IP Library Granted Patent US 11,422,041
Granted Patent B2
US 11,422,041 · App. 16/888,168 · Granted Aug 23, 2022

Thermal analysis apparatus

Inventors: Susumu Ito (Tokyo, JP); Eita Shimoda (Tokyo, JP)
Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
G01K11/12G01N25/00
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Quick Facts
Patent No.
US 11,422,041
App. No.
16/888,168
Granted
Aug 23, 2022
Kind
B2
Abstract

The thermal analysis apparatus configured to measure thermal behavior accompanying a temperature change of a sample in a heating furnace, includes: the heating furnace having an opening, through which the sample is observable; a thermal behavior measurement unit for measuring the thermal behavior; an imaging unit for capturing image data of the sample in the heating furnace through the opening; a storage unit for storing the thermal behavior and the image data with respect to a temperature; a control unit; and an image processing unit for generating predetermined color information based on the image data, the control unit being configured to instruct the image processing unit to generate the predetermined color information with respect to a plurality of temperatures, and cause a predetermined display unit to display a plurality of pieces of the predetermined color information and the thermal behavior in superimposition with respect to the plurality of temperatures.

Claims (14)

1. A thermal analysis apparatus, which is configured to measure thermal behavior accompanying a time series change in a temperature of a sample in a heating furnace during a thermal analysis, the thermal analysis apparatus comprising:

the heating furnace having an opening, through which the sample is observable;

thermal behavior measurement means for measuring the thermal behavior;

imaging means for capturing image data of the sample in the heating furnace through the opening;

storage means for storing the thermal behavior and the image data with respect to a temperature;

control means; and

image processing means for generating predetermined color information based on the image data,

the control means being configured to instruct the image processing means to generate the predetermined color information with respect to a plurality of temperatures, and cause predetermined display means to display a plurality of pieces of the predetermined color information and the thermal behavior in superimposition with respect to the plurality of temperatures such that a change in the predetermined color information and a change in the thermal behavior according to the time series change in the temperature of the sample during the thermal analysis are displayed in superimposition.

2. The thermal analysis apparatus according to claim 1 , further comprising input means,

wherein, when a user specifies, through the input means, a piece of the predetermined color information to be displayed on the predetermined display means, the control means causes the predetermined display means to display the specified piece of the predetermined color information.

3. The thermal analysis apparatus according to claim 2 , wherein, when the user specifies, through the input means, one of color information to be kept on display and color information to be removed from display from among the predetermined color information displayed on the predetermined display means, the control means causes the predetermined display means to stop displaying the color information to be removed from display.

4. The thermal analysis apparatus according to claim 3 , wherein the predetermined color information is at least one selected from the group consisting of RGB values, a CIE Lab color system, and CMYK values.

5. The thermal analysis apparatus according to claim 2 , wherein the predetermined color information is at least one selected from the group consisting of RGB values, a CIE Lab color system, and CMYK values.

6. The thermal analysis apparatus according to claim 1 , wherein the predetermined color information is at least one selected from the group consisting of RGB values, a CIE Lab color system, and CMYK values.

Assignments (3)
CHANGE OF ADDRESS Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0593 →
CHANGE OF NAME Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072913/0104 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 12, 2022
From: ITO, SUSUMU; SHIMODA, EITA
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 060479/0522 →
Priority Claims (2)
JP JP2019-113577 · Jun 19, 2019 · national
JP JP2020-052663 · Mar 24, 2020 · national
Continuity (1)
Related Publication 20200400510A1 · Dec 24, 2020