Semiconductor integrated circuit device

1. A semiconductor integrated circuit device including a standard cell that is a capacitance cell, wherein

the standard cell includes:

a first power supply interconnect extending in a first direction, configured to supply a first power supply voltage,

a second power supply interconnect extending in the first direction, configured to supply a second power supply voltage different from the first power supply voltage, and

a plurality of first-conductivity type vertical nanowire (VNW) FETs lining up in the first direction, provided between the first power supply interconnect and the second power supply interconnect, the plurality of first-conductivity type VNW FETs each having a gate electrode, a top electrode that is to be a source/drain electrode, and a bottom electrode that is to be a source/drain electrode, and

the plurality of first-conductivity type VNW FETs include at least one first VNW FET, wherein

the top electrode of the at least one first VNW FET is connected with the first power supply interconnect,

the bottom electrode of the at least one first VNW FET is connected with the first power supply interconnect, and

the gate electrode of the at least one first VNW FET is connected with the second power interconnect.

2. The semiconductor integrated circuit device of claim 1 , comprising:

a bottom region connected with the bottom electrode of the first VNW FET;

a local interconnect connected with the top electrode of the first VNW FET; and

a gate interconnect connected with the gate electrode of the first VNW FET,

wherein in a region of the first VNW FET, the bottom region, the local interconnect, and the gate interconnect overlap one another as viewed from top.

3. The semiconductor integrated circuit device of claim 1 , wherein the plurality of first-conductivity type VNW FETs include:

two first VNW FETs as the at least one first VNW FET, and

a second VNW FET placed between the first VNW FETs, wherein

the top electrode of the second VNW FET is connected with the first power supply interconnect,

the bottom electrode of the second VNW FET is connected with the first power supply interconnect, and

the gate electrode of the second VNW FET is connected with the first power interconnect.

4. The semiconductor integrated circuit device of claim 1 , wherein the plurality of first-conductivity type VNW FETs include:

two first VNW FETs as the at least one first VNW FET, and

a second VNW FET placed between the first VNW FETs, wherein

the gate electrode of the second VNW FET is connected with the first power interconnect, and

the top electrode of the second VNW FET is connected with the second power supply interconnect.

5. The semiconductor integrated circuit device of claim 3 , wherein gate interconnects connected to the gate electrodes of the first VNW FETs and a gate interconnect connected to the gate electrode of the second VNW FET are formed in parallel to extend in a second direction perpendicular to the first direction.

6. A semiconductor integrated circuit device including a standard cell that is a capacitance cell, wherein

the standard cell includes:

a first power supply interconnect extending in a first direction, configured to supply a first power supply voltage,

a second power supply interconnect extending in the first direction, configured to supply a second power supply voltage different from the first power supply voltage,

a first capacitance part having a plurality of first-conductivity type vertical nanowire (VNW) FETs lining up in the first direction, provided between the first power supply interconnect and the second power supply interconnect, the plurality of first-conductivity type VNW FETs each having a gate electrode, a top electrode that is to be a source/drain electrode, and a bottom electrode that is to be a source/drain electrode, and

a fixed value output part having a second-conductivity type VNW FET provided between the first power supply interconnect and the second power supply interconnect, configured to supply the second power supply voltage to the first capacitance part, the second-conductivity type VNW FET having a gate electrode, a top electrode that is to be a source/drain electrode, and a bottom electrode that is to be a source/drain electrode, and

the plurality of first-conductivity type VNW FETs of the first capacitance part include at least one first VNW FET, wherein

the top electrode of the at least one first VNW FET is connected with the first power supply interconnect,

the bottom electrode of the at least one first VNW FET is connected with the first power supply interconnect, and

the gate electrode of the at least one first VNW FET is connected with the top of the second-conductivity type VNW FET of the fixed value output part.

7. The semiconductor integrated circuit device of claim 6 , comprising:

a bottom region connected with the bottom electrode of the first VNW FET;

a local interconnect connected with the top electrode of the first VNW FET; and

a gate interconnect connected with the gate electrode of the first VNW FET,

wherein in a region of the first VNW FET, the bottom region, the local interconnect, and the gate interconnect overlap one another as viewed from top.

8. The semiconductor integrated circuit device of claim 6 , wherein

the standard cell further includes:

a second capacitance part having a plurality of second-conductivity type vertical nanowire (VNW) FETs lining up in the first direction, provided between the first power supply interconnect and the second power supply interconnect, the plurality of second-conductivity type VNW FETs each having a gate electrode, a top electrode that is to be a source/drain electrode, and a bottom electrode that is to be a source/drain electrode,

the fixed value output part has a first-conductivity type VNW FET provided between the first power supply interconnect and the second power supply interconnect and supplies the first power supply voltage to the second capacitance part, the first-conductivity type VNW FET having a gate electrode, a top electrode that is to be a source/drain electrode, and a bottom electrode that is to be a source/drain electrode, and

the plurality of second-conductivity type VNW FETs of the second capacitance part include at least one second VNW FET, wherein

the top electrode of the at least one second VNW FET is connected with the second power supply interconnect,

the bottom electrode of the at least one second VNW FET is connected with the second power supply interconnect, and

the gate electrode of the at least one second VNW FET is connected with the top of the first conductivity type VNW FET of the fixed value output part.

9. The semiconductor integrated circuit device of claim 8 , comprising:

a bottom region connected with the bottom electrode of the second VNW FET;

a local interconnect connected with the top electrode of the second VNW FET; and

a gate interconnect connected with the gate electrode of the second VNW FET,

wherein in a region of the second VNW FET, the bottom region, the local interconnect, and the gate interconnect overlap one another as viewed from top.

10. The semiconductor integrated circuit device of claim 8 , wherein

the first-conductivity type VNW FET of the fixed value output part is placed to line up with the plurality of first-conductivity type VNW FETs of the first capacitance part in the first direction, and

the second-conductivity type VNW FET of the fixed value output part is placed to line up with the plurality of second-conductivity type VNW FETs of the second capacitance part in the first direction.

11. The semiconductor integrated circuit device of claim 4 , wherein gate interconnects connected to the gate electrodes of the first VNW FETs and a gate interconnect connected to the gate electrode of the second VNW FET are formed in parallel to extend in a second direction perpendicular to the first direction.