IP Library Granted Patent US 11,462,686
Granted Patent B2
US 11,462,686 · App. 16/908,277 · Granted Oct 4, 2022

Three-dimensional array architecture for resistive change element arrays and methods for making same

Inventors: Harry Shengwen Luan (Saratoga, CA); Thomas Rueckes (Byfield, MA)
Assignee: Nantero, Inc.
H01L45/1608H01L27/2436H01L45/1683
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Quick Facts
Patent No.
US 11,462,686
App. No.
16/908,277
Granted
Oct 4, 2022
Kind
B2
Abstract

A method to fabricate a resistive change element array may include depositing a resistive change material over a substrate and forming a first insulating material over the resistive change material. The method may also include etching a trench in the resistive change material and the first insulating material and forming a cavity in a sidewall of the trench by recessing the resistive change material. The method may further include flowing a conductive material in the cavity and depositing a second insulating material in the trench.

Claims (26)

1. A method to fabricate a resistive change element array, said method comprising:

depositing a resistive change material over a substrate;

forming a first insulating material over said resistive change material;

depositing a second insulating material in a first trench in said resistive change material and said first insulating material;

etching a second trench in said resistive change material and said first insulating material;

forming a cavity in a sidewall of said second trench by recessing said resistive change material, said recessing said resistive change material resulting in said resistive change material being divided into first and second portions separated by said second insulating material; and

flowing a conductive material in said cavity that contacts said first and second portions of said resistive change material.

2. The method of claim 1 , further comprising:

forming an opening in said resistive change material and said first insulating material, said opening positioned such that said conductive material in said cavity and said first portion of said resistive change material are between said second trench and said opening; and

flowing a second conductive material in said opening, said second conductive material configured as an electrical contact for said first portion of said resistive change material and insulated from said second portion of said resistive change material.

3. The method of claim 2 , wherein said conductive material in said cavity is configured as an electrical contact for said first and second portions of said resistive change material.

4. The method of claim 2 , further comprising depositing a second resistive change material over said first insulating material, said second resistive change material being insulated from said conductive material by said first insulating material and said second conductive material configured as an electrical contact for said second resistive change material.

5. The method of claim 4 , further comprising:

forming a second cavity in said sidewall of said second trench by recessing said second resistive change material; and

flowing a third conductive material in said second cavity.

6. The method of claim 5 , wherein said forming said second cavity and said forming said cavity are performed by a single chemical etching step and said flowing said conductive material and said depositing said third conductive material are performed by a single deposition step such that said conductive material and said third conductive material are said same conductive material.

7. The method of claim 2 , further comprising:

forming a second opening in said resistive change material and said first insulating material, said second opening positioned such that said conductive material in said cavity and said second portion of said resistive change material are between said second trench and said second opening; and

flowing a third conductive material in said second opening, said third conductive material configured as an electrical contact for said second portion of said resistive change material and insulated from said first portion of said resistive change material.

8. The method of claim 7 , wherein said second conductive material and said third conductive material are said same conductive material and said flowing of said second conductive material and said third conductive material occurs during a single deposition of said same conductive material.

9. The method of claim 2 , wherein recessing said resistive change material results in said resistive change material occupying less than one-half of a space between said second insulating material and said second conductive material in a plane that includes said resistive change material, said conductive material, and said second conductive material.

10. The method of claim 2 , further comprising:

forming a second cavity in a sidewall of said opening by recessing said resistive change material by way of said opening;

flowing a third conductive material in said opening; and

after flowing said third conductive material, depositing a selector material in said opening, said selector material deposited before said second conductive material.

11. The method of claim 1 wherein said resistive change material is a nanotube fabric and said depositing said resistive change material is performed by a spin coating operation.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 15, 2022
From: LUAN, HARRY SHENGWEN; RUECKES, THOMAS
To: NANTERO, INC.
Reel/Frame 060808/0763 →
RELEASE OF SECURITY INTEREST Recorded Jul 14, 2021
From: SILICON VALLEY BANK
To: NANTERO, INC.
Reel/Frame 056854/0901 →
INTELLECTUAL PROPERTY SECURITY AGREEMENT Recorded Nov 11, 2020
From: NANTERO, INC.
To: SILICON VALLEY BANK
Reel/Frame 054383/0632 →
Continuity (1)
Related Publication 20210399219A1 · Dec 23, 2021