the structural member for monitoring the structural member.

4. The pulsed laser interferometer of claim 1 , wherein a wavelength of the laser pulses is from 400 nm to 1700 nm.

5. The pulsed laser interferometer of claim 1 , wherein a frequency of teeth in the radiofrequency comb is from 1 MHz to 100 GHz.

6. The pulsed laser interferometer of claim 1 , wherein the vibrational frequency of the structural member is from 1 MHz to 50 GHz.

7. The pulsed laser interferometer of claim 1 , wherein a frequency of the interference frequency signal is from 1 kHz to 50 MHz.

8. A process for measuring vibrational amplitude and vibrational phase of a structural member with the pulsed laser interferometer of claim 1 , the process comprising:

producing, by the pulsed laser, the laser pulses;

subjecting the structural member to the radiofrequency comb in the laser pulses;

producing, by the vibration controller, the vibration control signal;

controlling, by the vibration control signal, the vibrational frequency and the vibrational amplitude of the structural member;

receiving, by the interferometer controller, the interference frequency signal;

producing, by the interferometer controller, the interferometer control signal based on the interference frequency signal;

receiving, by the pathlength control stage, the interferometer control signal from the interferometer controller;

moving the pathlength control stage in the motion controlled by the interferometer control signal;

changing, by the pathlength control stage, the optical pathlength of propagation for the laser pulses in the pulsed laser interferometer;

receiving, by the pathlength reflector, the laser pulses from the pulsed laser,

moving the pathlength reflector in concert with the pathlength control stage to change the optical pathlength of propagation for the laser pulses;

receiving, by the light pulse detector, the laser pulses from the pulsed laser;

producing, by the light pulse detector, the light pulse detector signal from the laser pulses;

receiving, by the interference light detector, the laser pulses reflected from the structural member and the laser pulses reflected from the pathlength reflector;

producing, by the interference light detector, the interference frequency signal from the beat frequency produced from interference between the laser pulses reflected from the structural member and the laser pulses reflected from the pathlength reflector,

receiving, by the signal mixer, the light pulse detector signal from the light pulse detector;

receiving, by the signal mixer, the vibration control signal from the vibration controller;

producing, by the signal mixer, the reference frequency signal from the combination of the vibration control signal and the light pulse detector signal;

receiving, by the phase-sensitive detector, the reference frequency signal from the signal mixer;

receiving, by the phase-sensitive detector, the interference frequency signal from the interference light detector;

referencing, by the phase-sensitive detector, the interference frequency signal from the reference frequency signal; and

producing, by the phase-sensitive detector, the vibrational amplitude signal and the vibrational phase signal from the interference frequency signal referenced to the reference frequency signal.

9. The process of claim 8 , further comprising changing a portion of the structural member that is subjected to the laser pulses by moving the structural member with the scanning stage.

10. The pulsed laser interferometer of claim 8 , further comprising monitoring the structural member with a microscope.

11. The pulsed laser interferometer of claim 8 , wherein a wavelength of the laser pulses is from 400 nm to 1700 nm.

12. The pulsed laser interferometer of claim 8 , wherein a frequency of teeth in the radiofrequency comb is from 1 MHz to 100 GHz.

13. The pulsed laser interferometer of claim 8 , wherein the vibrational frequency of the structural member is from 1 MHz to 50 GHz.

14. The pulsed laser interferometer of claim 8 , wherein a frequency of the interference frequency signal is 1 kHz to 50 MHz.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 21, 2020
From: GORMAN, JASON JOHN
To: GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE
Reel/Frame 053260/0615 →
Continuity (2)
Provisional Application 62858060 · Jun 6, 2019
Related Publication 20200386611A1 · Dec 10, 2020
Cited By (1)
US 12,298,238