Methods for processing semiconductor wafers having a polycrystalline finish

1. A method of processing a semiconductor wafer comprising:

depositing a silicon layer on the semiconductor wafer, the silicon layer having a thickness that is substantially uniform;

determining an initial wafer profile of the semiconductor wafer prior to polishing the silicon layer, wherein the initial wafer profile has a dish shape;

dressing an edge area of a pad surface of a polishing pad based on the initial wafer profile having the dish shape; and

polishing the silicon layer based on the initial wafer profile using the polishing pad to smooth the silicon layer such that the thickness is substantially uniform after polishing and such that the semiconductor wafer has a shape that matches the dish shape of the initial wafer profile.

2. The method of claim 1 , wherein determining the initial wafer profile comprises inspecting the semiconductor wafer prior to depositing the silicon layer to determine the initial wafer profile.

3. The method of claim 1 , wherein determining the initial wafer profile comprises inspecting the semiconductor wafer after depositing the silicon layer to determine the initial wafer profile.

4. The method of claim 1 , further comprising:

inspecting the semiconductor wafer to determine a post-polishing wafer profile after removal of a portion of the silicon layer; and

comparing the initial wafer profile to the post-polishing wafer profile to determine variations between the initial wafer profile and the post-polishing wafer profile,

wherein dressing the polishing pad further comprises dressing the polishing pad based on the variations between the initial wafer profile and the post-polishing wafer profile.

5. The method of claim 1 , wherein the silicon layer is a polycrystalline silicon layer, the polycrystalline silicon layer having a reduced roughness after polishing and a polycrystalline grain boundary being reduced by polishing.

6. The method of claim 1 further comprising applying slurry to an outer surface of the silicon layer, the slurry including abrasive particles and a base.

7. The method of claim 1 further comprising positioning the semiconductor wafer in a polishing apparatus, the polishing apparatus including the polishing pad.

8. The method of claim 1 , further comprising:

inspecting the semiconductor wafer to determine a post-polishing wafer profile after removal of a portion of the silicon layer; and

comparing the post-polishing wafer profile to a target wafer profile to determine variations between the post-polishing wafer profile and the target wafer profile,

wherein dressing the polishing pad further comprises dressing the polishing pad based on the variations between the post-polishing wafer profile and the target wafer profile.

9. The method of claim 1 , wherein the pad surface has a circular shape and the edge area extends radially between 2.5 cm and 5 cm from an outer edge of the polishing pad.

10. A method of processing a semiconductor wafer comprising:

depositing a silicon layer on the semiconductor wafer, the silicon layer having a thickness that is substantially uniform;

determining an initial wafer profile of the semiconductor wafer prior to polishing the silicon layer, wherein the initial wafer profile has a dome shape;

dressing a center area of a pad surface of a polishing pad based on the initial wafer profile having the dome shape; and

polishing the silicon layer based on the initial wafer profile using the polishing pad to smooth the silicon layer such that the thickness is substantially uniform after polishing and such that the semiconductor wafer has a shape that matches the dome shape of the initial wafer profile.

11. The method of claim 10 , wherein determining the initial wafer profile comprises inspecting the semiconductor wafer prior to depositing the silicon layer to determine the initial wafer profile.

12. The method of claim 10 , wherein determining the initial wafer profile comprises inspecting the semiconductor wafer after depositing the silicon layer to determine the initial wafer profile.

13. The method of claim 10 , further comprising:

inspecting the semiconductor wafer to determine a post-polishing wafer profile after removal of a portion of the silicon layer; and

comparing the initial wafer profile to the post-polishing wafer profile to determine variations between the initial wafer profile and the post-polishing wafer profile,

wherein dressing the polishing pad further comprises dressing the polishing pad based on the variations between the initial wafer profile and the post-polishing wafer profile.

14. The method of claim 10 , wherein the silicon layer is a polycrystalline silicon layer, the polycrystalline silicon layer having a reduced roughness after polishing and a polycrystalline grain boundary being reduced by polishing.

15. The method of claim 10 further comprising applying slurry to an outer surface of the silicon layer, the slurry including abrasive particles and a base.

16. The method of claim 10 further comprising positioning the semiconductor wafer in a polishing apparatus, the polishing apparatus including the polishing pad.

17. The method of claim 10 , further comprising:

inspecting the semiconductor wafer to determine a post-polishing wafer profile after removal of a portion of the silicon layer; and

comparing the post-polishing wafer profile to a target wafer profile to determine variations between the post-polishing wafer profile and the target wafer profile,

wherein dressing the polishing pad further comprises dressing the polishing pad based on the variations between the post-polishing wafer profile and the target wafer profile.

18. The method of claim 10 , wherein the pad surface has a circular shape, the center area being spaced radially inward from an outer edge of the polishing pad between 15 cm and 20 cm.