Method and system for determining settings for deep brain stimulation
A method and system are provided for determining a relation between stimulation settings for a brain stimulation probe and a corresponding V-field. The brain stimulation probe comprises multiple stimulation electrodes. The V-field is an electrical field in brain tissue surrounding the stimulation electrodes. The method comprises sequentially applying a test current to n stimulation electrodes, n being a number between 2 and the number of stimulation electrodes of the brain stimulation probe, for each test current at one of the n stimulation electrodes, measuring a resulting excitation voltage at m stimulation electrodes, m being a number between 2 and the number of stimulation electrodes of the brain stimulation probe, from the stimulation settings and the measured excitation voltages, deriving a coupling matrix, an element in the coupling matrix reflecting an amount of electrical impedance between two of the stimulation electrodes, and using the coupling matrix for determining the relation between the stimulation settings and the corresponding V-field.
1. A method for determining a relation between stimulation settings for a brain stimulation probe and a corresponding V-field, the brain stimulation probe comprising multiple stimulation electrodes, the V-field being a potential distribution in brain tissue surrounding the stimulation electrodes, the method comprising:
sequentially applying a test current to n stimulation electrodes, n being a number between 2 and the number of stimulation electrodes of the brain stimulation probe;
for each test current at one of the n stimulation electrodes, measuring a resulting excitation voltage at m stimulation electrodes, m being a number between 2 and the number of stimulation electrodes of the brain stimulation probe;
from the stimulation settings and the measured excitation voltages, deriving an (m*n) coupling matrix, an element V q,p in the coupling matrix reflecting an amount of voltage between two of the stimulation electrodes,
using the coupling matrix to determine the relation between the stimulation settings and the corresponding V-field;
forcing a non-zero test voltage on one of the stimulation electrodes while forcing zero voltage on all other stimulation electrodes;
measuring resulting currents in the electrodes necessary to create said forced non-zero test voltages;
determining an admittance matrix, the elements of the admittance matrix reflecting the measured resulting currents; and
generating the coupling matrix by mathematical inversion of the admittance matrix.
2. A method for determining a relation between stimulation settings for the brain stimulation probe and the corresponding V-field as claimed in claim 1 , the method further comprising:
receiving a predetermined set of stimulation settings; and
using the relation between the stimulation settings and the corresponding V-field for determining the V-field corresponding to the predetermined set of stimulation settings.
3. A method for determining a relation between stimulation settings for the brain stimulation probe and the corresponding V-field as claimed in claim 1 , the method further comprising:
receiving a description of a target V-field; and
using the relation between the stimulation settings and the corresponding V-field for determining a set of required stimulation settings for obtaining the target V-field.
4. A computer program product for determining a relation between stimulation settings for the brain stimulation probe and the corresponding V-field, which program is operative to cause a processor to perform the method as claimed in claim 1 .
5. A control system for determining a relation between stimulation settings for a brain stimulation probe and a corresponding V-field, the brain stimulation probe comprising multiple stimulation electrodes, the V-field being a potential distribution in brain tissue surrounding the stimulation electrodes, the control system comprising:
a test current application module applying test currents to the stimulation electrodes;
a measurement module measuring an excitation voltage resulting from the applied test currents; and
a processor being arranged to:
instruct the test current application module to apply test currents to sequentially apply a test current to n stimulation electrodes, n being a number between 2 and the number of stimulation electrodes of the brain stimulation probe;
instruct the measurement module to measure excitation voltage to measure at m stimulation electrodes an excitation voltage caused by each test current, m being a number between 2 and the number of stimulation electrodes of the brain stimulation probe;
from the stimulation settings and the measured excitation voltages, deriving an (m*n) coupling matrix, an element V q,p in the coupling matrix reflecting an amount of voltage between two of the stimulation electrodes:
using the coupling matrix for determining the relation between the stimulation settings and the corresponding V-field;
forcing a non-zero test voltage on one of the stimulation electrodes while forcing zero voltage on all other stimulation electrodes;
measuring the resulting currents in the electrodes necessary to create said forced voltages;
determining an admittance matrix, the elements of the admittance matrix reflecting the measured resulting currents; and
generating the coupling matrix by mathematical inversion of the admittance matrix.