Maximization of side-channel sensitivity for trojan detection

1. A method comprising:

generating a plurality of initial test patterns that can trigger a rare condition of a Trojan circuit in an integrated circuit;

generating one succeeding test pattern for each of the plurality of initial test patterns that can increase side-channel sensitivity during changing from the initial test pattern to the succeeding test pattern;

applying a test pattern comprising the initial test pattern followed by a corresponding succeeding test pattern to a golden design of the integrated circuit;

measuring a side-channel parameter in the golden design of the integrated circuit after application of the test pattern;

applying the test pattern to a design of the integrated circuit under test;

measuring the side-channel parameter in the design of the integrated circuit under test after application of the test pattern; and

determining the Trojan circuit to be present in the integrated circuit under test when the measured side-channel parameters vary by a threshold.

2. The method of claim 1 , wherein the initial test patterns comprises N-detect test patterns.

3. The method of claim 2 , wherein the succeeding test patterns are generated using a genetic algorithm.

4. The method of claim 1 , wherein application of the test pattern maximizes switching in a first portion of the integrated circuit containing the Trojan circuit while minimizing switching in a remainder of the integrated circuit in order to improve the side-channel sensitivity.

5. The method of claim 1 , wherein the side-channel parameter comprises a dynamic current.

6. The method of claim 1 , wherein the side-channel parameter comprises power consumption.

7. The method of claim 1 , wherein the side-channel parameter comprises path delay.

8. A system for detecting a Trojan circuit in an integrated circuit comprising:

one or more computing processors; and

one or more memory storage elements;

wherein the one or more computing processors are configured to:

generate a plurality of initial test patterns that can trigger a rare condition of the Trojan circuit in the integrated circuit;

generate one succeeding test pattern for each of the plurality of initial test patterns that can maximize side-channel sensitivity during changing from the initial test pattern to the succeeding test pattern;

apply a test pattern comprising the initial test pattern followed by a corresponding succeeding test pattern to a golden design of the integrated circuit;

measure a side-channel parameter in the golden design of the integrated circuit after application of the test pattern;

apply the test pattern to a design of the integrated circuit under test;

obtain a measurement of the side-channel parameter in the design of the integrated circuit under test after application of the test pattern; and

determine the Trojan circuit to be present in the integrated circuit under test when the measured side-channel parameters vary by a threshold.

9. The system of claim 8 , wherein the initial test patterns comprises N-detect test patterns.

10. The system of claim 9 , wherein the succeeding test patterns are generated using a genetic algorithm.

11. The system of claim 8 , wherein application of the test pattern maximizes switching in a first portion of the integrated circuit containing the Trojan circuit while minimizing switching in a remainder of the integrated circuit in order to improve the side-channel sensitivity.

12. The system of claim 8 , wherein the side-channel parameter comprises a dynamic current.

13. The system of claim 8 , wherein the side-channel parameter comprises power consumption.

14. The system of claim 8 , wherein the side-channel parameter comprises path delay.

15. A computer-readable medium having instructions stored thereon that, in response to execution by a computer-based system, cause the computer-based system to perform operations comprising:

generating a plurality of initial test patterns that can trigger a rare condition of a Trojan circuit in an integrated circuit;

generating one succeeding test pattern for each of the plurality of initial test patterns that can increase side-channel sensitivity during changing from the initial test pattern to the succeeding test pattern;

applying a test pattern comprising the initial test pattern followed by a corresponding succeeding test pattern to a golden design of the integrated circuit;

measuring a side-channel parameter in the golden design of the integrated circuit after application of the test pattern;

applying the test pattern to a design of the integrated circuit under test;

measuring the side-channel parameter in the design of the integrated circuit under test after application of the test pattern; and

determining the Trojan circuit to be present in the integrated circuit under test when the measured side-channel parameters vary by a threshold.

16. The computer-readable medium of claim 15 , wherein the initial test patterns comprises N-detect test patterns.

17. The computer-readable medium of claim 16 , wherein the succeeding test patterns are generated using a genetic algorithm.

18. The computer-readable medium of claim 15 , wherein application of the test pattern maximizes switching in a first portion of the integrated circuit containing the Trojan circuit while minimizing switching in a remainder of the integrated circuit in order to improve the side-channel sensitivity.

19. The computer-readable medium of claim 15 , wherein the side-channel parameter comprises a dynamic current.

20. The computer-readable medium of claim 15 , wherein the side-channel parameter comprises power consumption or path delay.