IP Library › Granted Patent US 10,978,158
Granted Patent B1
US 10,978,158 · App. 16/905,838 · Granted Apr 13, 2021

Control method and controller of program suspending and resuming for memory

Inventors: Zhi Chao Du (Wuhan, CN); Yu Wang (Wuhan, CN); Haibo Li (Wuhan, CN); Ke Jiang (Wuhan, CN); Ye Tian (Wuhan, CN)
Assignee: Yangtze Memory Technologies Co., Ltd.
G11C16/10G11C7/12G11C7/227G11C16/3459G11C2207/002G11C2216/20
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Quick Facts
Patent No.
US 10,978,158
App. No.
16/905,838
Granted
Apr 13, 2021
Kind
B1
Abstract

A control method, for a memory array, the control method comprises programming the bit-cell of the memory array in a programming stage; and discharging the bit-cell of the memory array in a discharge stage; wherein the programming stage comprises: programming the bit-cell of the memory array with a plurality of programming voltage pulses; wherein the discharge stage comprises: isolating a select line of the bit-cell of the memory array; and generating a programming voltage pulse to the bit-cell of the memory array; wherein the programming stage can be suspended to a suspend stage by a suspend command after the discharge stage; wherein the suspend command is received during one of the plurality of programming voltage pulse.

Claims (53)

1. A control method, for a memory array, comprising:

programming the bit-cell of the memory array in a programming stage; and

discharging the bit-cell of the memory array in a discharge stage;

wherein the programming stage comprises:

programming the bit-cell of the memory array with a plurality of programming voltage pulses;

wherein the discharge stage comprises:

isolating a select line of the bit-cell of the memory array; and

generating a programming voltage pulse to the bit-cell of the memory array;

wherein the programming stage is suspended to a suspend stage by a suspend command after the discharge stage;

wherein the suspend command is received during one of the plurality of programming voltage pulse.

2. The control method of claim 1 , further comprising:

verification the bit-cell of the memory array in a verification stage;

wherein the verification stage comprises:

verifying whether the bit-cell of the memory array is programmed;

wherein when there is no suspend command, the verification stage follows the programming stage;

wherein when there is a suspend command, the verification stage follows the discharge stage.

3. The control method of claim 1 , further comprising:

enabling a bottom select gate line of an interface to discharge the bit-cell of the memory in the discharge stage.

4. The control method of claim 1 , wherein the discharge stage is overlapped with the programming stage in time.

5. The control method of claim 1 , further comprising:

generating a clean voltage pulse to discharge the bit-cell of the memory array in the discharge stage.

6. The control method of claim 1 , further comprising:

generating a dummy programming voltage pulse in the discharge stage.

7. The control method of claim 6 , further comprising:

executing the dummy programming voltage pulse by a dummy programming command.

8. The control method of claim 1 , wherein the discharge stage follows each of the plurality of programming voltage pulses.

9. The control method of claim 1 , further comprising:

keeping voltages and waveforms of a top select gate line and a bottom select gate line of an interface to be the same as those in the programming stage in the discharge stage.

10. A controller for programming a memory array, comprising:

a storage unit, configured to store a program code; and

a processing unit, configured to perform the following steps:

programming the bit-cell of the memory array in a programming stage; and

discharging the bit-cell of the memory array in a discharge stage;

wherein the programming stage comprises:

programming the bit-cell of the memory array with a plurality of programming voltage pulses;

wherein the discharge stage comprises:

isolating a select line of the bit-cell of the memory array; and

generating a programming voltage pulse to the bit-cell of the memory array;

wherein the programming stage is suspended to a suspend stage by a suspend command after the discharge stage.

11. The controller for programming a memory array of claim 10 , the programming stage further comprising:

verification the bit-cell of the memory array in a verification stage;

wherein the verification stage comprises:

verifying whether the bit-cell of the memory array is programmed;

wherein when there is no suspend command, the verification stage follows the programming stage;

wherein when there is a suspend command, the verification stage follows the discharge stage;

wherein the suspend command is received during one of the plurality of programming voltage pulse.

12. The controller for programming a memory array of claim 10 , wherein the controller further enables a bottom select gate line of an interface to discharge the bit-cell of the memory in the discharge stage.

13. The controller for programming a memory array of claim 10 , wherein the discharge stage is overlapped with the programming stage in time.

14. The controller for programming a memory array of claim 10 , wherein the controller further generates a clean voltage pulse to discharge the bit-cell of the memory array in the discharge stage.

15. The controller for programming a memory array of claim 10 , wherein the controller further generates a dummy programming voltage pulse in the discharge stage.

16. The controller for programming a memory array of claim 15 , wherein the controller further executes the dummy programming voltage pulse by a dummy programming command.

17. The controller for programming a memory array of claim 10 , wherein the discharge stage follows each of the plurality of programming voltage pulses.

18. The controller for programming a memory array of claim 10 , wherein the controller further keeps voltages and waveforms of a top select gate line and a bottom select gate line of an interface to be the same as those in the programming stage in the discharge stage by the controller.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 18, 2020
From: DU, ZHI CHAO; WANG, YU; LI, HAIBO; JIANG, KE; TIAN, YE
To: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
Reel/Frame 052983/0620 →
Continuity (1)
Continuation PCTCN2020091037 · May 19, 2020
Cited By (1)
US 12,283,321