System and method for set up of production line inspection
The invention provides an automatic inspection process for detecting visible defects on a manufactured item. The process includes a set up mode in which images of same-type defect free items, but not images of same-type defected items, are obtained, and an inspection mode in which images of both same-type defect free items and same-type defected items, are obtained and defects are detected. Images of the same-type defect free items are analyzed and based on the analysis the process switches to the inspection mode.
1. An inspection line system comprising:
a processor in communication with a user interface and a camera,
the processor to, in an inspection stage, determine from an image of an inspected item on an inspection line, if the inspected item has a defect or is defect free,
the system characterized in that the processor is to
analyze an image of a defect free item of a same type as the inspected item by comparing the image of the defect free item to each other images of defect free samples of manufactured items captured by the camera;
calculate a probability that no defect will be incorrectly identified in a new image of a same-type defect free item; and
based on the analysis and on the probability, generate a signal to provide instructions to a user, via the user interface, prior to the inspection stage, thereby avoiding user frustration.
2. The system of claim 1 wherein the processor is to analyze, from the image of the defect free item, compositional properties of the defect free item.
3. The system of claim 2 wherein the processor is to determine a spatial range, in which the defect free item shows no perspective distortion.
4. The system of claim 2 wherein the processor is to analyze registration of images of the defect free item.
5. The system of claim 1 wherein the processor is to generate a signal to display instructions to the user to place within a field of view of the camera a same-type inspected item.
6. The system of claim 1 wherein the processor is to generate a signal to present a notice to the user, indicating that same-type items cannot be inspected.
7. The system of claim 1 wherein the processor is to generate a signal to display instructions to the user regarding location or orientation of a same-type defect free item, within a field of view of the camera.
8. The system of claim 1 wherein the processor is to generate a signal to display instructions to adjust a region of interest in the image of the defect free item.
9. The system of claim 1 wherein the processor is to generate a signal to display instructions to check that the defect free item is static.
10. The system of claim 1 wherein the processor is to, based on the analysis, generate a signal to provide instructions to a user and to automatically switch to the inspection stage.
11. The system of claim 1 wherein the processor is to generate a signal to automatically switch to the inspection stage based on the probability that no defect will be incorrectly identified in a new image of a same-type defect free item.
12. The system of claim 1 wherein the instructions to the user comprise a notification to the user to switch to inspection mode.