IP Library › Granted Patent US 11,359,306
Granted Patent B2
US 11,359,306 · App. 16/881,491 · Granted Jun 14, 2022

Method for preparing a SiC ingot and device for preparing a SiC ingot wherein electrical resistance of crucible body is 2.9 ohms or more

Inventors: Jong Hwi Park (Suwon-si, KR); Myung-Ok Kyun (Suwon-si, KR); Jongmin Shim (Hwaseong-si, KR); Eun Su Yang (Suwon-si, KR); Byung Kyu Jang (Suwon-si, KR); Jung Woo Choi (Suwon-si, KR); Sang Ki Ko (Suwon-si, KR); Kap-Ryeol Ku (Suwon-si, KR); Jung-Gyu Kim (Suwon-si, KR)
Assignee: SENIC INC.
C30B23/025C23C14/0635C23C14/243C23C14/50C23C14/588C30B29/36C30B35/002
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Quick Facts
Patent No.
US 11,359,306
App. No.
16/881,491
Granted
Jun 14, 2022
Kind
B2
Abstract

A method for preparing a SiC ingot includes preparing a crucible assembly comprising a crucible body having an internal space, loading a raw material into the internal space of the crucible body and placing a plurality of SiC seed in the internal space of the crucible body at regular intervals spaced apart from the raw material, and growing the SiC ingot from the plurality of SiC seed by adjusting the internal space of the crucible body to a crystal growth atmosphere such that the raw material is vapor-transported and deposited to the plurality of SiC seed. A density of the crucible body may be 1.70 to 1.92 g/cm 3 .

Claims (15)

1. A method for preparing a SiC wafer, comprising:

preparing a crucible assembly comprising a crucible body having an internal space;

loading a raw material into the internal space of the crucible body and placing a plurality of SiC seeds in the internal space of the crucible body at regular intervals spaced apart from the raw material;

growing a SiC ingot from the plurality of SiC seeds by adjusting the internal space of the crucible body to a crystal growth atmosphere such that the raw material is vapor-transported and deposited to the plurality of SiC seeds; and

forming the SiC wafer from the SiC ingot;

wherein a density of the crucible body is 1.70 to 1.92 g/cm 2 ,

wherein the crystal growth atmosphere is created by a heating caused by an electrical resistance of the crucible body when an electricity is applied to the crucible body, and

wherein the electrical resistance of the crucible body is 2.9 to 4.1Ω,

wherein a height deviation of the SiC ingot between a center and an edge of the SiC ingot is 0 to 10 mm,

wherein the crucible body includes a graphite,

wherein the forming the SiC wafer comprises slicing the SiC ingot to prepare a sliced crystal having an off angle of 0 to 15 degrees relative to a (0001) plane; and

grinding the sliced crystal to form the SiC wafer, and

wherein the SiC wafer having an off angle of 0 degrees with respect to the (0001) plane from the SiC ingot has a locking angle of −1.0 degrees to +1.0 degrees relative to a reference angle.

2. The method of claim 1 , wherein a diameter of the SiC wafer is 4 inches or more.

3. The method of claim 1 , further comprising polishing the ground sliced crystal.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 20, 2025
From: SENIC INC.
To: EIN CRYSTAL CO., LTD.
Reel/Frame 072990/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE OF CHANGE OF ADDRESS FOR ASSIGNEE PREVIOUSLY RECORDED AT REEL: 058645 FRAME: 0149. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF ADDRESS.. Recorded Apr 10, 2022
From: SENIC INC.
To: SENIC INC.
Reel/Frame 059852/0027 →
CHANGE OF ADDRESS Recorded Jan 5, 2022
From: SENIC INC.
To: SENIC INC.
Reel/Frame 058645/0149 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 13, 2021
From: SKC CO., LTD.
To: SENIC INC.
Reel/Frame 057788/0414 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 22, 2020
From: PARK, JONG HWI; KYUN, MYUNG-OK; SHIM, JONGMIN; YANG, EUN SU; JANG, BYUNG KYU; CHOI, JUNG WOO; KO, SANG KI; KU, KAP-RYEOL; KIM, JUNG-GYU
To: SKC CO., LTD.
Reel/Frame 052734/0423 →
Priority Claims (1)
KR 10-2019-0135382 · Oct 29, 2019 · national
Continuity (1)
Related Publication 20210123157A1 · Apr 29, 2021