IP Library › Granted Patent US 11,870,011
Granted Patent B2
US 11,870,011 · App. 16/957,058 · Granted Jan 9, 2024

Light-emitting diode and method of manufacturing the same, and display device

Inventor: Hu Meng (Beijing, CN)
Assignees: BEIJING BOE TECHNOLOGY DEVELOPMENT CO., LTD.; BOE TECHNOLOGY GROUP CO., LTD.
H01L33/44H01L33/145H01L33/20H01L33/38H01L25/167H01L2933/0025
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Quick Facts
Patent No.
US 11,870,011
App. No.
16/957,058
Granted
Jan 9, 2024
Kind
B2
Abstract

A light-emitting diode includes a first semiconductor layer, a second semiconductor layer, a light-emitting layer disposed between the first semiconductor layer and the second semiconductor layer, and a barrier layer disposed on at least part of a side face of at least one of the first semiconductor layer and the second semiconductor layer. The barrier layer is configured to form a charge depletion region between the barrier layer and the at least part of the side face.

Claims (47)

1. A light-emitting diode, comprising:

a first semiconductor layer;

a second semiconductor layer;

a light-emitting layer disposed between the first semiconductor layer and the second semiconductor layer; and

a barrier layer disposed on at least part of a side face of at least one of the first semiconductor layer and

the second semiconductor layer,

wherein the barrier layer is configured to form a charge depletion region between the barrier layer and the at least part of the side face, and a material of the barrier layer includes at least one of metal, conductive metal oxide, graphene, and metallic carbon nanotube;

the first semiconductor layer is a P-type semiconductor layer and the second semiconductor layer is an N-type semiconductor layer;

the barrier layer includes a first barrier layer covering at least part of a side face of the P-type semiconductor layer, and a work function of the first barrier layer is less than a work function of the Ptype semiconductor layer; and

the first barrier layer includes:

a first main body portion covering the side face of the P-type semiconductor layer;

a first extension portion connected to a side of the first main body portion proximate to the light-emitting layer, wherein the first extension portion covers a part of a side face of the light-emitting layer proximate to the P-type semiconductor layer, and a distance exists between the first extension portion and the N-type semiconductor layer in a direction perpendicular to a main surface of the light-emitting layer; and

a second extension portion connected to a side of the first main body portion away from the light-emitting layer, wherein the second extension portion covers an edge of a main surface of the P-type semiconductor layer away from the light-emitting layer.

2. The light-emitting diode according to claim 1 wherein an orthographic projection of the first barrier layer on a main surface of the light-emitting layer has a closed frame shape.

3. The light-emitting diode according to claim 1 wherein the work function of the first barrier layer ranges from 4.0 eV to 5.5 eV.

4. The light-emitting diode according to claim 1 wherein an absolute value of a difference between the work function of the first barrier layer and the work function of the P- type semiconductor layer is greater than or equal to 0.3 eV.

5. The light-emitting diode according to claim 1 wherein a material of the first barrier layer includes at least one of metal, conductive metal oxide, graphene and metallic carbon nanotube.

6. The light-emitting diode according to claim 1 , wherein

the barrier layer further includes a second barrier layer covering at least part of a side face of the N-type semiconductor layer, and a work function of the second barrier layer is greater than a work function of the N-type semiconductor layer.

7. The light-emitting diode according to claim 6 , wherein an orthographic projection of the second barrier layer on a plane determined by the light-emitting layer has a closed frame shape.

8. The light-emitting diode according to claim 6 , wherein the work function of the second barrier layer ranges from 4.5 eV to 5.1 eV.

9. The light-emitting diode according to claim 6 , wherein an absolute value of a difference between the work function of the second barrier layer and the work function of the N-type semiconductor layer is greater than or equal to 0.3 eV.

10. The light-emitting diode according to claim 6 , wherein a material of the second barrier layer includes at least one of metal, conductive metal oxide, graphene and metallic carbon nanotube.

11. The light-emitting diode according to claim 1 , wherein

the barrier layer further includes a second barrier layer covering at least part of a side face of the N-type semiconductor layer; and

a distance exists between the first barrier layer and the second barrier layer in a direction perpendicular to a main surface of the light-emitting layer.

12. The light-emitting diode according to claim 1 , wherein the second semiconductor layer has a main body region and a second electrode placement region, a part of the second semiconductor layer in the main body region overlaps the light-emitting layer and the first semiconductor layer, and a part of the second semiconductor layer in the second electrode placement region does not overlap the light-emitting layer and the first semiconductor layer;

the light-emitting diode further comprises:

a base disposed on a side of the second semiconductor layer away from the light-emitting layer;

a first electrode disposed on a main surface of the first semiconductor layer away from the light- emitting layer: and

a second electrode disposed in the second electrode placement region of the second semiconductor layer.

13. A method of manufacturing a light-emitting diode, comprising:

providing a base;

forming, on the base, a second semiconductor layer, a light-emitting layer and a first semiconductor layer sequentially on top of one another;

patterning the first semiconductor layer to remove a part of the first semiconductor layer at an edge of a light-emitting region of the light-emitting diode;

forming a first barrier film at a side of the base at which the patterned first semiconductor layer has been formed; and

patterning the first barrier film to retain a part of the first barrier film covering a side face of the patterned first semiconductor layer and form a first barrier layer; wherein the first barrier layer is configured to form a charge depletion region between the first barrier layer and the first semiconductor layer.

14. The method according to claim 13 , after the step of patterning the first semiconductor layer, the method further comprising:

etching, by using a mask used for patterning the first semiconductor layer, a part of the light-emitting layer at the edge of the light-emitting region, an etching depth being less than a thickness of the light-emitting layer.

15. The method according to claim 14 , wherein in the step of patterning the first barrier film, a part of the first barrier film covering an edge of a main surface of the patterned first semiconductor layer in the light-emitting region is retained.

16. The method according to claim 13 , before forming the light-emitting layer, the method further comprising:

patterning the second semiconductor layer to remove a part of the second semiconductor layer at the edge of the light-emitting region;

forming a second barrier film at a side of the base on which the patterned second semiconductor layer has been formed; and

patterning the second barrier film to retain a part of the second barrier film covering a side face of the patterned second semiconductor layer and form a second barrier layer; wherein the second barrier layer is configured to form a charge depletion region between the second barrier layer and the second semiconductor layer.

17. A display device, comprising:

a driving substrate; and

a plurality of light-emitting diodes mounted on a side of the driving substrate, each light-emitting diode being a light-emitting diode according to claim 1 , and each light-emitting diode being electrically connected to the driving substrate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 23, 2020
From: MENG, HU
To: BEIJING BOE TECHNOLOGY DEVELOPMENT CO., LTD.; BOE TECHNOLOGY GROUP CO., LTD.
Reel/Frame 053010/0641 →
Continuity (1)
Related Publication 20230155068A1 · May 18, 2023
Cited By (1)
US 12,543,411