Composite substrates for saw tags or RFID and sensors applications
A surface acoustic wave tag device is disclosed, comprising: an acoustic wave propagating substrate, at least one transducer structure comprising inter-digitated comb electrodes, and at least one reflecting means, the reflecting means comprising at least one reflector, wherein the acoustic wave propagation substrate is a composite substrate comprising a base substrate and a piezoelectric layer, wherein the crystallographic orientation of the piezoelectric layer with respect to the base substrate is such that the propagation of a shear wave inside the piezoelectric layer and in the direction of propagation corresponding to the acoustic wave is enabled. A physical quantity determining device and a fabrication method of such surface acoustic wave tag device are also disclosed.
1. A surface acoustic wave tag device, comprising:
an acoustic wave propagating substrate comprising a composite substrate including a base substrate and a piezoelectric layer;
at least one transducer structure comprising inter-digitated comb electrodes disposed over the acoustic wave propagating substrate; and
a set of reflectors positioned at various delays on one side of the transducer structure in the direction of propagation of an acoustic wave having a wavelength, each reflector comprising a different number of metallic strips, and wherein the metallic strips of each reflector are connected to each other and shorted;
wherein a crystallographic orientation of the piezoelectric layer with respect to the base substrate is such that the propagation of a shear wave inside the piezoelectric layer and in the direction of propagation corresponding to the acoustic wave is enabled; and
wherein a thickness of the piezoelectric layer is smaller than the wavelength.
2. The device of claim 1 , wherein the piezoelectric layer comprises Lithium Tantalate LiTaO 3 or Lithium Niobate LiNbO 3 .
3. The device of claim 2 , wherein:
the piezoelectric layer comprises Lithium Niobate LiNbO 3 ; and
the crystallographic orientation of the piezoelectric layer with respect to the base substrate is (YX/)/θ according to standard IEEE 1949 Std-176, with θ, an angle of the crystallographic orientation comprised between 0° and 100°, or between 140° and 180°, modulo 180°.
4. The device of claim 2 , wherein:
the piezoelectric layer comprises Lithium Tantalate LiTaO 3 ; and
the crystallographic orientation of the piezoelectric layer with respect to the base substrate is (YX/)/θ according to standard IEEE 1949 Std-176 with θ, an angle of the crystallographic orientation comprised between −30° and 90°, modulo 180°.
5. The device of claim 1 , wherein the base substrate of the composite substrate comprises at least one material selected from among: Silicon, Diamond, Sapphire, Silicon Carbide, fused Quartz, and Quartz crystal.
6. The device of claim 1 , wherein at least a part of the base substrate is deformable.
7. A physical quantity-determining device comprising two or more surface acoustic wave tag devices, at least one of the two or more surface acoustic wave tag devices comprising:
an acoustic wave propagating substrate comprising a composite substrate including a base substrate and a piezoelectric layer;
at least one transducer structure comprising inter-digitated comb electrodes disposed over the acoustic wave propagating substrate; and
a set of reflectors positioned at various delays on one side of the transducer structure in the direction of propagation of an acoustic wave having a wavelength, each reflector comprising a different number of metallic strips, and wherein the metallic strips of each reflector are connected to each other and shorted;
wherein a crystallographic orientation of the piezoelectric layer with respect to the base substrate is such that the propagation of a shear wave inside the piezoelectric layer and in the direction of propagation corresponding to the acoustic wave is enabled; and
wherein a thickness of the piezoelectric layer is smaller than the wavelength.
8. The physical quantity-determining device of claim 7 , further comprising only one tag antenna connected to the transducer structures of the two or more surface acoustic wave tag devices.
9. The physical quantity-determining device of claim 7 , wherein at least another of the two or more surface acoustic wave tag devices is a surface acoustic wave resonator.
10. The physical quantity-determining device of claim 9 , wherein the surface acoustic wave resonator is positioned with respect to the at least one of the surface acoustic wave tag devices so that they have two different surface acoustic wave propagation directions.
11. The physical quantity-determining device of claim 9 , wherein the surface acoustic wave resonator is positioned with respect to the at least one of the surface acoustic wave tag devices so that its surface acoustic wave propagation direction, being parallel to one of a crystalline axis of the piezoelectric layer makes an angle Y with the surface acoustic wave propagation direction of the at least one of the surface acoustic wave tag devices.
12. The physical quantity-determining device of claim 9 , wherein the surface acoustic wave resonator is configured to use Rayleigh waves and the at least one of the surface acoustic wave tag devices is configured to use shear waves.
13. The physical quantity-determining device according to claim 7 , wherein the physical quantity-determining device is configured to measure temperature and/or pressure and/or forces and/or configured to allow for identification.