Method and structure for determining blocking ability of copper diffusion blocking layer

1. A method for determining a blocking ability of a copper diffusion blocking layer, comprising:

a step S 1 of forming an a-Si semiconductor layer, the copper diffusion blocking layer, and a copper electrode layer on a glass substrate in sequence, followed by patterning the copper diffusion blocking layer and the copper electrode layer by performing a lithography process and an etching process, wherein in the step S 1 , the a-Si semiconductor layer, the copper diffusion blocking layer, and the copper electrode layer are formed by chemical vapor deposition or physical vapor deposition; and in the step S 1 , the copper diffusion blocking layer is disposed between the a-Si semiconductor layer and the copper electrode layer, and material of the copper diffusion blocking layer is one selected from a group of Mo, Ti, MoTi, and MoNb;

a step S 2 of forming a transparent electrode layer on the glass substrate;

a step S 3 of performing a high temperature deterioration process to the glass substrate, wherein during the high temperature deterioration process, copper atoms in the copper electrode layer and silicon atoms in the a-Si semiconductor layer diffuse through the copper diffusion blocking layer to gradually form a copper-silicon alloy layer which is black;

a step S 4 of observing a degree of forming the black copper-silicon alloy layer on a surface of a composite film layer sample of the glass substrate; and

a step S 5 of replacing the material of the copper diffusion blocking layer in the step S 1 with another selected from the group of Mo, Ti, MoTi, and MoNb and repeating the step S 1 to the step S 4 , followed by observing variation of the surface color of composite film layer samples comprising the copper diffusion blocking layers made of different materials, wherein if the surface color becomes black, an ability of the corresponding copper diffusion material to block the diffusion of the copper atoms is determined to be poor.

2. The method for determining the blocking ability of the copper diffusion blocking layer according to claim 1 , wherein in the step S 2 , the transparent electrode layer is made of indium tin oxide or indium zinc oxide.

3. The method for determining the blocking ability of the copper diffusion blocking layer according to claim 2 , wherein the transparent electrode layer completely covers the a-Si semiconductor layer and the copper electrode layer.

4. The method for determining the blocking ability of the copper diffusion blocking layer according to claim 2 , wherein in the step S 2 , the transparent electrode layer is formed by chemical vapor deposition or physical vapor deposition.

5. The method for determining the blocking ability of the copper diffusion blocking layer according to claim 1 , wherein in the step S 3 , a temperature of the high temperature deterioration process is from 200° C. to 400° C., and a process time of the high temperature deterioration process is from 0.5 hr to 10 hr.

6. The method for determining the blocking ability of the copper diffusion blocking layer according to claim 1 , wherein in the step S 5 , the ability of the copper diffusion blocking layers made of different materials to block the diffusion of the copper atoms is determined by determining the degree of blackening the surfaces of the composite film layer samples comprising the copper diffusion blocking layers made of the different materials.

7. A method for determining a blocking ability of a copper diffusion blocking layer, comprising:

a step S 1 of forming an a-Si semiconductor layer, the copper diffusion blocking layer, and a copper electrode layer on a glass substrate in sequence, followed by patterning the copper diffusion blocking layer and the copper electrode layer by performing a lithography process and an etching process, wherein material of the copper diffusion blocking layer is one selected from a group of Mo, Ti, MoTi, and MoNb;

a step S 2 of forming a transparent electrode layer on the glass substrate;

a step S 3 of performing a high temperature deterioration process to the glass substrate, wherein during the high temperature deterioration process, copper atoms in the copper electrode layer and silicon atoms in the a-Si semiconductor layer diffuse through the copper diffusion blocking layer to gradually form a copper-silicon alloy layer which is black;

a step S 4 of observing a degree of forming the black copper-silicon alloy layer on a surface of a composite film layer sample of the glass substrate; and

a step S 5 of replacing the material of the copper diffusion blocking layer in the step S 1 with another selected from the group of Mo, Ti, MoTi, and MoNb and repeating the step S 1 to the step S 4 , followed by observing variation of the surface color of composite film layer samples comprising the copper diffusion blocking layers made of different materials, wherein if the surface color becomes black, an ability of the corresponding copper diffusion material to block the diffusion of the copper atoms is determined to be poor.

8. The method for determining the blocking ability of the copper diffusion blocking layer according to claim 7 , wherein in the step S 1 , the a-Si semiconductor layer, the copper diffusion blocking layer, and the copper electrode layer are formed by chemical vapor deposition or physical vapor deposition.

9. The method for determining the blocking ability of the copper diffusion blocking layer according to claim 7 , wherein in the step S 1 , the copper diffusion blocking layer is disposed between the a-Si semiconductor layer and the copper electrode layer.

10. The method for determining the blocking ability of the copper diffusion blocking layer according to claim 7 , wherein in the step S 2 , the transparent electrode layer is made of indium tin oxide or indium zinc oxide.

11. The method for determining the blocking ability of the copper diffusion blocking layer according to claim 10 , wherein the transparent electrode layer completely covers the a-Si semiconductor layer and the copper electrode layer.

12. The method for determining the blocking ability of the copper diffusion blocking layer according to claim 10 , wherein in the step S 2 , the transparent electrode layer is formed by chemical vapor deposition or physical vapor deposition.

13. The method for determining the blocking ability of the copper diffusion blocking layer according to claim 7 , wherein in the step S 3 , a temperature of the high temperature deterioration process is from 200° C. to 400° C., and a process time of the high temperature deterioration process is from 0.5 hr to 10 hr.

14. The method for determining the blocking ability of the copper diffusion blocking layer according to claim 7 , wherein in the step S 5 , the ability of the copper diffusion blocking layers made of different materials to block the diffusion of the copper atoms is determined by determining the degree of blackening the surfaces of the composite film layer samples comprising the copper diffusion blocking layers made of the different materials.

15. A structure for determining a blocking ability of a copper diffusion blocking layer, comprising:

a glass substrate;

a first copper-silicon alloy layer disposed on the glass substrate;

a copper diffusion blocking layer disposed on the first copper-silicon alloy layer;

a second copper-silicon alloy layer disposed on the copper diffusion blocking layer; and

a transparent electrode layer disposed on the second copper-silicon alloy layer.